DOI:10.16157/j.issn.0258-7998.199061
Author:Xiang Min1,Niu Liqiang2,Wu Peiyu2,Xie Yongjun2,Shi Songhua1,Yan Jie1
Author Affilications:1.Aviation Industry Corporation of China Chengdu Aircraft Industry(Group) Co.,LTD.,Chengdu 610000,China; 2.School of Electronics and Information Engineering,Beihang University,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.190016
Author:Wang Lei
Author Affilications:No.8511 Research Institute of CASIC,Nanjing 210007,China
DOI:10.16157/j.issn.0258-7998.190227
Author:Li Yadong,Zhao Ergang,Yu Mei,Wei Na,Zhang Jianjun
Author Affilications:College of Electronic Information and Optical Engineering,Nankai University,Tianjin 300350,China
DOI:10.16157/j.issn.0258-7998.183287
Author:Tang Tingyu
Author Affilications:Southwest China Institute of Electronic Technology,Chengdu 610036,China
DOI:10.16157/j.issn.0258-7998.190013
Author:Wang Jian,Chen Lin,Ruan Xiaoming,Yao Wusheng
Author Affilications:Brainware Terahetz Information Technology Company Limited,Hefei 230088,China
DOI:10.16157/j.issn.0258-7998.199062
Author:Wang Jinqiang,Huang Hang,Zhi Peng,Shen Zebang,Zhou Qingguo
Author Affilications:School of Information Science and Engineering,Lanzhou University,Lanzhou 730000,China
DOI:10.16157/j.issn.0258-7998.190010
Author:Wang Yu,Zhang Huanjun,Huang Haixin
Author Affilications:College of Automation and Electrical Engineering,Shenyang Ligong University,Shenyang 110159,China
DOI:10.16157/j.issn.0258-7998.190168
Author:Wang Saijiao1,2
Author Affilications:1.Taizhou Radio & TV University,Taizhou 318000,China; 2.Computer College,Hangzhou Dianzi University,Hangzhou 310018,China
DOI:10.16157/j.issn.0258-7998.190159
Author:Zeng Xiangkun1,Zhang Junhui2,3,Shi Tuo1,Shao Kejia4
Author Affilications:1.Beijing Police College,Beijing 102202,China; 2.Key Laboratory of Transport Industry of Big Data Application Technologies for Comprehensive Transport,Ministry of Transport, Beijing Jiaotong University,Beijing 100044,China; 3.Beijing Traffic Management Bureau,Beijing 100037,China;4.MaShang Consumer Finance Co.,Ltd.,Beijing 100102,China
DOI:10.16157/j.issn.0258-7998.190146
Author:Yao Ronghuan1,2
Author Affilications:1.National Computer System Engineering Research Institute of China,Beijing 100083,China; 2.China Software Information System Engineering Co.,Ltd.,Beijing 100081,China
DOI:10.16157/j.issn.0258-7998.182483
Author:Luo Jia,Sun Liang,Wu Zhiguang
Author Affilications:Department of Mechanical and Electrical Technology,Chizhou Vocational and Technical College,Chizhou 247000,China
DOI:10.16157/j.issn.0258-7998.182850
Author:Huang Minyuan,Yan Hua
Author Affilications:College of Electronics and Information Engineering,Sichuan University,Chengdu 610065,China
DOI:10.16157/j.issn.0258-7998.182563
Author:Deng Tianchuan1,2,Hu Zhenbo2
Author Affilications:1.School of Physics and Technology,Wuhan University,Wuhan 430072,China; 2.Nuclei System Technology Co.,Ltd.,Wuhan 430072,China
DOI:10.16157/j.issn.0258-7998.182661
Author:Cui Bin,Wang Wenyan,Wang Zhe,Zhang Leihao,Li Shuang,Kang He
Author Affilications:China Academy of Space Technology,Beijing 100011,China
DOI:10.16157/j.issn.0258-7998.182858
Author:Bai Ke,Zhou Haomiao
Author Affilications:Key Laboratory of Electromagnetic Wave Information Technology and Metrology of Zhejiang Province, College of Information Engineering,China Jiliang University,Hangzhou 310018,China
DOI:10.16157/j.issn.0258-7998.190460
Author:Yi Zhiqiang,Han Bin,Jiang Hong,Zhang Qiuyun
Author Affilications:School of Information Engineering,Southwest University of Science and Technology,Mianyang 621010,China
DOI:10.16157/j.issn.0258-7998.190238
Author:Dong Yunlong,Huang Gaodong,Li Baozhu,Liu Ningbo,Chen Xiaolong
Author Affilications:Research Institute of Information Fusion,Naval Aviation University,Yantai 264001,China
DOI:10.16157/j.issn.0258-7998.190138
Author:Han Xuelong1,Hou Yinyin2,Gu Nenghua1,Han Shuangxia1
Author Affilications:1.School of of Electrical and Information Engineering,Quzhou University,Quzhou 324000,China; 2.Zhejiang Quzhou Power Supply Company,State Grid,Quzhou 324000,China
DOI:10.16157/j.issn.0258-7998.183091
Author:Li Da,Han Donggui,Shen Chengyandan,Li Hongjun,Yan Nu
Author Affilications:School of Mechanical Engineering and Automation,Wuhan Textile University,Wuhan 43000,China
DOI:10.16157/j.issn.0258-7998.190319
Author:Chen Ying,Nie Wei
Author Affilications:Computer System and Communication Laboratory,Beijing University of Chemical Technology,Beijing 100029,China
DOI:10.16157/j.issn.0258-7998.190249
Author:Song Peng1,He Guodong2
Author Affilications:1.China Electronics Technology Group Corporation No.58 Research Institute,Nanjing 210000,China; 2.College of Physics and Electronic Information,Anhui Normal University,Wuhu 241003,China
DOI:10.16157/j.issn.0258-7998.190198
Author:Zhao Peng,Feng Dajun,Xu Yifeng
Author Affilications:National Computer System Engineering Research Institute of China,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.190091
Author:Zhao Lin1,Fang Yanhong1,2,Zhang Hongying1,2,Wang Xueyuan1
Author Affilications:1.Faculty of Information Engineering,Southwest University of Science and Technology,Mianyang 621010,China; 2.Key Laboratory of Sichuan Province for Robot Technology Used for Special Environment,Mianyang 621010,China
DOI:10.16157/j.issn.0258-7998.190085
Author:Jiang Meng1,2,Cai Yong1,2,Zhang Jiansheng1,2
Author Affilications:1.School of Manufacturing Science and Engineering,Southwest University of Science and Technology,Mianyang 621010,China; 2.Key Laboratory of Testing Technology for Manufacturing Process,Mianyang 621010,China
DOI:10.16157/j.issn.0258-7998.190030
Author:Wang Li,Guo Xiaodong,Hui Yanbo
Author Affilications:School of Electrical Engineering,Henan University of Technology,Zhengzhou 450001,China
DOI:10.16157/j.issn.0258-7998.182874
Author:Lu Yufang1,2,Zhuang Yiqi1,Wu Xuanhui2
Author Affilications:1.School of Microelectronics,Xidian University,Xi′an 710071,China; 2.Guilin Aerospace Electronic Technology Co.,Ltd.,Guilin 541004,China
DOI:10.16157/j.issn.0258-7998.190050
Author:Huang Yuke,Xu Jun,Yu Jianghang
Author Affilications:School of Astronautics,Beijing Institute of Technology,Beijing 100081,China
DOI:10.16157/j.issn.0258-7998.190247
Author:Wang Wei1,Zhang Qiuyun1,Jiang Hong1,Yu Hengsong2,Yi Zhiqiang1,Zhu Di1
Author Affilications:1.School of Information Engineering,Southwest University of Science and Technology,Mianyang 621010,China; 2.School of National Defense of Science and Technology,Southwest University of Science and Technology,Mianyang 621010,China
DOI:10.16157/j.issn.0258-7998.190096
Author:Lei Wuwei,Wen Feng,Liu Donghai,Wang Shuqin
Author Affilications:Key Laboratory of Instrumentation Science and Dynamic Measurement,Ministry of Education; Science and Technology on Electronic Test and Measurement Laboratory,North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.190193
Author:Zhang Li,Li Da,Liu Huixi,Liu Shouyin
Author Affilications:College of Physical Science and Technology,Central China Normal University,Wuhan 430079,China
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