DOI:10.16157/j.issn.0258-7998.190071
Author:Tian Ye,Zhu Ruohua,Tang Zhiri,Chang Sheng
Author Affilications:School of Physics and Technology,Wuhan University,Wuhan 430072,China
DOI:10.16157/j.issn.0258-7998.190127
Author:Duan Peipei1,2,Li Hui1,Luo Mingshi2
Author Affilications:1.Department of Electronics Engineering,Northwestern Polytechnical University,Xi′an 710029,China; 2.School of Computer Science,Xi′an Shiyou University,Xi′an 710065,China
DOI:10.16157/j.issn.0258-7998.183108
Author:Guo Xiaoming,Wu Yaozhen,Qiao Zhengming
Author Affilications:Construction Preparation Office,Maritime Environment Security Base,PLA,Beijing 100088,China
DOI:10.16157/j.issn.0258-7998.190018
Author:Tang Zhiri,Zhu Ruohua,Chang Sheng
Author Affilications:School of Physics and Technology,Wuhan University,Wuhan 430072,China
DOI:10.16157/j.issn.0258-7998.183297
Author:Wang Peicheng,Zhang Weigang
Author Affilications:School of Information Engineering,Chang'an University,Xi′an 710054,China
DOI:10.16157/j.issn.0258-7998.183086
Author:Wang Shuping,Zhang Yi,Wei Wenwen,Yang Shuo,He Huang
Author Affilications:Future Network Research Institute,Chongqing University of Posts and Telecommunications,Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.190068
Author:Yu Geng1,Fang Hongtao2
Author Affilications:1.School of Civil Aviation,Shenyang Aerospace University,Shenyang 110136,China; 2.School of Electronic Information Engineering,Shenyang Aerospace University,Shenyang 110136,China
DOI:10.16157/j.issn.0258-7998.190082
Author:Zhang Jie,Sui Yang,Li Qiang,Li Xiang,Dong Wei
Author Affilications:College of Electronic Science and Engineering,Jilin University,Changchun 130012,China
DOI:10.16157/j.issn.0258-7998.182074
Author:Tian Fan,Yang Mengwei,Shan Changhong
Author Affilications:College of Electrical Engineering,University of South China,Hengyang 421001,China
DOI:10.16157/j.issn.0258-7998.182447
Author:Yuan Yifei,Zhang Bo
Author Affilications:School of Electronic Engineering,Xi′an University of Posts and Telecommunications,Xi′an 710121,China
DOI:10.16157/j.issn.0258-7998.182526
Author:Pei Lei,Ge Wenping,Reyhan Baktur,Chen Juan
Author Affilications:College of Information Science and Engineering,Xinjiang University,Urumqi 830046,China
DOI:10.16157/j.issn.0258-7998.182242
Author:Gao Hongbo,Li Lei,Zhou Wanting,Xiang Yiyao
Author Affilications:Research Institute of Electronic Science and Technology,University of Electronic Science and Technology of China, Chengdu 611731,China
DOI:10.16157/j.issn.0258-7998.182027
Author:Du Yong
Author Affilications:College of Electronics and Information Engineering,Sichuan Technology and Business University,Chengdu 611745,China
DOI:10.16157/j.issn.0258-7998.183275
Author:Li Jin,Jiao Xinquan,Liu Donghai,Wang Shuqin
Author Affilications:National Key Laboratory for Electronic Measurement Technology,North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.190021
Author:Liu Guangda,Wang Yimeng,Hu Qiuyue,Ma Mengze,Cai Jing
Author Affilications:College of Instrumentation and Electrical Engineering,Jilin University,Changchun 130061,China
DOI:10.16157/j.issn.0258-7998.183093
Author:Chen Xiayin,Peng Juhong,Cheng Zhi,Ye Bo,Zhou Min
Author Affilications:School of Computer and Information Engineering,Hubei University,Wuhan 430062,China
DOI:10.16157/j.issn.0258-7998.183330
Author:Wu Hong,Song Chunwei,Guo Yonghong
Author Affilications:College of Mechanical and Electrical Engineering,China Jiliang University,Hangzhou 310018,China
DOI:10.16157/j.issn.0258-7998.183310
Author:Li Xiaowen,Jiang Yanan,Li Xiu
Author Affilications:School of Communication and Information Engineering,Chongqing University of Post an Telecommunication,Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.183159
Author:Yang Bo1,2,Meng Qingdong3
Author Affilications:1.School of Electronics and Science,Jilin University,Changchun 130000,China; 2.School of Electronics and Information,Changchun University of Science and Technology,Changchun 130000,China; 3.Institute of Optical Precision Machinery,Changchun University of Science and Technology,Changchun 130000,China
DOI:10.16157/j.issn.0258-7998.183202
Author:Li Yuyang1,Zhang Tao1,Guan Hanxing2,Sheng Yuxia1
Author Affilications:1.Engineering Research Center of Metallurgical Automation and Measurement Technology, Wuhan University of Science and Technology,Wuhan 430081,China; 2.Yangtze Optical Fibre and Cable Joint Stock Limited Company,Wuhan 430000,China
DOI:10.16157/j.issn.0258-7998.183016
Author:Xiao Jun,Zhou Yuanping,Xiao Yutong
Author Affilications:College of Electronics and Information Engineering,Sichuan University,Chengdu 610064,China
DOI:10.16157/j.issn.0258-7998.190027
Author:Liu Feng,Wang Shuping,Jiang Shengming
Author Affilications:College of Information Engineering,Shanghai Maritime University,Shanghai 201306,China
DOI:10.16157/j.issn.0258-7998.183193
Author:Shan Huilin,Zhang Yinsheng
Author Affilications:Nanjing University of Information Science & Technology,Nanjing 210044,China
DOI:10.16157/j.issn.0258-7998.190038
Author:Cheng Le1,2,Xu Yihan1,Bian Yuetang3
Author Affilications:1.Department of Computer Science and Communication Engineering, Huaian Vocational College of Information Technology, Huaian 223003,China; 2.College of Computer and Information,Hohai University,Nanjing 210098,China; 3.School of Business,Nanjing Normal University,Nanjing 210023,China
DOI:10.16157/j.issn.0258-7998.183311
Author:Yang Luxin1,2,Dong Wenbo1
Author Affilications:1.Key Laboratory of Space Utilization,Technology and Engineering Center for Space Utilization,Chinese Academy of Sciences, Beijing 100094,China; 2.School of Computer and Control Engineering,University of Chinese Academy of Sciences,Beijing 101408,China
DOI:10.16157/j.issn.0258-7998.183173
Author:Yao Liping,Pan Zhongliang
Author Affilications:College of Physics and Telecommunications Engineering,South China Normal University,Guangzhou 510006,China
DOI:10.16157/j.issn.0258-7998.190079
Author:Qiao Jingwei,Xiao Hong,Li Suisheng,Liu Shaofeng,Zhou Yubin,Zhang Cheng
Author Affilications:School of Computers,Guangdong University of Technology,Guangzhou 510006,China
DOI:10.16157/j.issn.0258-7998.182726
Author:Liu Kui1,Liu Jian1,Guan Zenglun2,Liu Rucheng3
Author Affilications:1.School of Electrical and Information Engineering,Wuhan Institute of Technology,Wuhan 430200,China; 2.China National Coal Group Corp.,Beijing 100120,China; 3.Chinacoal Pingshuo Group Co.,LTD.,Shuozhou 036002,China
DOI:10.16157/j.issn.0258-7998.182581
Author:Lin Jiang,Xie Yue
Author Affilications:Institute of Mechanical and Electrical Engineering,China Jiliang University,Hangzhou 310018,China
DOI:10.16157/j.issn.0258-7998.182831
Author:Yin Jingwen,Lin Jinghu,Jin Yonggao
Author Affilications:College of Engineering,Yanbian University,Yanji 133002,China
DOI:10.16157/j.issn.0258-7998.182770
Author:He Dewei,Shi Chun,Wu Gang
Author Affilications:School of Information Science and Technology,University of Science and Technology of China,Hefei 230026,China
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