DOI:10.16157/j.issn.0258-7998.190632
Author:Wang Yuxin,Qiu Gang,Lu Zhaohua,Jiang Chuangxin,He Zhen
Author Affilications:ZTE Corporation,Shenzhen 518057,China
DOI:10.16157/j.issn.0258-7998.190740
Author:Tian Liang,Zhang Yan,Xu Li
Author Affilications:Datang Mobile Communication Equipment Co.,Ltd.,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.190726
Author:Zhu Xuetian
Author Affilications:China Telecommunication Research Institute,Beijing 102209,China
DOI:10.16157/j.issn.0258-7998.190709
Author:Xiong Xiaomin1,Yang Xin1,Liu Zhaolin2,Zhu Xuetian1
Author Affilications:1.Beijing Research Institute of China Telecom Corporation Limited,Beijing 102209,China; 2.Beijing University of Posts and Telecommunications,Beijing 100035,China
DOI:10.16157/j.issn.0258-7998.199801
Author:Guo Fangjin,Wang Weibo,Chen Zhongfei,Sun Hongzheng,Zhou Xibang,Tao Hongqi
Author Affilications:Nanjing Electronic Devices Institute,Nanjing 210016,China
DOI:10.16157/j.issn.0258-7998.199802
Author:Lu Xueguang,Peng Bo,Huang Wanxiang,Shi Qiwu
Author Affilications:College of Material Science and Engineering,Sichuan University,Chengdu 610064,China
DOI:10.16157/j.issn.0258-7998.199803
Author:Che Xianghui1,2,Liang Shixiong1,Zhang Lisen1,Gu Guodong1,Hao Wenjia2, Yang Dabao2,Chen Hongtai2,Feng Zhihong1
Author Affilications:1.National Key Laboratory of ASIC,The 13th Research Institute of China Electronics Technology Group Corporation, Shijiazhuang 050051,China; 2.The 13th Research Institute of China Electronics Technology Group Corporation,Shijiazhuang 050051,China
DOI:10.16157/j.issn.0258-7998.190257
Author:Sun Guihua,Chen Shurong
Author Affilications:College of Information Engineering,Shanghai Maritime University,Shanghai 201306,China
DOI:10.16157/j.issn.0258-7998.190041
Author:Huang Haixin,Zhang Dong
Author Affilications:School of Automation and Electrical Engineering,Shenyang Ligong University,Shenyang 110159,China
DOI:10.16157/j.issn.0258-7998.190318
Author:Chen Chen1,Yan Wei2,Xia Jun1,Chai Zhilei1
Author Affilications:1.School of Internet of Things Engineering,Jiangnan University,Wuxi 214122,China; 2.School of Software & Microelectronics,Peking University,Beijing 102600,China
DOI:10.16157/j.issn.0258-7998.190095
Author:Tian Huanhuan1,2,Zhu Xiaoyan1
Author Affilications:1.College of Information Engineering,Capital Normal University,Beijing 100048,China; 2.Beijing Key Laboratory of Electronic System Reliability and Prognostics,Beijing 100048,China
DOI:10.16157/j.issn.0258-7998.190106
Author:Yang Danyang1,Yang Xuan2,Chen Tao1,Dai Zibin1,Li Wei1
Author Affilications:1.Information Engineering University,Zhengzhou 450001,China;2.Jiangnan Institute of Computing Technology,Wuxi 214083,China
DOI:10.16157/j.issn.0258-7998.190047
Author:Yang Mengwei,Tian Fan,Shan Changhong
Author Affilications:College of Electrical Engineering,University of South China,Hengyang 421001,China
DOI:10.16157/j.issn.0258-7998.199808
Author:Zhang Cheng,Tan Lingyan,Zeng Lingyue
Author Affilications:Globalfoundries China(Shanghai) Co. Limited,Shanghai 201204,China
DOI:10.16157/j.issn.0258-7998.199807
Author:Liao Lu1,Hou Chunyuan1,Li Yueping1,Wang Mei1,Liu Huanyan2,Huang Chengquan2,Xu Nannan2,Dong Lixia2
Author Affilications:1.Unigroup Yangtze Memory Technologies(Shanghai) Co.,Ltd.,Shanghai 200120,China; 2.Cadence Design System,Shanghai 200120,China
DOI:10.16157/j.issn.0258-7998.199806
Author:Wang Lei,Wang Chenguang,Wu Bin
Author Affilications:Institute of Microelectronics of the Chinese Academy of Sciences,Beijing 100029,China
DOI:10.16157/j.issn.0258-7998.199805
Author:Zhang Xiaojun1,Ji Hao1,Nie Bijian2
Author Affilications:1.Cambricon Technologies Co.,Ltd.,Shanghai 201203,China;2.Cadence Design Systems,Inc.,Shanghai 200000,China
DOI:10.16157/j.issn.0258-7998.199804
Author:Bian Shaoxian1,David He1,Luan Xiaokun1,Jiang Jianfeng1,Zhai Feixue1,Cai Zhun2
Author Affilications:1.Tianjin Phytium Technology Co.,Ltd.,Changsha 410000,China;2.Cadence Design Systems,Inc.,Shanghai 201204,China
DOI:10.16157/j.issn.0258-7998.190051
Author:Du Yan,Yang Shunping
Author Affilications:Southwest China Insitute of Electronic Technology,Chengdu 610036,China
DOI:10.16157/j.issn.0258-7998.190289
Author:Wang Kaifeng1,Wang Zhongqiang2,Xie Lirong1,Yang Huan1
Author Affilications:1.College of Electrical Engineering,Xinjiang University,Urumqi 830047,China; 2.Shaanxi Coal Group Yubei Coal Co.,Ltd.,Yulin 719000,China
DOI:10.16157/j.issn.0258-7998.190328
Author:Hu Yanping,Huang Xiaoshuang,Zheng Shujun
Author Affilications:Shanghai Han Industry Science and Technology Development Co.,Ltd.,Shanghai 201700,China
DOI:10.16157/j.issn.0258-7998.190467
Author:Wang Hongmei,Yao Chong,Wang Faguang,Li Shiyin,Song Jinling
Author Affilications:School of Information and Control Engineering,China University of Mining and Technology,Xuzhou 221200,China
DOI:10.16157/j.issn.0258-7998.190521
Author:Liu Chaotao,Zhang Xuejiao
Author Affilications:School of Mechanical,Electrical and Vehicle Engineering,Chongqing Jiaotong University,Chongqing 400074,China
DOI:10.16157/j.issn.0258-7998.190606
Author:Wu Li1,Huang Xin2,Xue Wei1
Author Affilications:1.Department of Computer Science and Technology,Tsinghua University,Beijing 100084,China; 2.Center for Ecosystem Science and Society,Northern Arizona University,Flagstaff 86011,USA
DOI:10.16157/j.issn.0258-7998.190546
Author:Yan Yingjian,Zheng Zhen
Author Affilications:3rd College,Information Engineering University,Zhengzhou 450001,China
DOI:10.16157/j.issn.0258-7998.190515
Author:Lu Houyuan
Author Affilications:Intelligent Engineering College,Hebei Industrial Polytechic,Shiyan 442000,China
DOI:10.16157/j.issn.0258-7998.190548
Author:Xu Chuanpei,Wang Jifeng,Niu Junhao
Author Affilications:Guangxi Key Laboratory of Automatic Detection Technology and Instruments,School of Electronic Engineering and Automation, Guilin University of Electronic Technology,Guilin 541004,China
DOI:10.16157/j.issn.0258-7998.190354
Author:Wang Xiaolei,Xu Yan,Wang Zhenxing,Tu Jinsheng,Wang Chuan′ao,Zhu Yi
Author Affilications:College of Microelectronics,Hefei University of Technology,Hefei 230009,China
DOI:10.16157/j.issn.0258-7998.190128
Author:Bai Jia,Wei Xin,Zhu Guang
Author Affilications:College of Information Science & Technology,Chengdu University of Technology,Chengdu 610059,China
Information Flow and Energy Flow in Industrial Digital Transformation
Special Antenna and Radio Frequency Front End
Radar Target Tracking Technology
Key Technologies of 5G-A and 6G
Key Technologies of 5G and Its Evolution
Key Technologies of 5G and Its Evolution
Processing and Application of Marine Target Characteristic Data
Antenna Technology and Its Applications
5G Vertical Industry Application
Microelectronics in Medical and Healthcare
Application of Edge Computing in IIoT
Deep Learning and Image Recognization
6G Microwave Millimeter-wave Technology
Radar Processing Technology and Evaluation
Space-Ground Integrated Technology
5G Vertical Industry Application
FPGA and Artificial Intelligence
Innovation and Application of PKS System
5G Network Construction and Optimization
Network and Business Requirements for 6G
5G and Intelligent Transportation
5G R16 Core Network Evolution Technology
Satellite Nevigation Technology
5G Wireless Network Evolution Technology
5G Network Planning Technology
5G Co-construction and Sharing Technology
5G and Emergency Communication
5G Slicing Technology and Its Applications
5G Terminal Key Realization Technology
5G and Artificial Intelligence
Terahertz Technology and Its Application
Signal and Information Processing
Internet of Things and the Industrial Big Data
Electronic Techniques of UAV System
Aerospace Electronic Technology
Robot and Industrial Automation
ADAS Technique and Its Implementation
2016 IEEE International Conference on Integrated Circuits and Microsystems
Measurement and Control Technology of Bus Network
Key Techniques of 5G and Algorthm Implement