DOI:10.16157/j.issn.0258-7998.200190
Author:Li Xiao1,Li Zhijun2,Zhou Yuetian1,Zhu Xuetian3
Author Affilications:1.China Telecom Research Institute,Beijing 102209,China;2.China Telecom Group Co.,Ltd.,Beijing 100033,China; 3.China Unicom Network Technology Research Institute,Beijing 100048,China
DOI:10.16157/j.issn.0258-7998.200194
Author:Zhang Zhirong1,Li Zhijun2,Chen Jiangang2,Zhang Xin2,Zhu Xuetian3
Author Affilications:1.China Telecom Research Institute,Beijing 102209,China;2.China Telecom Group Co.,Ltd.,Beijing 100033,China; 3.China Unicom Network Technology Research Institute,Beijing 100048,China
DOI:10.16157/j.issn.0258-7998.200191
Author:Zhao Xiaoyin1,Li Zhijun2,Zhu Xuetian3
Author Affilications:1.China Telecom Research Institute,Beijing 102209,China; 2.China Telecom Group Co.,Ltd.,Beijing 100033,China; 3.China Unicom Network Technology Research Institute,Beijing 100048,China
DOI:10.16157/j.issn.0258-7998.200193
Author:Zhou Yuetian1,Li Zhijun2,Chen Jiangang2,Zhang Xin2,Zhu Xuetian3
Author Affilications:1.China Telecom Research Institute,Beijing 102209,China;2.China Telecom Group Co.,Ltd.,Beijing 100033,China; 3.China Unicom Network Technology Research Institute,Beijing 100048,China
DOI:10.16157/j.issn.0258-7998.191372
Author:Cheng Gang,Yang Zhijie
Author Affilications:Nokia Shanghai Bell Co.,Ltd.,Shanghai 200127,China
DOI:10.16157/j.issn.0258-7998.191367
Author:Li Hailei1,Yang Wenzhong1,2,Li Donghao1,Wen Jiebin1,Qian Yunyun1
Author Affilications:1.College of Information Science and Engineering,Xinjiang University,Urumqi 830046,China; 2.National Engineering Laboratory for Public Safety Risk Perception and Control by Big Data(PSRPC), China Academy of Electronics and Information Technology,Beijing 100041,China
DOI:10.16157/j.issn.0258-7998.191123
Author:Ke Ting1,Ge Xuechun2,Zhang Lidong1,Lv Hui1
Author Affilications:1.College of Science,Tianjin University of Science & Technology,Tianjin 300457,China; 2.Beijing Huatie Information Technology Co.,Ltd.,Beijing 100081,China
DOI:10.16157/j.issn.0258-7998.191424
Author:Wang Ming1,2,Zhang Youtao1,2,3,Ye Qingguo2,Luo Ning2,Li Xiaopeng1,2
Author Affilications:1.Nanjing Electronic Devices Institute,Nanjing 210016,China;2.Nanjing GuoBo Electronics Co.,Ltd.,Nanjing 210016,China; 3.Science and Technology on Monolithic Integrated Circuits and Modules laboratory,Nanjing 210016,China
DOI:10.16157/j.issn.0258-7998.200005
Author:Xue Yuqian,Dai Zibin
Author Affilications:Information Engineering University,Zhengzhou 450001,China
DOI:10.16157/j.issn.0258-7998.191333
Author:Liu Ying1,Tian Ze1,2,Lv Junsheng1,2,Shao Gang1,2,Hu Shufan1,Li Jia1
Author Affilications:1.AVIC Computing Technique Research Institute,Xi′an 710068,China; 2.Aviation Key Laboratory of Science and Technology on Integrated Circuit and Micro-System Design,Xi′an 710068,China
DOI:10.16157/j.issn.0258-7998.191091
Author:Jing Chen1,2,Fu Xiaotong1,Dong Wei2,Zhao Yunfei2
Author Affilications:1.School of Cyber Engineering,Xidian University,Xi′an 710071,China; 2.National Computer System Engineering Research Institute of China,Beijing 102209,China
DOI:10.16157/j.issn.0258-7998.190620
Author:Tian Xiaosong1,Yang Hua2,Cai Xianyun1,Gu Miao3
Author Affilications:1.Zunyi Bozhou Power Supply Bureau,Guizhou Power Grid Co.,Ltd.,Zunyi 563000,China; 2.Zunyi Power Supply Bureau,Guizhou Power Grid Co.,Ltd.,Zunyi 563000,China; 3.Zhuhai Heishi Electrical Automation Technology Co.,Ltd.,Zhuhai 519000,China
DOI:10.16157/j.issn.0258-7998.190974
Author:Guo Tao1,2,Zhang Qiwei1,2,Yuan Jingchao1,2
Author Affilications:1.State Key Laboratory of Electronic Test Technology,North University of China,Taiyuan 030051,China; 2.Key Laboratory of Instrument Science & Dynamic Measurement,Ministry of Education, North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.190984
Author:Gao Guangshun,Chen Xiao
Author Affilications:National Defense Key Discipline Laboratory of Communication and Information Transmission and Fusion Technology, Hangzhou Dianzi University,Hangzhou 310018,China
DOI:10.16157/j.issn.0258-7998.191066
Author:Cheng Qize1,Chen Zehua1,Zhang Yunqin1,Jiang Wenjie2,Liu Xiaofeng1,Shen Liang2
Author Affilications:1.College of Data Science,Taiyuan University of Technology,Taiyuan 030001,China; 2.Jinneng Clean Energy Co.,Ltd.,Taiyuan 030001,China
DOI:10.16157/j.issn.0258-7998.191029
Author:Huang Xiaolun,Wang Dong
Author Affilications:Chongqing Health Information Center,Chongqing 401120,China
DOI:10.16157/j.issn.0258-7998.191074
Author:Hu Jinyan,Song Shaojing
Author Affilications:School of Computer and Information Engineering,Shanghai Polytechnic University,Shanghai 201209,China
DOI:10.16157/j.issn.0258-7998.190501
Author:Liu Meihong1,Gao Shanfeng1,Li Wei2,Xie Bin3
Author Affilications:1.Department of Automation,Shanxi University,Taiyuan 030006,China; 2.Department of Automation,Taiyuan University of Technology,Taiyuan 030024,China; 3.Mitsubishi Heavy Industries Haier(Qingdao)Air-Conditoners Company,LTD.,Qingdao 266200,China
DOI:10.16157/j.issn.0258-7998.191336
Author:Li Zhaochun1,Gu Quan1,2,Wang Yucheng2
Author Affilications:1.School of Mechanical and Electrical Engineering,Nanjing Forestry University,Nanjing 210037,China; 2.Changzhou Institute of Advanced Manufacturing Technology,Hefei Institute of Material Sciences, Chinese Academy of Sciences,Changzhou 213000,China
DOI:10.16157/j.issn.0258-7998.191148
Author:Shen Pengfei,Xie Yue
Author Affilications:Institute of Mechanical and Electrical Engineering,China Jiliang University,Hangzhou 310018,China
DOI:10.16157/j.issn.0258-7998.200042
Author:Li Zhaoqin,Chen Daolian
Author Affilications:College of Electrical Engineering,Qingdao University,Qingdao 266071,China
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