DOI:10.16157/j.issn.0258-7998.245364
Author:Shi Linan1,2,Han Naiping1,Qi Xuan1,Liu Yijun3
Author Affilications:1.KylinSoft Corporation;2.Tianjin Key Laboratory of Operating System; 3.International Politics Department, University of International Relations
DOI:10.16157/j.issn.0258-7998.245083
Author:Huang Chaoxuan1,2,Li Xiankun1,Wei Jinghe1,2
Author Affilications:1.The 58th Research Institute of China Electronics Technology Group; 2.National Key Laboratory for Integrated Circuits and Microsystems
DOI:10.16157/j.issn.0258-7998.245084
Author:Chen Sanwei,Li Jincai,Zhang Ting,Qiu Dan,Jiang Lin
Author Affilications:No.58 Research Institute of China Electronics Technology Group Corporation
DOI:10.16157/j.issn.0258-7998.245067
Author:Liang Hao,Yu Xiaoping,Chen Shijin
Author Affilications:Wuxi i-CORE Electronics Co., Ltd.
DOI:10.16157/j.issn.0258-7998.244897
Author:Ying Kewei
Author Affilications:Lumissil Microsystems (Xiamen) Limited
DOI:10.16157/j.issn.0258-7998.245157
Author:Liu Chenxu,Huang Chuanhu,Ma Da,Lin Hao
Author Affilications:Intelligence Technology of CEC Co., Ltd.
DOI:10.16157/j.issn.0258-7998.245149
Author:Fang Sicong1,2,Hou Jiawei1,Dai Hao1,2,Qi Wei1,2,Huang Shanglong1
Author Affilications:1.China Nuclear Power Operation Technology Co., Ltd.; 2.CNNC Key Laboratory on Nuclear Industry Simulation
DOI:10.16157/j.issn.0258-7998.245170
Author:Liu Hao,Lin Min,Zheng Liyin,Yu Ze
Author Affilications:School of Communication and Information Engineering, Shanghai University
DOI:10.16157/j.issn.0258-7998.245382
Author:Tang Donglai1,Tian Fuqiang1,He Peng2,Gu Bo1,Tian Pan1,Li Jun1,Ruan Zhengping1
Author Affilications:1.Aostar Information Technology Co., Ltd.; 2.College of Communication and Information Engineering, Chongqing University of Posts and Telecommunications
DOI:10.16157/j.issn.0258-7998.245408
Author:Yu Xinru,Su Shujing,Cai Lei
Author Affilications:State Key Laboratory of Dynamic Measurement Technology, School of Instrumentation and Electronics, North University of China
DOI:10.16157/j.issn.0258-7998.245019
Author:An Ning,Xu Wenjing,Liu Zhuhui,Qin Wenyuan
Author Affilications:SASAC Education and Training System
DOI:10.16157/j.issn.0258-7998.245003
Author:Feng Yingchun1,Tao Li2,3,Liu Dunnan2,Fan Jie1,Gao Bo1,Liu Xuwen1
Author Affilications:1.Jiangsu Electric Power Trading Center Co., Ltd.; 2.North China Electric Power University, China; 3.Beijing Kedong Electric Power Control System Co., Ltd.
DOI:10.16157/j.issn.0258-7998.245136
Author:He Zhaorong,Guo Jian,Xu Qi,Han Rui
Author Affilications:School of Automation, Nanjing University of Science and Technology
DOI:10.16157/j.issn.0258-7998.245310
Author:Yang Yuanjin1,He Gang2,Ruan Zhicheng1
Author Affilications:1.China Electronics Cyberspace Great Wall Co.; 2.China Electronics Computing Power (Ningxia) Co.
DOI:10.16157/j.issn.0258-7998.245153
Author:Nan Yuhao,Zhou Chongxi,Yu Jianding
Author Affilications:Faculty of Electrical Engineering and Computer Sciences,Ningbo University
DOI:10.16157/j.issn.0258-7998.245379
Author:Zhang Hui,Yang Zhaofeng,Zhang Xingang,Wang Qi,Xue Pei
Author Affilications:Wuxi Hope Microelectronics Co., Ltd.
DOI:10.16157/j.issn.0258-7998.245035
Author:Shen Wei,Liu Shiyu,Yang Guang,Li Dongfang
Author Affilications:Institute 706, Second Academy of CASIC
DOI:10.16157/j.issn.0258-7998.245103
Author:Yu Jigang,Fu Chao
Author Affilications:No.58 Research Institute, China Electronics Technology Group Corporation
DOI:10.16157/j.issn.0258-7998.245160
Author:Zhang Heng,Wang Qi,Yu Wenjun
Author Affilications:The 58th Research Institute of China Electronics Technology Group
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