DOI:10.16157/j.issn.0258-7998.172215
Author:Zhang Fahua,Shu Lin,Xing Xiaofen
Author Affilications:School of Electronics and Information,South China University of Technology,Guangzhou 510641,China
DOI:10.16157/j.issn.0258-7998.171958
Author:Lin Xin
Author Affilications:School of Information and Electron,Beijing Institute of Technology,Beijing 100089,China
DOI:10.16157/j.issn.0258-7998.174416
Author:Liu Miao
Author Affilications:Cadence System Design Inc.,Shanghai 201204,China
DOI:10.16157/j.issn.0258-7998.172005
Author:Liu Yan,Zhou Shengze,Luo Jun,Wang Xiaoqiang,Luo Hongwei
Author Affilications:China Electronic Product Reliability and Environmental Testing Research Institute,Guangzhou 510610,China
DOI:10.16157/j.issn.0258-7998.171981
Author:Yang Fang,Fu Weiting,Qin Tiankai,Gao Qingyun
Author Affilications:College of Electronic Information and Optical Engineering, Nankai University, Tianjin 300350, China
DOI:10.16157/j.issn.0258-7998.172154
Author:Wang Peng1,You Ran2,Liu Xuhong2,Fan Yuyang1,Tian Yi1
Author Affilications:1.Tianjin Key Laboratory for Civil Aircraft Airworthiness and Maintenance,Civil Aircraft Airworthiness Certification Technology and Management Research Center,Civil Aviation University of China,Tianjin 300300,China; 2.Airworthiness College,Civil Aviation University of China,Tianjin 300300,China
DOI:10.16157/j.issn.0258-7998.171974
Author:Kang Kai,Yan Yuanhai,Hu Zemin,Shi Hongsheng
Author Affilications:National Active Distribution Network Technology Research Center,Beijing Jiaotong University,Beijing 100044,China
DOI:10.16157/j.issn.0258-7998.172168
Author:Chen Dehai,Ren Yongchang,Hua Ming,Huang Yanguo
Author Affilications:School of Electrical Engineering and Automation,Jiangxi University of Science and Technology,Ganzhou 341000,China
DOI:10.16157/j.issn.0258-7998.172276
Author:Ding Wei,Wang Yihuai,Jia Rongyuan
Author Affilications:School of Computer and Technology,Soochow University,Suzhou 215000,China
DOI:10.16157/j.issn.0258-7998.171444
Author:Chen Zhangjin1,2,Chen Xudong1,Jiang Pengcheng1,Wang Wenlei1,Li Hanchao1
Author Affilications:1.Microelectronic Research and Development Center,Shanghai University,Shanghai 200072,China; 2.Computer Center,Shanghai University,Shanghai 200444,China
DOI:10.16157/j.issn.0258-7998.171702
Author:Zhang Yihao,Sun Dongmei,Shen Yucheng,Zeng Li
Author Affilications:School of Electrical Engineering and Control Science,Nanjing Tech University,Nanjing 211816,China
DOI:10.16157/j.issn.0258-7998.171683
Author:Xiang Zihao,Lu Anjiang
Author Affilications:College of Big Data and Information Engineering,Guizhou University,Guiyang 550025,China
DOI:10.16157/j.issn.0258-7998.172576
Author:Tang Tao1,2,Deng Yongjun3,Ye Huarong3,Li Ya2,Li Wenhua2,Wang Pengjun1,2,Deng Beixing2
Author Affilications:1.Department of Electronic Engineering,Tsinghua University,Beijing 100084,China; 2.Smartbow Information Technology Co.,Ltd.,Beijing 100085,China; 3.Bureau of Communications and Transportation,Luzhou 646000,China
DOI:10.16157/j.issn.0258-7998.172015
Author:Yang Sansan1,Jia Yudong1,Zhang Xiaoqing1,Yang Bo2
Author Affilications:1.Beijing Key Laboratory for Opto-Electronic Measurement Technology,Beijing Information Science and Technology University, Beijing 100192,China; 2.College of Electronic Science and Engineering,National University of Defense Technology,Changsha 410073,China
DOI:10.16157/j.issn.0258-7998.172507
Author:Yang Yang1,2
Author Affilications:1.Hebei Instrument & Meter Industry Technology Research Institute,Chengde 067000,China; 2.Hebei Instrument & Meter Engineering Technology Research Center,Chengde 067000,China
DOI:10.16157/j.issn.0258-7998.171954
Author:Han Wenge,Su Shujing,Xue Yanjie
Author Affilications:National Key Laboratory of the Electronic Measurement Technology,North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.174207
Author:Su Chang1,Gong Gangjun1,Luo Anqin1,Xiong Shengduo1,Liu Ren2
Author Affilications:1.Beijing Power System Information Security Engineering Technology Research Center in Energy Industry, North China Electric Power University,Beijing 102206,China; 2.Beijing Excellent Network Security Technology Corp.,Ltd,Beijing 102206,China
DOI:10.16157/j.issn.0258-7998.179021
Author:Nan Yang1,2,Feng Dajun2,Zhao Dezheng2,Wang Hao2
Author Affilications:1.School of Telecommunication Engineering,Xidian University,Xi′an 710071,China; 2.National Computer System Engineering Research Institute of China,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.172691
Author:Li Jing,Han Yifei,Cui Jin,Liu Wei,Yang Xiaohua
Author Affilications:Beijing Microelectronics Technology Institute,Beijing 100076,China
DOI:10.16157/j.issn.0258-7998.171328
Author:Zhao Xiaoteng1,2,Yin Junjian1,Zhang Jintao1,2,Li Zhongmao1,Leng Yongqing1
Author Affilications:1.Institute of Microelectronic of Chinese Academy of Sciences,Beijing 100029,China; 2.University of Chinese Academy of Sciences,Beijing 100049,China
DOI:10.16157/j.issn.0258-7998.170987
Author:Li Xiaowen,Li Xinmei,Wang Xiaojuan
Author Affilications:Chongqing Key Lab of Mobile Communications Protocol,Chongqing University of Posts and Telecommunications(CQUPT), Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.179022
Author:Zhang Wan1,Zhang Hua2,Guo Xiaowang1,Huo Yuxian1,Zhang Xiaoli1
Author Affilications:1.North China Institute of Computer Systems Engineering,Beijing 100083,China; 2.Beijing Aerospace Control Center,Beijing 102206,China
DOI:10.16157/j.issn.0258-7998.171412
Author:Yu Xiebin,Song Yaoliang,Fan Shicheng
Author Affilications:School of Electronic and Optical Engineering,Nanjing University of Science and Technology,Nanjing 210094,China
DOI:10.16157/j.issn.0258-7998.170899
Author:Tian Zengshan,Xu Jian,Li Weiguang
Author Affilications:Chongqing Key Lab of Mobile Communications Technology,Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.171827
Author:Wu Yan1,Deng Kaile1,Wang Daiqiang2
Author Affilications:1.Institute of Big Data and Information Engineering,Guizhou University,Guiyang 550025,China; 2.Guizhou Minzu University,Guiyang 550025,China
DOI:10.16157/j.issn.0258-7998.171487
Author:Zhao Feng1,He Yi1,Zou Chuanyun1,Jia Xiaolin2
Author Affilications:1.School of Information Engineering,Southwest University of Technology and Science,Mianyang 621010,China; 2.School of Computer Science and Technology,Southwest University of Technology and Science,Mianyang 621010,China
DOI:10.16157/j.issn.0258-7998.171345
Author:Zeng Jiajia,Su Zhong,Li Qing
Author Affilications:Beijing Key Laboratory of High Dynamic Navigation Technology, Beijing Information Science and Technology University,Beijing 100101,China
DOI:10.16157/j.issn.0258-7998.171157
Author:Wang Xiangshi1,Wang Qi2
Author Affilications:1.Wuxi Technology Institute,Wuxi 214121,China; 2.Shenzhen Aite Intelligent Technology Company Limited,Shenzhen 518007,China
DOI:10.16157/j.issn.0258-7998.170141
Author:Zhao Jiankun,Zhang Dasong,Hu Ailan,Li Jianhong
Author Affilications:National Computer System Engineering Research Institute of China,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.170160
Author:Niu Xiangzhou,Zhang Minqing,Ke Yan
Author Affilications:Key Laboratory of Network & Information Security under the Chinese Armed Police Force, Electronic Department,Engineering College of the Armed Police Force,Xi′an 710086,China
DOI:10.16157/j.issn.0258-7998.170625
Author:Wang Yanpeng
Author Affilications:Jiangsu Automation Research Institute, Lianyungang 222061, China
DOI:10.16157/j.issn.0258-7998.171489
Author:Wang Shengli,Wu Yunfeng,Zhang Chenyu,Hu Boyang,Tang Yuanhong
Author Affilications:School of Energy Science and Engineering,University of Electronic Science and Technology of China,Chengdu 611731,China
DOI:10.16157/j.issn.0258-7998.170926
Author:Feng Fei1,Wu Fangsheng1,Chen Jianfu2,Wang Weishan2
Author Affilications:1.Changzhou Vocational Institute of Engineering,Changzhou 213000,China; 2.Jiangsu University of Technology,Changzhou 213000,China
DOI:10.16157/j.issn.0258-7998.170490
Author:Duan Mingliang,Rong Weiqing,Meng Yanjing
Author Affilications:School of Electrical and Information Engineering,Shaanxi University of Science&Technology,Xi′an 710021,China
DOI:10.16157/j.issn.0258-7998.170829
Author:Liang Dongwei,Li Guolin
Author Affilications:Department of Electronic Engineering, Tsinghua University,Beijing 100084,China
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