DOI:10.16157/j.issn.0258-7998.211706
Author:Wang Yao,Bu Gang
Author Affilications:College of Electronic Information Engineering,Nanjing University of Aeronautics and Astronautics,Nanjing 210000,China
DOI:10.16157/j.issn.0258-7998.212443
Author:Tang Xueyong1,Yao Junrong2,Wan Huijiang3,Li Zhen1,Yang He4
Author Affilications:1.Power Grid Planning & Research Center,Guizhou Power Grid Co.,Ltd.,Guiyang 550003,China; 2.Guizhou University,Guiyang 550003,China; 3.Power Dispatching Control Center,Guizhou Power Grid Co.,Ltd.,Guiyang 550003,China; 4.Sichuan Energy Internet Research Institute,Tsinghua University,Chengdu 610213,China
DOI:10.16157/j.issn.0258-7998.212441
Author:Cao Bin1,2,Yuan Shuai2,Xin Donghao2
Author Affilications:1.School of Electrical Engineering,Zhejiang University,Hangzhou 310058,China; 2.Inner Mongolia Electric Power Research Institute,Hohhot 010020,China
DOI:10.16157/j.issn.0258-7998.212432
Author:Liu Shichao1,2,Yang Bin1,2,Liu Weiguo1,2
Author Affilications:1.School of Software,Shandong University,Jinan 250101,China;2.National Supercomputing Center in Wuxi,Wuxi 214072,China
DOI:10.16157/j.issn.0258-7998.212422
Author:Yang Bin1,2,Wang Jingyu3,Liu Weiguo1,2,Cai Huiyi2,Yu Fei4,5,Deng Liantang4,5,Huang Liping4,5
Author Affilications:1.School of Software,Shandong University,Jinan 250101,China;2.National Supercomputing Center in Wuxi,Wuxi 214072,China; 3.National Research Center of Parallel Computer Engineering & Technology,Beijing 100086,China; 4.Numerical Weather Prediction Center of CMA,Beijing 100081,China;5.State Key Laboratory of Severe Weather,Beijing 100081,China
DOI:10.16157/j.issn.0258-7998.212397
Author:Lv Xiaojing1,2,Liu Zhao2,3,Cai Huiyi2,Li Jinwei2
Author Affilications:1.China Ship Scientific Research Center,Wuxi 214000,China; 2.National Supercomputing Center in Wuxi,Wuxi 214000,China;3.Tsinghua University,Beijing 100080,China
DOI:10.16157/j.issn.0258-7998.212426
Author:A retrieval strategy of load balancing optimization scheme for CESM based on matrix nesting
Author Affilications:Department of Computer Technology and Application,Qinghai University,Xining 810016,China
DOI:10.16157/j.issn.0258-7998.212431
Author:Kou Yuanbo,Qiu Zeyu,Wang Liang,Huang Jianqiang
Author Affilications:Department of Computer Technology and Applications,Qinghai University,Xining 810016,China
DOI:10.16157/j.issn.0258-7998.212393
Author:Zhong Yali1,Wu Junhui2,Liu Xuan2,Gao Ping1,3,Duan Xiaohui1,4
Author Affilications:1.National Supercomputing Center in Wuxi,Wuxi 214072,China;2.Jiangnan University,Wuxi 214122,China; 3.Shandong University,Jinan 250100,China;4.Tsinghua University,Beijing 100084,China
DOI:10.16157/j.issn.0258-7998.212436
Author:Li Yiyuan1,Mu Qing2,Xue Wei1
Author Affilications:1.Department of Computer Science and Technology,Tsinghua University,Beijing 100084,China; 2.China Electric Power Research Institute,Beijing 100192,China
DOI:10.16157/j.issn.0258-7998.211736
Author:Zeng Yangji,Liu Zihong,Cai Yong,Guo Xingchen,Mo Jinlong
Author Affilications:School of Manufacturing Science and Engineering,Southwest University of Science and Technology,Mianyang 621000,China
DOI:10.16157/j.issn.0258-7998.211795
Author:Wang Hui,Jiang Chaogen
Author Affilications:School of Computer and Artificial Intelligence,Southwest Jiaotong University of China,Chengdu 611756,China
DOI:10.16157/j.issn.0258-7998.211516
Author:Cai Jing,Du Jiachen,Wang Qing,Zhou Hongren
Author Affilications:College of Instrumentation & Electrical Engineering,Jilin University,Changchun 130026,China
DOI:10.16157/j.issn.0258-7998.211716
Author:Zhao Yunan,Pan Junren,Peng Yao,He Jin,Wang Hao,Chang Sheng,Huang Qijun
Author Affilications:School of Physics and Technology,Wuhan University,Wuhan 430072,China
DOI:10.16157/j.issn.0258-7998.211700
Author:Yang Chuwei,Zhang Meijuan,Hou Qingqing
Author Affilications:The 58th Research Institute,CETC,Wuxi 214035,China
DOI:10.16157/j.issn.0258-7998.211472
Author:Qian Yong,Liu Wei
Author Affilications:School of Physics Science and Technology,Wuhan University,Wuhan 430072,China
DOI:10.16157/j.issn.0258-7998.211811
Author:Du Kaixuan1,Jiao Xinquan1,2,Yang Zhiwen1,Li Huijing1
Author Affilications:1.State Key Laboratory of Electronic Tecchnology,North University of China,Taiyuan 030051,China; 2.Key Laboratory of Instrument Science and Dynamic Testing(Ministry of Education), North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.211683
Author:Liu Bin,Shi Wei,Chang Jiawei,Li Zhanfeng
Author Affilications:School of Mechanical Engineering,Jiangsu University of Technology,Changzhou 213000,China
DOI:10.16157/j.issn.0258-7998.211537
Author:Wang Xinyuan1,2,Cheng Peng1,Wu Bin1
Author Affilications:1.Institute of Microelectronics of the Chinese Academy of Sciences,Beijing 100029,China; 2.School of Microelectronics,University of Chinese Academy of Sciences,Beijing 100049,China
DOI:10.16157/j.issn.0258-7998.211518
Author:Shen Jiaqi1,Zhou Guomin2
Author Affilications:1.College of Information Engineering,Zhejiang University of Technology,Hangzhou 310023,China; 2.Department of Computer and Information Security,Zhejiang Police College,Hangzhou 310053,China
DOI:10.16157/j.issn.0258-7998.211404
Author:Chen Wanqin1,Tang Qingshan1,Huang Tao2
Author Affilications:1.School of Physics and Electronic Science,Changsha University of Science and Technology,Changsha 410000,China; 2.No.3303 Factory of PLA,Wuhan 430200,China
DOI:10.16157/j.issn.0258-7998.211522
Author:Ding Zhaohui,Zhang Wei,Yang Guoyu
Author Affilications:China Datang Corporation Science and Technology Research Institute,Beijing 100043,China
DOI:10.16157/j.issn.0258-7998.211420
Author:Tao Yang,Lin Feipeng,Yang Wen,Weng Shan
Author Affilications:School of Communication and Information Engineering,Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.211273
Author:Xu Bin1,2,Zhou Yang1,He Shufen1,Hong Canmei1,Zhou Zhixun3
Author Affilications:1.Diqing Power Supply Bureau,Yunnan Power Grid Co.,Ltd.,Diqing 674400,China; 2.School of Big Data and Intelligent Engineering,Southwest Forestry University,Kunming 650224,China; 3.Yunnan Yundian Tongfang Technology Co.,Ltd.,Kunming 650217,China
DOI:10.16157/j.issn.0258-7998.211864
Author:Zhang Chao,Kong Xiaoyu,Zheng Dandan
Author Affilications:Hebei Taihang Measurement Co.,Ltd.,Shijiazhuang 050000,China
DOI:10.16157/j.issn.0258-7998.212007
Author:Wang Yi
Author Affilications:Southwest China Institute of Electronic Technology,Chengdu 610036,China
DOI:10.16157/j.issn.0258-7998.211907
Author:You Yuejuan,Liu Dexi,Liu Yawei,Shi Lei
Author Affilications:Beijing Institute of Telemetry Technology,Beijing 100094,China
DOI:10.16157/j.issn.0258-7998.212186
Author:Sui Tao,Xing Sirui,Sun Wei,An Xiangdong
Author Affilications:Chang Guang Satellite Technology Co.,Ltd.,Changchun 130000,China
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