DOI:10.16157/j.issn.0258-7998.2016.02.001
Author:Li Song,Chu Tingbin,Yuan Zhengxi
Author Affilications:School of Communication and Information Engineering,University of Electronic Science and Technology of China,Chengdu 611731,China
DOI:10.16157/j.issn.0258-7998.2016.02.002
Author:Gao Weilin,Cao Feng,Guo Chao
Author Affilications:Suzhou Changfeng Avionics Co.ltd,Suzhou 215151,China
DOI:10.16157/j.issn.0258-7998.2016.02.003
Author:He Jiang1,Pu Yuliang1,Li Haibo2,Yan Bo1
Author Affilications:1.University of Electronic Science and Technology of China,Chengdu 610036,China; 2.Guangdong Provincial Public Security Bureau,Guangzhou 510050,China
DOI:10.16157/j.issn.0258-7998.2016.02.004
Author:Yilihamu·Yaermaimaiti
Author Affilications:College of Electncian Engineering,Xinjiang University,Urumqi 830047,China
DOI:10.16157/j.issn.0258-7998.2016.02.005
Author:Liu Qiaoshou,Huang Guochen,Ji Fusheng
Author Affilications:Optical Communication and Network Key Laboratory,Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.2016.02.006
Author:Li Zhigang,Zhang Yaling,Mei Shuang
Author Affilications:School of Electrical Engineering,Hebei University of Technology,Tianjin 300130,China
DOI:10.16157/j.issn.0258-7998.2016.02.007
Author:Sun Ye1,2,Yi Kechu1,Xiang Xin2,Wang Feng1,2
Author Affilications:1.State Key Lab. of Integrated Service Networks,Xidian University,Xi′an 710071,China; 2.College of Aeronautics and Astronautics Engineering,Air Force Engineering University,Xi′an 710038,China
DOI:10.16157/j.issn.0258-7998.2016.02.008
Author:Zhang Leiming,Liu Bo,Zhang Jincan
Author Affilications:Electrical Engineering College,Henan University of Science and Technology,Luoyang 471023,China
DOI:10.16157/j.issn.0258-7998.2016.02.009
Author:Di Shiwei,Liu Yu,Li Zhiqiang,Zhang Haiying
Author Affilications:Beijing Key Laboratory of Radio Frequency IC Technology for Next Generation Communications, Institute of Microelectronics of Chinese Academy of Sciences,Beijing 100029,China
DOI:10.16157/j.issn.0258-7998.2016.02.010
Author:Xu Huachao,Lin Changlong,Liang Ke,Wang Jin,Li Guofeng
Author Affilications:IC Design and System Integration Laboratory,Nankai University,Tianjin 300071,China
DOI:10.16157/j.issn.0258-7998.2016.02.011
Author:Qie Jianwen,Jia Fangxiu,Lu Pengwei
Author Affilications:Ministerial Key Laboratory of Intelligent Ammunition,Nanjing University of Science and Technology,Nanjing 210094,China
DOI:10.16157/j.issn.0258-7998.2016.02.012
Author:Wen Limin,Ju Yongfeng,Zhu Xu,Lei Xu
Author Affilications:School of Electronic and Control Engineering, Chang′an University,Xi′an 710064,China
DOI:10.16157/j.issn.0258-7998.2016.02.013
Author:Chen Juan1,2,Li Yuan1,Li Wanguo1
Author Affilications:1.School of Mechanical Engineer and Automation,Beijing University of Aeronautics and Astronautics,Beijing 100083,China; 2.Science and Technology on Aerospace Intelligent Control Laboratory,Beijing 100854,China
DOI:10.16157/j.issn.0258-7998.2016.02.014
Author:Li Jianan,Xie Xuesong,Zhang Xiaoling,Chen Jun,Ha Yue
Author Affilications:College of Electronic Information and Control Engineering,Beijing University of Technology,Beijing 100124,China
DOI:10.16157/j.issn.0258-7998.2016.02.015
Author:Chen Tengjiao1,Liu Yaqin1,Ye Linfeng2,Yang Feng1
Author Affilications:1.School of Biomedical Engineering,Southern Medical University,Guangzhou 510515,China; 2.School of Computer Science,Guangdong University of Technology,Guangzhou 510006,China
DOI:10.16157/j.issn.0258-7998.2016.02.016
Author:Xu Fujing1,2,Ma Tiehua1,2,Li Xin′e1,2
Author Affilications:1.Key Laboratory for Instrumentation Science & Dynamic Measurement,Minstry of Education, North University of China,Taiyuan 030051,China; 2.National Key Laboratory for Electronic Measurement Technology,North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.2016.02.017
Author:Xu Ping,Sha Congshu,Zhao Fangjie
Author Affilications:College of Civil Engineering,Henan University of Engineering,Zhengzhou 451191,China
DOI:10.16157/j.issn.0258-7998.2016.02.018
Author:Bian Nan,Ma Cong
Author Affilications:School of Automation,Tianjin University of Technology,Tianjin 300384,China
DOI:10.16157/j.issn.0258-7998.2016.02.019
Author:Li Guangzhi1,2,3,Zhou Zhuoyun3,Xie Yubo3,Fan Xinnan1,2,3,Zhang Xuewu3
Author Affilications:1.Jiangsu Provincial Collaborative Innovation Center of World Water Valley and Water Ecological Civilization,Nanjing 211100,China; 2.Jiangsu Key Laboratory of Power Transmission and Distribution Equipment Technology,Hohai University,Changzhou 213022,China; 3.College of Internet of Things Engineering,Hohai University,Changzhou 213022,China
DOI:10.16157/j.issn.0258-7998.2016.02.020
Author:Lv Haidong1,Lu Yonglin2
Author Affilications:1.City Institute,Dalian University of Technology,Dalian 116600,China;2.Dalian Linktimes Co.Ltd,Dalian 116600,China
DOI:10.16157/j.issn.0258-7998.2016.02.021
Author:Lin Yun,Lei Yang,Zeng Junjun
Author Affilications:Chongqing Key Lab of Mobile Communication Technology,Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.2016.02.022
Author:Yuan Meijuan,Jiang Yunru,Shi Zhenfeng,Sun Honglei,Bao Yumeng,Cai Yuqi
Author Affilications:School of Electronic and Optical Engineering,NJUST,Nanjing 210094,China
DOI:10.16157/j.issn.0258-7998.2016.02.023
Author:Fan Xiaohe1,2,Wang Jiao1,2,Du Liangliang1
Author Affilications:1.School of Electrical Engineering and Automation,Guilin University of Electronic Technology,Guilin 541004,China; 2.Research Center of Information Security,China Electronics Standardization Institute,Beijing 10007,China
DOI:10.16157/j.issn.0258-7998.2016.02.024
Author:Zhang Binglong1,Xu Jianmin1,Jiang Hao2
Author Affilications:1.No.36 Research Institute of CETC,Jiaxing 314033,China; 2.School of Information Science and Engineering,Southeast University,Nanjing 211189,China
DOI:10.16157/j.issn.0258-7998.2016.02.025
Author:Deng Kang1,Zhang Shengli1,Dai Mingjun1,Ding Fan2,Wang Hui1
Author Affilications:1.College of Information Engineering,Shenzhen University,Shenzhen 518000,China; 2.School of Physics and Mechanical & Electrical Engineering,Shaoguan College,Shaoguan 512005,China
DOI:10.16157/j.issn.0258-7998.2016.02.026
Author:Yu Bei,Shao Kai,Zhuang Ling,Wang Guangyu
Author Affilications:Chongqing Key Lab of Mobile Communications,Chongqing University of Posts and Telecommunications,Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.2016.02.027
Author:Li Yuqian,Su Guangda
Author Affilications:Department of Electronic Engineering,Tsinghua University,Beijing 10084,China
DOI:10.16157/j.issn.0258-7998.2016.02.028
Author:Wang Jun1,2,Ni Xueli1,Cheng Yong2
Author Affilications:1.College of Computer & Software,Nanjing University of Information Science & Technology,Nanjing 210044,China; 2.Network Information Center,Nanjing University of Information Science & Technology,Nanjing 210044,China
DOI:10.16157/j.issn.0258-7998.2016.02.029
Author:Cheng Junhui,Huang Yourui,Tang Chaoli,Chen Zhenping,Zhang Chaochao
Author Affilications:College of Electrical and Information Engineering,An Hui University of Science and Technology,Huainan 232001,China
DOI:10.16157/j.issn.0258-7998.2016.02.030
Author:Zhang Yingchao1,2,3,Xiao Yin1,Deng Hua2,Wang Lu1
Author Affilications:1.School of Information and Control, Nanjing University of Information Science and Technology,Nanjing 210044,China; 2.Collaborative Innovation Center on Forecast and Evaluation of Meteorological Disasters, Nanjing University of Information Science & Technology,Nanjing 210044,China; 3.Jiangsu Key Laboratory of Big Data Analysis Technology,Nanjing 210044,China
DOI:10.16157/j.issn.0258-7998.2016.02.031
Author:Wang Xiaoting,Wang Yiwen,Li Ping
Author Affilications:School of Microelectronics and Solid-State Electronics, State Key Laboratory of Electronic Thin Films and Integrated Devices,Chengdu 610054,China
DOI:10.16157/j.issn.0258-7998.2016.02.032
Author:Shao Zhulei
Author Affilications:School of Electrical Engineering,Xuchang University,Xuchang 461000,China
DOI:10.16157/j.issn.0258-7998.2016.02.034
Author:Xia Dongsheng,Ma Hongzhong,Wang Xingxing,Shi Xunshan
Author Affilications:College of Energy and Electrical Engineering,Hohai University,Nanjing 211100,China
DOI:10.16157/j.issn.0258-7998.2016.02.035
Author:Wang Tong1,Ma Huancheng1,Shi Pingping2,Lin Xiaohuan1,Guo Danrui1
Author Affilications:1.Electronics and Information College,Xi′an Polytechnic University,Xi′an 710048,China; 2.Department of Mechanical and Electrical Engineering,Zhumadian Agriculture School,Zhumadian 463002,China
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