DOI:10.16157/j.issn.0258-7998.182249
Author:Huang Rui,Lu Xuming,Wu Yilin
Author Affilications:Department of Computer Science,Guangdong University of Education,Guangzhou 510303,China
DOI:10.16157/j.issn.0258-7998.182201
Author:Huang Youwen,Wan Chaolun
Author Affilications:School of Information Engineering,Jiangxi University of Science and Technology,Ganzhou 341000,China
DOI:10.16157/j.issn.0258-7998.182236
Author:Yu Chengbo,Xiong Dien
Author Affilications:School of Electrical and Electronic Engineering,Chongqing University of Techology,Chongqing 400050,China
DOI:10.16157/j.issn.0258-7998.182417
Author:Wang Kun,Zhou Hua
Author Affilications:College of Big Data and Information Engineering,Guizhou University,Guiyang 550025,China
DOI:10.16157/j.issn.0258-7998.182404
Author:Xu Zhonghui,Lv Weishuai
Author Affilications:Faculty of Information Engineering,Jiangxi University of Science and Technology,Ganzhou 341000,China
DOI:10.16157/j.issn.0258-7998.180940
Author:Jiao Wanguo,Li Yurong,Zhou Wen
Author Affilications:School of Information Science and Technology,Nanjing Forestry University,Nanjing 210037,China
DOI:10.16157/j.issn.0258-7998.180945
Author:Zhang Haihua1,Lv Yufei2,Lu Zhongxuan1
Author Affilications:1.Beijing Institute of Spacecraft System Engineering,Beijing 100094,China; 2.Beijing Space era Laser Navigation Technology Co.,Ltd.,Beijing 100094,China
DOI:10.16157/j.issn.0258-7998.180491
Author:Yang Yang1,Yan Zheng2,Liu Minwei2,Dong Jicheng2
Author Affilications:1.Integrated Circuit Design Center,Aerors Incorporated Company Limited.Sichuan Branch,Chengdu 610100,China; 2.Integrated Circuit Design Center,Space Star Technology CO.,LTD.,Beijing 100086,China
DOI:10.16157/j.issn.0258-7998.180443
Author:Hu Qinchun1,Huo Ping2,You Xiaoquan1,Zhang Song1,Guo Lifang1,Tan Huayong1
Author Affilications:1.School of Network and Communication Engineering,Chengdu Technological University,Chengdu 611730,China; 2.School of Electrical Engineering,Chengdu Technological University,Chengdu 611730,China
Author:Sun Jia,Zou Jing,Hu Tong
Author Affilications:Shandong Provincial Key Laboratory of Ocean Environmental Monitoring Techno1ogy, Institute of Oceanographic Instrumentation,Qilu University of Technology(Shandong Academy of Sciences),Qingdao 266001,China
DOI:10.16157/j.issn.0258-7998.180349
Author:Liu Yanpeng,Wei Qidi,Zhang Guohao
Author Affilications:School of Information Engineering,Guangdong University of Technology,Guangzhou 510006,China
DOI:10.16157/j.issn.0258-7998.180395
Author:Li Liwei,Wang Pengjun,Zhang Yuejun
Author Affilications:Institute of Circuits and Systems,Ningbo University,Ningbo 315211,China
DOI:10.16157/j.issn.0258-7998.180002
Author:Wei Zikui1,2,Fu Ling1,2,Wang Xue3,He Yang1,2,Jin Xin1,2,Tan Lang1,2, Hu Yi1,2,Tang Xiaoke1,2,Zhang Haifeng1,2,Zhao Dongyan1,2
Author Affilications:1.State Grid Key Laboratory of Power Industrial Chip Design and Analysis Technology, Beijing Smart-Chip Microelectronics Technology Co.,Ltd.,Beijing 100192,China; 2. Beijing Engineering Research Center of High-reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co.,Ltd.,Beijing 100192,China; 3.Information and Communication Branch of Liaoning Electric Power Co.,Ltd.,Shenyang 110006,China
DOI:10.16157/j.issn.0258-7998.181196
Author:Zhou Haoshang1,2,Gao Zhaoling3
Author Affilications:1.CRRC Dalian R&D CO.,LTD.,Dalian 116052,China; 2.State Key Laboratory for Traction and Control System of EMU and Locomotive,Dalian 116052,China; 3.Department of Electronic Engineering,Dalian Neusoft University of Information,Dalian 116023,China
DOI:10.16157/j.issn.0258-7998.181072
Author:Luo Yijun,Fang Li
Author Affilications:Electronic Information School,Wuhan University,Wuhan 430072,China
DOI:10.16157/j.issn.0258-7998.180998
Author:Lin Hao,Han Qingmin,Song Dong,Chen Hai
Author Affilications:The 6th Research Institute of China Electronics Corporation,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.180950
Author:Chen Hongchao,Ye Bing,Bian Shiya
Author Affilications:School of Electronic Science and and Applied Physics,Hefei University of Technology,Hefei 230009,China
DOI:10.16157/j.issn.0258-7998.181149
Author:Miao Chengyu1,2,3,Li Peng1,2,3,Zhang Jingrong1,2,3,Gu Binbin1,2,3,Jiang Wei1,2,3
Author Affilications:1.Jiangsu Collaborative Innovation Center on Atmospheric Environment and Equipment Technology, Nanjing University of Information Science and Technology,Nanjing 210044,China; 2.Jiangsu Meteorological Sensor Network Technology Engineering Center,Nanjing University of Information Science and Technology, Nanjing 210044,China; 3.Jiangsu Key Laboratory of Meteorological Observation and Information Procession, Nanjing University of Information Science and Technology,Nanjing 210044,China
DOI:10.16157/j.issn.0258-7998.181096
Author:Xie Guihui1,2,Zheng Xuchu3,Zhao Tianming3,Liu Zixu3,Zhao Juan1,2
Author Affilications:1.School of Automation, China University of Geosciences,Wuhan 430074,China; 2.Hubei Key Laboratory of Advanced Control and Intelligent Automation for Complex Systems,Wuhan 430074,China; 3.School of Mechanical and Electronic Information,China University of Geosciences,Wuhan 430074,China
DOI:10.16157/j.issn.0258-7998.180921
Author:Zhou Kui1,2,Ruan Fangming2,3,Guan Sheng1,Su Ming3,Wang Heng3
Author Affilications:1.School of Big Data and Information Engineering, Guizhou University,Guiyang 550025,China; 2.Beijing Oriental Institute of Measurement and Test,Beijing 100094,China; 3.School of Big Data and Computer Sciences,Guizhou Normal University,Guiyang 550001,China
DOI:10.16157/j.issn.0258-7998.181374
Author:Xu Xiaohui1,Zhang Jinlong2
Author Affilications:1.School of Architectural Engineering,The City Vocational College of Jiangsu,Nanjing 210000,China; 2.School of Electrical and Automation Engineering,Nanjing Normal University,Nanjing 210042,China
DOI:10.16157/j.issn.0258-7998.181128
Author:Qian Wengao1,Chen Jingjie1,Ma Hongyan2
Author Affilications:1.College of Electronic Information and Automation,Civil Aviation University of China,Tianjin 300300,China; 2.Basic Experiment Center,Civil Aviation University of China,Tianjin 300300,China
DOI:10.16157/j.issn.0258-7998.180768
Author:Wang Peiliang1,2,Zhang Ting3,Xiao Yingjie1
Author Affilications:1.Engineering Research Center of Simulation Technology of the Ministry of Education, Merchant Marine College,Shanghai Maritime University,Shanghai 201306,China; 2.Weifang University of Science and Technology,Weifang 262700,China; 3.Shandong Transport Vocational College,Weifang 261206,China
DOI:10.16157/j.issn.0258-7998.181472
Author:Lv Xiaowei
Author Affilications:Information Science Academy of China Electronics Technology Group Corporation,Beijing 100086,China
DOI:10.16157/j.issn.0258-7998.182387
Author:Liu Jin,Zhang Pengwang
Author Affilications:Dali Bureau,CSG EHV Transmission Company,Dali 671000,China
DOI:10.16157/j.issn.0258-7998.180393
Author:Yang Fan1,Ren Shougang2,Hao Shuixia1,Zhou Jun3,Yuan Peisen2
Author Affilications:1.School of Mathematics and Statistics,Jiangsu Normal University,Xuzhou 221116,China; 2.School of Information Sciences and Technology,Nanjing Agricultural University,Nanjing 210095,China; 3.Jiangsu Key Laboratory for Intelligent Agricultural Equipments,Nanjing Agricultural University,Nanjing 210031,China
DOI:10.16157/j.issn.0258-7998.180439
Author:Jin Peng1,2,Yang Zhongliang1,2,Huang Yongfeng1,2
Author Affilications:1.Department of Electronic Engineering,Tsinghua University,Beijing 100084,China; 2.Tsinghua National Laboratory of Information Science and Technology,Beijing 100084,China
DOI:10.16157/j.issn.0258-7998.180559
Author:Yang Ge1,2,Gao Bing1,2,Huang Jing1,He Hui1
Author Affilications:1.College of Information Technology,Beijing Normal University(Zhuhai Campus),Zhuhai 519087,China; 2.Engineering Lab on Intelligent Perception for Internet of Things(ELIP),Shenzhen Graduate School, Peking University,Shenzhen 518055,China
DOI:10.16157/j.issn.0258-7998.180367
Author:Zhang Demin,Fu Yongli,Yang Kang
Author Affilications:Chongqing Key Lab of Mobile Communications,Chongqing University of Posts and Telecommunications,Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.180616
Author:Zhu Jiajia,Wu Runze,Tang Liangrui
Author Affilications:School of Electrical and Electronic Engineering,North China Electric Power University,Beijing 102206,China
DOI:10.16157/j.issn.0258-7998.181233
Author:Liu Liu,Xu Jin,Wu Pengfei
Author Affilications:Engineering Research Center of Wireless Communication,Nanjing University of Posts and Telecommunication,Nanjing 210003,China
DOI:10.16157/j.issn.0258-7998.180118
Author:Wang Tao,Gong Ningsheng,Jiang Guixiang
Author Affilications:College of Computer Science and Technology,Nanjing Tech University,Nanjing 211816,China
DOI:10.16157/j.issn.0258-7998.180540
Author:Zhang Shan,Liu Xiaokai,Wang Chao,Hao Kelin
Author Affilications:National Computer System Engineering Research Institute of China,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.174745
Author:Li Yanwen1,Cui Yang2,Li Lixin3
Author Affilications:1.School of Mechatronics Engineering,Harbin Institute of Technology,Harbin 150001,China; 2.School of Computer Science and Technology,Hangzhou DIANZI University,Hangzhou 310018,China; 3.Hik Group of China Electronics Technology Group Corporation,Hangzhou 310012,China
DOI:10.16157/j.issn.0258-7998.180065
Author:Liu Yi1,2,Che Jin1,2,Zhu Xiaobo1,2,Hang Li1,2,Hao Zhiyang1,2
Author Affilications:1.School of Physics and Electronic-Electrical Engineeing,Ningxia University,Yinchuan 750021,China; 2.Ningxia Key Laboratory of Intelligent Sensing for Desert Information(Ningxia University),Yinchuan 750021,China
DOI:10.16157/j.issn.0258-7998.174639
Author:Zhang Han1,Yan Huaiping1,Zhang Zhan2
Author Affilications:1.School of Computer Science and Information Engineering,Anyang Institute of Technology,Anyang 455000,China; 2.School of Electrical Engineering and Automation,Henan Polytechnic University,Jiaozuo 454000,China
DOI:10.16157/j.issn.0258-7998.174389
Author:Wang Zhihua1,2,Chen Dongyang1,2,Yao Tao3,Lv Dianli1,2,Zhang Huijuan1,2
Author Affilications:1.State Key Laboratory of Reliability and Intelligence of Electrical Equipment,Hebei University of Technology,Tianjin 300130,China; 2.Province-Ministry Joint Key Laboratory of Electromagnetic Field and Electrical Apparatus Reliability, Hebei University of Technology,Tianjin 300130,China; 3.School of Mechanical Engineering,Hebei University of Technology,Tianjin 300130,China
DOI:10.16157/j.issn.0258-7998.180190
Author:Gao Xuefei1,Zhang Jian1,2,Li Jinlong1
Author Affilications:1.Key Laboratory of Power Electronics and Electrical Drives,Institute of Electrical Engineering, Chinese Academy of Sciences,Beijing 100190,China; 2.Beijing Engineering Laboratory of Electrical Drive System & Power Electronic Device Packaging Technology, Institute of Electrical Engineering,Chinese Academy of Sciences,Beijing 100190,China
DOI:10.16157/j.issn.0258-7998.175180
Author:Li Yiming1,Wei Jincheng1,Guo Xiaoying2,Zhang Yufeng1,He Jinyu1,Li Yong3,Cao Taiqiang1
Author Affilications:1.School of Electric Information,Xihua University,Chengdu 610039,China; 2.School of Information and Electric Enaineerina,Panzhihua University,Panzhihua 617000,China; 3.Zhengzhou Power Supply Company,State Grid Henan Electric Power Company,Zhengzhou 450000,China
DOI:10.16157/j.issn.0258-7998.174140
Author:Tang Jianqiang,Zhou Fengxing,Mei Mingyang
Author Affilications:School of Information Science and Technology,Wuhan University of Science and Technology,Wuhan 430081,China
DOI:10.16157/j.issn.0258-7998.180047
Author:Lu Di1,Xue Jingwei1,Liang Jianing2
Author Affilications:1.School of Mechanical and Electrical Engineering,Xi′an University of Architecture and Technology,Xi′an 710055,China; 2.Shenzhen Institute of Advanced Technology,Chinese Academy of Sciences,Shenzhen 518055,China
DOI:10.16157/j.issn.0258-7998.182545
Author:Zhang Yingying
Author Affilications:Xinyang City,Henan Province,Quality and Technical Supervision,Inspection and Testing Center,Xinyang 464000,China
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