DOI:10.16157/j.issn.0258-7998.233897
Author:Gao Ping1,2,Duan Xiaohui2,3,Liu Weiguo2,3,Guo Jiaxu2,Liu Jia1,Wan Wubing1,2, Gan Lin1,2,Yang Guangwen1,2
Author Affilications:1.Department of Computer Science and Technology, Tsinghua University, Beijing 100084, China; 2.National Supercomputing Center in Wuxi, Wuxi 214072, China;3. School of Software, Shandong University, Jinan 250101, China;4.College of Computer Science and Technology, Jilin University, Changchun 130012, China
DOI:10.16157/j.issn.0258-7998.234111
Author:Su Jingfa1,Zhou Wei2,Gao Libin1,Jiang Jinhu1
Author Affilications:1.Institute of Big Data, Fudan University, Shanghai 200082, China; 2.National Parallel Engineering Technology Center, Beijing 100080, China
DOI:10.16157/j.issn.0258-7998.234036
Author:Shi Yucheng,Huang Jianqiang,Bian Haodong,Wu Li,Jia Jinfang,Wang Xiaoying
Author Affilications:Department of Computer Technology and Application,Qinghai University,Xining 810016,China
DOI:10.16157/j.issn.0258-7998.234372
Author:Qiu Zhenbo
Author Affilications:College of Photoelectric Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, China
DOI:10.16157/j.issn.0258-7998.234591
Author:Shi Xingqiang,Qiang Xiaoyan,Gong Kai,Xing Mengfei
Author Affilications:No.58 Research Institute of China Electronics Technology Group Corporation, Wuxi 214035, China
DOI:DOI: 10.16157/j.issn.0258-7998.234698
Author:Wang Lei1,Huang Qing2,3,Shang Weidong1,Chang Yanhui1,Zhang Xiaoxia2,3
Author Affilications:1.Shanxi Tiandi Wangpo Coal Mining Co..Ltd.,Jincheng048016,China;2.Research Institute of Mine Big Data, Chinese Institute of Coal Science, Beijing100000, China;3.Tiandi Science and Technology Co., Ltd., Beijing100000, China
DOI:10.16157/j.issn.0258-7998.223538
Author:Zhang Qi,Bai Xiaoyu
Author Affilications:Purple Mountain Laboratories, Nanjing 211111, China
DOI:10.16157/j.issn.0258-7998.234186
Author:Jia Xuguang1,Xu Song2,Bai Haitong3,Deng Chao1
Author Affilications:1.National Computer System Engineering Research Institute of China, Beijing 100083, China; 2.Intelligence Technology of CEC Co.,Ltd., Beijing 102209, China;3.PLA Army, Beijing 100044, China
DOI:10.16157/j.issn.0258-7998.234636
Author:Wang Quan1, Xing Yanxia2, Fan Wanpeng1, Wang Weibin1, Zhou Jianfeng1, Li Pengyu2
Author Affilications:1. ZTE Corporation, Nanjing 410012, China; 2. China Telecom Corporation Limited Research Institute, Beijing 102209, China
DOI:10.16157/j.issn.0258-7998.223455
Author:Wang Feifei,Sun Ying,Cao Yaping
Author Affilications:China Telecom Corporation Limited Research Institue, Beijing 102209, China
DOI:10.16157/j.issn.0258-7998.233826
Author:Bai Bo,Liu Shun,Dong Peng,Hu Jian
Author Affilications:China Mobile Communications Group Design Institute Co., Ltd. Heilongjiang Branch, Harbin 150000,China
DOI:10.16157/j.issn.0258-7998.234405
Author:Han Dantao,Zhao Yanling,Liu Dan,Zheng Qiuping
Author Affilications:Instrumentation Technology & Economy Institute, Beijing 100055, China
DOI:10.16157/j.issn.0258-7998.234611
Author:Chen Feng1,Tan Jin2,Wang Jie2,Ma Xiaodong2
Author Affilications:1.Chinese People's Liberation Army 63896 Unit, Luoyang 471000, China; 2.The 6th Research Institute of China Electronics Corporation, Beijing 100083, China
DOI:10.16157/j.issn.0258-7998.234174
Author:Liu Yuxuan,Cao Chao
Author Affilications:College of Microelectronics, Shandong University, Jinan 250101, China
DOI:10.16157/j.issn.0258-7998.233808
Author:Liu Jianing,Shan Wei,Liu Jinpeng
Author Affilications:China Electronics Technology Group Corporation 58th Research Institute, Wuxi 214035, China
DOI:10.16157/j.issn.0258-7998.234273
Author:Fang Junjie,Wu Zeyi,Huang Yuxiao,Ren Qingsong,Wang Geng
Author Affilications:School of Software, Shanghai Jiao Tong University, Shanghai 200240, China
DOI:10.16157/j.issn.0258-7998.234079
Author:Wen Feng,Li Qingshuang,Li Huijing
Author Affilications:State Key Laboratory of Electronic Testing Technology,North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.234000
Author:Peng Jiankun1,Bao Juntao1,Hu Shenyang1,Lin Zuojun1,Yu Zihan1,Xiao Chunxian1,2
Author Affilications:1.College of Electric Information and Optical Engineering, Nankai University, Tianjin 300350, China; 2.Tianjin Key Laboratory of Optoelectronic Sensors and Sensor Network Technology, Tianjin 300350, China
DOI:10.16157/j.issn.0258-7998.234341
Author:Ma Tao,Yu Huiqun,Peng Daogang,Sun Haoyi
Author Affilications:School of Automation Engineering,Shanghai University of Electric Power,Shanghai 200090,China
DOI:10.16157/j.issn.0258-7998.234105
Author:Liu Jia1,2,Zhang Hao1,Wang Bo1
Author Affilications:1.School of Information and Communication Engineering, Guilin University of Electronic Technology, Guilin 541004, China; 2.Samsung Research China-Beijing (SRC-B), Beijing 100028,China
DOI:10.16157/j.issn.0258-7998.234117
Author:Xie Hanjun1,Wang Lin2,Wang Qinruo1
Author Affilications:1.School of Automation, Guangdong University of Technology, Guangzhou 510000, China; 2.Guogongxin (Cangzhou) Robot Co., Ltd., Cangzhou 061000, China
DOI:10.16157/j.issn.0258-7998.234108
Author:Jing Junfeng,Kuai Liang,Fang Zhiqi,Liu Kai,Jin Shuyun
Author Affilications:The 6th Research Institute of China Electronics Corporation, Beijing 100083, China
DOI:10.16157/j.issn.0258-7998.223650
Author:Li Shihao,Jiang Runqiu,Mo Shibo
Author Affilications:Chengdu Tianao Measurement and Control Technology Co.,Ltd., Chengdu 611731, China
DOI:10.16157/j.issn.0258-7998.233876
Author:Zhang Fengshan1,Chen Tuo1,Chen Xiaoyan1,Jiang Yang2,Zeng Hao2
Author Affilications:1.Beijing Institute of Satellite Information Engineering, Beijing 100086, China; 2.School of Microelectronics and Communication Engineering, Chongqing University, Chongqing 400044, China
DOI:10.16157/j.issn.0258-7998.234059
Author:Li Chang,Yi Jin,Yuan Jianfu,Ren Ying
Author Affilications:Chang Guang Satellite Technology Co., Ltd., Changchun 130000, China
DOI:10.16157/j.issn.0258-7998.234215
Author:Shan Feng,Zou Jiwei,Liu Shufeng,Zhang Wei,Jia Xu
Author Affilications:Chang Guang Satellite Technology Co.,Ltd.,Changchun 130000,China
DOI:10.16157/j.issn.0258-7998.3669
Author:Li Liang1,2,Dang Lijun1,2,Shi Gesong2,Wang Jiang1,2,Li Suozai1
Author Affilications:1.China Electronics Corporation(Hainan)Joint Innovation Research Institute, Chengmai 571924, China; 2.China Software Information System Engineering Co., Ltd.,Beijing 102209,China
DOI:10.16157/j.issn.0258-7998.223670
Author:Li Bo1,2,Xie Xiaolong1,Cai Renfeng1,Li Liang1,2,Fang Lujie1,2
Author Affilications:1.China Electronics Corporation(Hainan)Joint Innovation Research Institute, Chengmai 571924, China; 2.China Software Information System Engineering Co., Ltd.,Beijing 102209,China
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