DOI:10.16157/j.issn.0258-7998.190632
Author:Wang Yuxin,Qiu Gang,Lu Zhaohua,Jiang Chuangxin,He Zhen
Author Affilications:ZTE Corporation,Shenzhen 518057,China
DOI:10.16157/j.issn.0258-7998.190740
Author:Tian Liang,Zhang Yan,Xu Li
Author Affilications:Datang Mobile Communication Equipment Co.,Ltd.,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.190726
Author:Zhu Xuetian
Author Affilications:China Telecommunication Research Institute,Beijing 102209,China
DOI:10.16157/j.issn.0258-7998.190709
Author:Xiong Xiaomin1,Yang Xin1,Liu Zhaolin2,Zhu Xuetian1
Author Affilications:1.Beijing Research Institute of China Telecom Corporation Limited,Beijing 102209,China; 2.Beijing University of Posts and Telecommunications,Beijing 100035,China
DOI:10.16157/j.issn.0258-7998.199801
Author:Guo Fangjin,Wang Weibo,Chen Zhongfei,Sun Hongzheng,Zhou Xibang,Tao Hongqi
Author Affilications:Nanjing Electronic Devices Institute,Nanjing 210016,China
DOI:10.16157/j.issn.0258-7998.199802
Author:Lu Xueguang,Peng Bo,Huang Wanxiang,Shi Qiwu
Author Affilications:College of Material Science and Engineering,Sichuan University,Chengdu 610064,China
DOI:10.16157/j.issn.0258-7998.199803
Author:Che Xianghui1,2,Liang Shixiong1,Zhang Lisen1,Gu Guodong1,Hao Wenjia2, Yang Dabao2,Chen Hongtai2,Feng Zhihong1
Author Affilications:1.National Key Laboratory of ASIC,The 13th Research Institute of China Electronics Technology Group Corporation, Shijiazhuang 050051,China; 2.The 13th Research Institute of China Electronics Technology Group Corporation,Shijiazhuang 050051,China
DOI:10.16157/j.issn.0258-7998.190257
Author:Sun Guihua,Chen Shurong
Author Affilications:College of Information Engineering,Shanghai Maritime University,Shanghai 201306,China
DOI:10.16157/j.issn.0258-7998.190041
Author:Huang Haixin,Zhang Dong
Author Affilications:School of Automation and Electrical Engineering,Shenyang Ligong University,Shenyang 110159,China
DOI:10.16157/j.issn.0258-7998.190318
Author:Chen Chen1,Yan Wei2,Xia Jun1,Chai Zhilei1
Author Affilications:1.School of Internet of Things Engineering,Jiangnan University,Wuxi 214122,China; 2.School of Software & Microelectronics,Peking University,Beijing 102600,China
DOI:10.16157/j.issn.0258-7998.190095
Author:Tian Huanhuan1,2,Zhu Xiaoyan1
Author Affilications:1.College of Information Engineering,Capital Normal University,Beijing 100048,China; 2.Beijing Key Laboratory of Electronic System Reliability and Prognostics,Beijing 100048,China
DOI:10.16157/j.issn.0258-7998.190106
Author:Yang Danyang1,Yang Xuan2,Chen Tao1,Dai Zibin1,Li Wei1
Author Affilications:1.Information Engineering University,Zhengzhou 450001,China;2.Jiangnan Institute of Computing Technology,Wuxi 214083,China
DOI:10.16157/j.issn.0258-7998.190047
Author:Yang Mengwei,Tian Fan,Shan Changhong
Author Affilications:College of Electrical Engineering,University of South China,Hengyang 421001,China
DOI:10.16157/j.issn.0258-7998.199808
Author:Zhang Cheng,Tan Lingyan,Zeng Lingyue
Author Affilications:Globalfoundries China(Shanghai) Co. Limited,Shanghai 201204,China
DOI:10.16157/j.issn.0258-7998.199807
Author:Liao Lu1,Hou Chunyuan1,Li Yueping1,Wang Mei1,Liu Huanyan2,Huang Chengquan2,Xu Nannan2,Dong Lixia2
Author Affilications:1.Unigroup Yangtze Memory Technologies(Shanghai) Co.,Ltd.,Shanghai 200120,China; 2.Cadence Design System,Shanghai 200120,China
DOI:10.16157/j.issn.0258-7998.199806
Author:Wang Lei,Wang Chenguang,Wu Bin
Author Affilications:Institute of Microelectronics of the Chinese Academy of Sciences,Beijing 100029,China
DOI:10.16157/j.issn.0258-7998.199805
Author:Zhang Xiaojun1,Ji Hao1,Nie Bijian2
Author Affilications:1.Cambricon Technologies Co.,Ltd.,Shanghai 201203,China;2.Cadence Design Systems,Inc.,Shanghai 200000,China
DOI:10.16157/j.issn.0258-7998.199804
Author:Bian Shaoxian1,David He1,Luan Xiaokun1,Jiang Jianfeng1,Zhai Feixue1,Cai Zhun2
Author Affilications:1.Tianjin Phytium Technology Co.,Ltd.,Changsha 410000,China;2.Cadence Design Systems,Inc.,Shanghai 201204,China
DOI:10.16157/j.issn.0258-7998.190051
Author:Du Yan,Yang Shunping
Author Affilications:Southwest China Insitute of Electronic Technology,Chengdu 610036,China
DOI:10.16157/j.issn.0258-7998.190289
Author:Wang Kaifeng1,Wang Zhongqiang2,Xie Lirong1,Yang Huan1
Author Affilications:1.College of Electrical Engineering,Xinjiang University,Urumqi 830047,China; 2.Shaanxi Coal Group Yubei Coal Co.,Ltd.,Yulin 719000,China
DOI:10.16157/j.issn.0258-7998.190328
Author:Hu Yanping,Huang Xiaoshuang,Zheng Shujun
Author Affilications:Shanghai Han Industry Science and Technology Development Co.,Ltd.,Shanghai 201700,China
DOI:10.16157/j.issn.0258-7998.190467
Author:Wang Hongmei,Yao Chong,Wang Faguang,Li Shiyin,Song Jinling
Author Affilications:School of Information and Control Engineering,China University of Mining and Technology,Xuzhou 221200,China
DOI:10.16157/j.issn.0258-7998.190521
Author:Liu Chaotao,Zhang Xuejiao
Author Affilications:School of Mechanical,Electrical and Vehicle Engineering,Chongqing Jiaotong University,Chongqing 400074,China
DOI:10.16157/j.issn.0258-7998.190606
Author:Wu Li1,Huang Xin2,Xue Wei1
Author Affilications:1.Department of Computer Science and Technology,Tsinghua University,Beijing 100084,China; 2.Center for Ecosystem Science and Society,Northern Arizona University,Flagstaff 86011,USA
DOI:10.16157/j.issn.0258-7998.190546
Author:Yan Yingjian,Zheng Zhen
Author Affilications:3rd College,Information Engineering University,Zhengzhou 450001,China
DOI:10.16157/j.issn.0258-7998.190515
Author:Lu Houyuan
Author Affilications:Intelligent Engineering College,Hebei Industrial Polytechic,Shiyan 442000,China
DOI:10.16157/j.issn.0258-7998.190548
Author:Xu Chuanpei,Wang Jifeng,Niu Junhao
Author Affilications:Guangxi Key Laboratory of Automatic Detection Technology and Instruments,School of Electronic Engineering and Automation, Guilin University of Electronic Technology,Guilin 541004,China
DOI:10.16157/j.issn.0258-7998.190354
Author:Wang Xiaolei,Xu Yan,Wang Zhenxing,Tu Jinsheng,Wang Chuan′ao,Zhu Yi
Author Affilications:College of Microelectronics,Hefei University of Technology,Hefei 230009,China
DOI:10.16157/j.issn.0258-7998.190128
Author:Bai Jia,Wei Xin,Zhu Guang
Author Affilications:College of Information Science & Technology,Chengdu University of Technology,Chengdu 610059,China
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