DOI:10.16157/j.issn.0258-7998.172975
Author:Duan Jie,Han Jian,Tang Hong
Author Affilications:School of Communication and Information Engineering,Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.172445
Author:Wang Zhiguang,Gao Qingyun
Author Affilications:College of Electronic Information and Optical Engineering,Key Laboratory of Photo-electronic Thin Film Devices and Technology, Nankai University,Tianjin 300350,China
DOI:10.16157/j.issn.0258-7998.172119
Author:Huang Wei,Huang Chunyue,Zhai Jianghui
Author Affilications:School of Mechanical and Electrical Engineering,Guilin University of Electronic Technology,Guilin 541004,China
DOI:10.16157/j.issn.0258-7998.171964
Author:Pan Zhao,Zhang Yuejun,Ding Dailu
Author Affilications:Institute of Circuits and Systems,Ningbo University,Ningbo 315211,China
DOI:10.16157/j.issn.0258-7998.172089
Author:Jia Minzheng1,Fu Fangfa2
Author Affilications:1.Department of Information Engineering,Beijing Polytechnic College,Beijing 100042,China; 2.Microelectronics Center,Harbin Institute of Technology,Harbin 150001,China
DOI:10.16157/j.issn.0258-7998.172194
Author:Li Jiamin,Dai Zibin,Wang Yiwei
Author Affilications:Institute of Information Science and Technology of Zhengzhou,Zhengzhou 450001,China
DOI:10.16157/j.issn.0258-7998.171992
Author:Qing Xudong1,2,Zhong Li1,2,Wang Yonglu2,Qin Shaohong1,2,Chen Zhenzhong1,2
Author Affilications:1.College of Optoelectronic Engineering,Chongqing University of Posts and Telecommunications,Chongqing 400060,China; 2.Science and Technology on Analog Integrated Circuit Laboratory,Chongqing 400060,China
DOI:10.16157/j.issn.0258-7998.172175
Author:Tang Ran1,2,Wu Hong1,2,Cheng Shujun3,Zhao Yingxin1,2
Author Affilications:1.College of Electronic Information and Optical Engineering,Nankai University,Tianjin 300350,China; 2.Tianjin Key Laboratory of Optoelectronic Sensor and Sensing Network Technology,Tianjin 300350,China; 3.Tianjin 712 Communication & Broadcasting Corp.,Tianjin 300462,China
DOI:10.16157/j.issn.0258-7998.172506
Author:Li Yashuang,Ji Xina,Wang Zhen,He Tao
Author Affilications:XJ Electric Co..ltd,Xuchang 461000,China
DOI:10.16157/j.issn.0258-7998.172527
Author:Hua Minghao,Yang Linghui
Author Affilications:School of Precision Instrument and Opto-Electronics Engineering,Tianjin University,Tianjin 300072,China
DOI:10.16157/j.issn.0258-7998.172186
Author:Wang Huanhuan,Wang Xiaorong,Liu Chao
Author Affilications:Nanjing Tech Univercity,Nanjing 211816,China
DOI:10.16157/j.issn.0258-7998.172451
Author:Zhu Minghui1,2,Zhao Xinguang1,2,You Xingyi1
Author Affilications:1.School of Electrical Engineering and Automation,Shandong University of Science and Technology,Qingdao 266590,China; 2.Institute of Oceanographic Instrumentation,Shandong Academy of Sciences,Qingdao 266100,China
DOI:10.16157/j.issn.0258-7998.172139
Author:Li Yu1,2,Liu Chongqing2,3,Lv Lijun3,Tan Hongzhou3
Author Affilications:1.School of Information Engineering,Guangdong Pharmaceutical University,Guangzhou 510006,China; 2.Huawei Technology Co.Ltd.,Shenzhen 518129,China; 3.SYSU-CMU Shunde International Joint Research Institute,Shunde 528300,China
DOI:10.16157/j.issn.0258-7998.172886
Author:Wan Quanting,Miao Changyun,Meng Dejun,Liu Yi
Author Affilications:School of Electronics and Information Engineering,Tianjin Polytechnic University,Tianjin 300387,China
DOI:10.16157/j.issn.0258-7998.172398
Author:Gao Liying
Author Affilications:Comfy and Warm Living Engineering Limited Company of Shanghai,Shanghai 201204,China
DOI:10.16157/j.issn.0258-7998.172617
Author:Wang Zhen,Li Jianhong,Zhang Dasong,Wang Xiaonan,Huang Yilong
Author Affilications:National Computer System Engineering Research Institute of China,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.172160
Author:Cao Lin1,Yu Lin1,Wang Dongfeng1,2,Li Huanan1
Author Affilications:1.Department of Telecommunication Engineering,Beijing Information Science & Technology University,Beijing 100101,China; 2.Beijing Trans Microwave Science and Technology Company Ltd,Beijing 100018,China
DOI:10.16157/j.issn.0258-7998.172221
Author:Sun Lingfang1,2,Zhang Zhaopeng1
Author Affilications:1.School of Automation Engineer,Northeast Electric Power University,Jilin 132012,China; 2.Energy Conservation & Measure-Control Center,Northeast Electric Power University,Jilin 132012,China
DOI:10.16157/j.issn.0258-7998.172768
Author:Zheng Tuo,Wang Guanya
Author Affilications:Beijing Microelectronics Technology Institute,Beijing 100076,China
DOI:10.16157/j.issn.0258-7998.172127
Author:Yang Xuemei1,Xu Jiapin2,He Xi2
Author Affilications:1.College of Electrical & Electronics Information Engineering,Sichuan University Jinjiang College,Meishan 620860,China; 2.College of Electronics and Information Engineering,Sichuan University,Chengdu 610065,China
DOI:10.16157/j.issn.0258-7998.172203
Author:Liu Jiwei,Zhao Yuexian,Zhao Yang
Author Affilications:Network and Information Security Administration Center Hebei Center,Shijiazhuang 050021,China
DOI:10.16157/j.issn.0258-7998.171504
Author:Wang Ying,Zhang Binzhen,Duan Junping,SunYujie
Author Affilications:Key Laboratory of Instrumentation Science & Dynamic Measurement,Ministry of Education, North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.171099
Author:Qi Bensheng,Han Yan,Tan Junyan,Cai Chunhua
Author Affilications:College of Internet of Things Engineering,Hohai University,Changzhou 213022,China
DOI:10.16157/j.issn.0258-7998.172107
Author:Wang Qiong1,Xia Xinlin2,Shi Chunhui3,Huang Yu1
Author Affilications:1.The Engineering Technical College,Chengdu University of Technology,Leshan 614000,China; 2.Microsystem and Terahertz Research Center,China Academy of Engineering Physics,Chengdu 610000,China; 3.Jilin Information and Telecommunication Company of Jilin Electric Power Company,Changchun 130021,China
DOI:10.16157/j.issn.0258-7998.171201
Author:Song Huiying,Gao Yuanyuan,Sha Nan
Author Affilications:College of Communication Engineering,PLA University of Science and Technology,Nanjing 210000,China
DOI:10.16157/j.issn.0258-7998.171450
Author:Lei Zhenzhu,Huang Lei,Shen Bin
Author Affilications:Key Lab of Mobile Communication Technology,Chongqing University of Posts and Telecommunications,Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.171176
Author:Zhang Jie1,Wang Shaochao1,Guan Yong2
Author Affilications:1.College of Information Science & Technology,Beijing University of Chemical Technology,Beijing 100029,China; 2.College of Information Engineering,Capital Normal University,Beijing 100048,China
DOI:10.16157/j.issn.0258-7998.170986
Author:Yang Zhiming,Fu Yifan,Min Xiaoshuang,Zhao Dezheng
Author Affilications:National Computer System Engineering Research Institute of China,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.171014
Author:Huang Chen1,Fei Jiyou1,2,Liu Xiaodong2
Author Affilications:1.School of Mechanical Engineering,Dalian Jiaotong University,Dalian 116028,China; 2.School of Bullet Train Application and Maintenance Engineering,Dalian Jiaotong University,Dalian 116028,China
DOI:10.16157/j.issn.0258-7998.171551
Author:Yang Hongchao,Cheng Ruofa,Lv Caiyan,Wang Xuewei
Author Affilications:School of Information Engineering,Nanchang University of Aeronautics,Nanchang 330063,China
DOI:10.16157/j.issn.0258-7998.179024
Author:Li Gang,Huang Yongfeng
Author Affilications:NGN Laboratory,Department of Electronics Engineering,Tsinghua University,Beijing 100084,China
DOI:10.16157/j.issn.0258-7998.171187
Author:Yu Shike,Li Hao,Yu Boquan,Huang Peili
Author Affilications:Kunming Branch,The 705th Research Institute of China Shipbuiding Industry Corporation,Kunming 650032,China
DOI:10.16157/j.issn.0258-7998.171304
Author:Tang Jianqiang,Zhou Fengxing,Hu Wanping
Author Affilications:School of Information Science and Engineering,Wuhan University of Science and Technology,Wuhan 430081,China
DOI:10.16157/j.issn.0258-7998.171447
Author:Liu Zhiyuan,Shao Ruping,Wang Xiadong
Author Affilications:School of Automation&College of Electrical Engineering And Control Science,Nanjing Tech University,Nanjing 211816,China
DOI:10.16157/j.issn.0258-7998.170585
Author:Liao Zhiling,Liu Kang,Ding Manjing,Wu Chao,Jiang Yujun
Author Affilications:Electrical and Information Engineering College,Jiangsu University,Zhenjiang 212001,China
DOI:10.16157/j.issn.0258-7998.171073
Author:Li Chenkun1,2,Liu Xiaoning1,Chen Siming2
Author Affilications:1.High Magnetic Field Laboratory of the Chinese academy of Sciences,Hefei 230088,China; 2.University of Science and Technology of China,Hefei 230026,China
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