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Author:Yang Guoming,Wang Jiaxing
Author Affilications:Guizhou Aerospace Institute of Measuring and Testing Technology
DOI:10.16157/j.issn.0258-7998.256421
Author:Li Wenxun
Author Affilications:Southwest China Institute of Electronic Technology
DOI:10.16157/j.issn.0258-7998.246168
Author:Zhao Peng
Author Affilications:The 10th Research Institute of CETC
DOI:10.16157/j.issn.0258-7998.256362
Author:Liu Lihao1,Qin Shuaifeng1,Ning Lipeng2
Author Affilications:1.The 54th Research Institute of China Electronics Technology Group Corporation;2.China Satellite Network Application Corporation Limited
DOI:10.16157/j.issn.0258-7998.246190
Author:Zheng Jun1,2,He Xi2
Author Affilications:1.College of Electronic and Information Engineering, Nanjing University of Aeronautics and Astronautics;2.No.58 Research Institute of China Electronics Technology Group Corporation
DOI:10.16157/j.issn.0258-7998.256483
Author:Ma Zhanghong1,Li Jingmu2
Author Affilications:1.Kungaoxin Microelectronics (Jiangsu) Co.,Ltd.;2.School of Software and Microelectronics,Peking University
DOI:10.16157/j.issn.0258-7998.256418
Author:Wang Ting,Pang Ao
Author Affilications:The 58th Research Institute of China Electronics Technology Group
DOI:10.16157/j.issn.0258-7998.246217
Author:Liu Zhangli
Author Affilications:Shanghai Huahong Grace Semiconductor Manufacturing Corporation
DOI:10.16157/j.issn.0258-7998.246084
Author:Zhang Jingfei,Guo Xiaoguang,Fu Qiang,Qiao Hui
Author Affilications:No.58 Research Institute of China Electronics Technology Group Corporation
DOI:10.16157/j.issn.0258-7998.246187
Author:Li Qian1,2,Li Bo1,Ruan Bin2
Author Affilications:1.School of Physics, Zhejiang University of Technology;2.ZheJiang Uniview Technologies Co., Ltd.
DOI:10.16157/j.issn.0258-7998.256317
Author:Wang Xiaoxuan1,2,Li Bo1,Zhong Peng2
Author Affilications:1.School of Physics, Zhejiang University of Technology;2.Zhejiang Uniview Technologies Co., Ltd.
DOI:10.16157/j.issn.0258-7998.256278
Author:Bo Yunpeng1,2,Kang Kang3,Pan Guixin3,Wang Min1
Author Affilications:1.Yunnan Observatories, Chinese Academy of Sciences;2.University of Chinese Academy of Sciences;3.China United Network Communications Co., Ltd., Guangdong Branch
DOI:10.16157/j.issn.0258-7998.256376
Author:Xiong Ying1,Li Yun2
Author Affilications:1.Information Technology Department, Jiangmen Open University;2.School of Water Resources and Environment Engineering, East China University of Technology
DOI:10.16157/j.issn.0258-7998.245599
Author:Zhang Haofan1,Du Yang2,Guo Tuo1,Liu Jianguo3
Author Affilications:1.School of Electronic Information and Artificial Intelligence, Shaanxi University of Science & Technology;2.PLA 91001 Unit;3.School of Marine Science and Technology,Northwestern Polytechnical University
DOI:10.16157/j.issn.0258-7998.245833
Author:Ma Fangyuan,Ren Jiefu,Huang Jing,Zhang Zhengchu
Author Affilications:Beijing Guodiantong Network Technology Co.,Ltd.
DOI:10.16157/j.issn.0258-7998.245899
Author:Hao Zhuangyuan1,Tian Kun1,Wu Shuncheng1,Tan Kun1,Li Jian2,Gao Dashuai2
Author Affilications:1.CNPC Research Institute of Safety & Environment Technology;2.Beijing Sinovoice Technology Co.,Ltd.
DOI:10.16157/j.issn.0258-7998.256281
Author:Xu Bo,Du Xiaoshi,Zhu Like,Wang Ping
Author Affilications:Southwest China Institute of Electronic Technology
DOI:10.16157/j.issn.0258-7998.246172
Author:Wu Weikun1,Zheng Yaohua1,Zeng Yanchao1,Zeng Xiangwei1,Wu Zhian1,Li Jiacheng1,Zhou Qian2,Yuan Chao2
Author Affilications:1.Zhaoqing Power Supply Bureau, Guangdong Power Grid Co., Ltd.;2.School of Electrical and Information Engineering, Hunan University
DOI:10.16157/j.issn.0258-7998.256326
Author:Ding Weiyin
Author Affilications:Cisco Systems (China) Research and Development Co., Ltd.
DOI:10.16157/j.issn.0258-7998.256315
Author:Yang Yufei,Liang Yingwei,Liu Chenghui,Zhu Taipeng
Author Affilications:Information Center of Guangdong Power Grid Co., Ltd.
DOI:10.16157/j.issn.0258-7998.256412
Author:Wang Guangyu1,2,3,Shen Shaoxiang1,2,Fan Pengjie1,2,3,Li Binbin1,2,3,Liu Xiaojun1,2
Author Affilications:1.Aerospace Information Research Institute, Chinese Academy of Sciences;2.Key Laboratory of Electromagnetic Radiation and Sensing Technology, Chinese Academy of Sciences;3.School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences
DOI:10.16157/j.issn.0258-7998.245493
Author:Gu Lin,Yang Qin,Yan Kun
Author Affilications:The 58th Research Institute of China Electronics Technology Group Corporation
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