DOI:10.16157/j.issn.0258-7998.2016.01.001
Author:Li Zhigang,Mei Shuang,Wang Shaojie,Yao Fang
Author Affilications:School of Electrical Engineering,Hebei University of Technology,Tianjin 300130,China
DOI:10.16157/j.issn.0258-7998.2016.01.002
Author:Li Hao,Su Xiuhong
Author Affilications:Institute of Systems Engineering,China Academy of Engineering Physics,Mianyang 621900,China
DOI:10.16157/j.issn.0258-7998.2016.01.003
Author:Zhou Jiajia,Li Tao,Huang Xiaokang
Author Affilications:School of Electronic Engineering,Xi′an University of Posts & Telecommunications,Xi′an 710121,China
DOI:10.16157/j.issn.0258-7998.2016.01.004
Author:Wang Shaoqing,Ye Chunhui,Hu Yangcong
Author Affilications:SI-EN Technology Xiamen Ltd.,Xiamen 361005,China
DOI:10.16157/j.issn.0258-7998.2016.01.005
Author:Lu Xiao1,Cong Mifang2,Ren Jianwei2,Jin Long1,Du Huan2
Author Affilications:1.Research Institute of Electronic Science and Technology of UESTC,,Chengdu 611731,China; 2.Micro-electronics Research Institute,CAS,Beijing 100029,China
DOI:10.16157/j.issn.0258-7998.2016.01.006
Author:Tong Jiaoye,Li Rongkuan,He Guojun
Author Affilications:School of Electronic Engineering,University of Electronic Science and Technology of China,Chengdu 611730,China
DOI:10.16157/j.issn.0258-7998.2016.01.007
Author:Zhu Shengxiang,He Zhiyi
Author Affilications:Beijing Institute of Remote Sensing Equipment,Beijing 100854,China
DOI:10.16157/j.issn.0258-7998.2016.01.008
Author:Yan Wenchao1,2,Zou Chao2,Zhang Zhiwei1,Wen Jianhong2,Tie Changjun2,Huo Huixin2
Author Affilications:1.Dapartment of Information and Communication Engineering, North University of China,Taiyuan 030051,China; 2.Shenzhen Institutes of Advanced Technology,Chinese Academy Sciences,Shenzhen 518055,China
DOI:10.16157/j.issn.0258-7998.2016.01.009
Author:Zhang Qiang,Feng Yangsong,Guo Peng
Author Affilications:Avic Leihua Electronic Technology Research Institute,Wuxi 214063,China
DOI:10.16157/j.issn.0258-7998.2016.01.010
Author:Li Hui,Wang Yihuai,Wang Lei
Author Affilications:School of Computer Science and Technology,Soochow University,Suzhou 215000,China
DOI:10.16157/j.issn.0258-7998.2016.01.011
Author:Cheng Guiliang1,He Tao1,Zhao Changcai2
Author Affilications:1.Key Laboratory of Opto-Technology and Intelligent Control Ministry of Education, Lanzhou Jiaotong University,Lanzhou 730070,China; 2.School of Electronic and Information Engineering,Lanzhou Jiaotong University,Lanzhou 730070,China
DOI:10.16157/j.issn.0258-7998.2016.01.012
Author:Zhang Yujie,Chen Zhilei
Author Affilications:College of Electrical and Information Engineering,Shanxi University of Science and Technology,Xi′an 710021,China
DOI:10.16157/j.issn.0258-7998.2016.01.013
Author:Wang Chenhui,Wu Yue,Yang Kai
Author Affilications:Center for Hydrogeology and Environmental Geology Survey,CGS,Baoding 071051,China
DOI:10.16157/j.issn.0258-7998.2016.01.014
Author:Liu Tao,Lv Yong,Liu Lishuang
Author Affilications:School of Instrument Science and Optoelectronic Engineering, Beijing Information Science & Technology University,Beijing 100192,China
DOI:10.16157/j.issn.0258-7998.2016.01.015
Author:He Chaowen,Zhang Zhizhong,Lin Lin,Wang Tao
Author Affilications:School of Biomedical Engineering,Southern Medical University,Guangzhou 510515,China
DOI:10.16157/j.issn.0258-7998.2016.01.016
Author:Song Zhenpeng,Meng Xiangyin,Xu Xinkai,Gu Cuijun
Author Affilications:School of Mechanical Engineering, Southwest Jiaotong University, Chengdu, 610031
DOI:10.16157/j.issn.0258-7998.2016.01.017
Author:Li Jianyong1,Li Yang2,Liu Xuemei1
Author Affilications:1.Ming De College,Northwestern Polytechnical University,Xi′an 710124,China; 2.Hangzhou Wahaha Group Company Limited,Hangzhou 310020,China
DOI:10.16157/j.issn.0258-7998.2016.01.018
Author:Zhao Rongrong,Li Hongyan,Cao Meng
Author Affilications:College of Information Engineering,Taiyuan University of Technology,Jinzhong 030600,China
DOI:10.16157/j.issn.0258-7998.2016.01.019
Author:Luo Yijun1,Lu Dongdong1,Li Qin2
Author Affilications:1.Department of Electronic Information,Wuhan University,Wuhan 430072,China; 2.School of Electronic Engineering,Wuhan University,Wuhan 430072,China
DOI:10.16157/j.issn.0258-7998.2016.01.020
Author:Zhang Xiaoyu1,2,Tang Weisheng1,2,Zhang Wei1,Tong Zilei1
Author Affilications:1.Satety and Emergency Laboratory,Shanghai Advanced Research Institute,Chinese Academic of Science,Shanghai 201210,China; 2.University of Chinese Academic of Science,Beijing 100049,China
DOI:10.16157/j.issn.0258-7998.2016.01.021
Author:Wang Jianfeng,Yang Rong
Author Affilications:College of Computer Science and Technology,Hubei University of Science and Technology,Xianning 437100,China
DOI:10.16157/j.issn.0258-7998.2016.01.022
Author:Liu Qinghua1,2,Yi Xiaodong1,2
Author Affilications:1.Guangxi Experiment Center of Information Science, Guilin University of Electronic Technology, Guilin 541004,China; 2.School of Communication and Information, Guilin University of Electronic Technology, Guilin 541004,China
DOI:10.16157/j.issn.0258-7998.2016.01.023
Author:Sun Minhong,Yan Yunzhen,Shao Zhangyi,Qin Yuan,Guo Hongchen
Author Affilications:School of Communication Engineering,Hangzhou Dianzi University,Hangzhou 310018,China
DOI:10.16157/j.issn.0258-7998.2016.01.024
Author:Zhu Jiang,Chen Hongcui,Xiong Jiahao
Author Affilications:College of Information and Communication Engineering,Chongqing University of Post and Telecommunication,Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.2016.01.025
Author:Liu Yanyan1,Lu Yang1,3,Tang Jun2,3
Author Affilications:1.School of Computer and Information,Hefei University of Technology,Hefei 230009,China; 2.Hefei GOCOM Information &Technology Co.,LTD.,Hefei 230088,China; 3.The Anhui Provincial Key Laboratory of Mine IOT and Mine Safety Supervisory Control,Hefei 230088,China
DOI:10.16157/j.issn.0258-7998.2016.01.026
Author:Yang Haiyue1,Zhu Yuting1,Shi Huaji1,Xu Hui2
Author Affilications:1.School of Computer Science and Telecommunication Engineering,Jiangsu University,Zhenjiang 212013,China; 2.Daquan Group Company,Yangzhong 212211,China
DOI:10.16157/j.issn.0258-7998.2016.01.027
Author:Ling Mu,Yuan Haiwen
Author Affilications:School of Automation Science and Electrical Engineering,Beihang University,Beijing 100191,China
DOI:10.16157/j.issn.0258-7998.2016.01.028
Author:Yan Mengting1,2,An Junshe1,Gong Quanming1,2
Author Affilications:1.Center for Space Science and Applied Research,Chinese Academy of Science,Beijing 100190,China; 2.University of Chinese Academy Sciences,Beijing 100190,China
DOI:10.16157/j.issn.0258-7998.2016.01.030
Author:Song Tie,Zhou Lin,Cao Ting
Author Affilications:School of Electronic Information,Wuhan University,Wuhan 430072,China
DOI:10.16157/j.issn.0258-7998.2016.01.029
Author:Duan Jianmin,Shi Hui,Zhan Yuchen
Author Affilications:Beijing University of Technology,Institute of Urban Traffic,Beijing 100124,China
DOI:10.16157/j.issn.0258-7998.2016.01.031
Author:Lin Xiaofeng,Wang Zhihao,Song Shaojian
Author Affilications:School of Electrical Engineering,Guangxi University,Nanning 530004,China
DOI:10.16157/j.issn.0258-7998.2016.01.032
Author:Zhang Tianyu,Zhang Ruicheng,Geng Xiaohong,Lv Meng,Li Zhiquan
Author Affilications:College of Electrical Engineering,North China University of Science and Technology,Tangshan 063009,China
DOI:10.16157/j.issn.0258-7998.2016.01.033
Author:Xie Zhiyuan,Bi Tingting,Li Yakang,Nie Shengyang
Author Affilications:Department of Electronic and Communication Engineering,North China Electric Power University,Baoding 071003,China
DOI:10.16157/j.issn.0258-7998.2016.01.034
Author:He Junru1,Wang Hongcheng2,Yang Xinrong1
Author Affilications:1.School of Mechatronic Engineering,Southwest Petroleum University,Chengdu 610500,China; 2.School of Electrical Information,Southwest Petroleum University,Chengdu 610500,China
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Key Technologies of 5G-A and 6G
Key Technologies of 5G and Its Evolution
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Antenna Technology and Its Applications
5G Vertical Industry Application
Microelectronics in Medical and Healthcare
Application of Edge Computing in IIoT
Deep Learning and Image Recognization
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Signal and Information Processing
Internet of Things and the Industrial Big Data
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2016 IEEE International Conference on Integrated Circuits and Microsystems
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