DOI:10.16157/j.issn.0258-7998.173812
Author:Chen Fatang,Liu Yifan,Tang Cheng
Author Affilications:Chongqing Key Lab of Mobile Communication Technology,The Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.173805
Author:Wang Chang1,Sun Fuming1,Li Yang2
Author Affilications:1.School of Electronic and Information Engineering,University of Liaoning University of Technology,Jinzhou 121001,China; 2.Dalian Cloud Force Technologies CO.LTD,Dalian 116000,China
DOI:10.16157/j.issn.0258-7998.173936
Author:Xing Ningzhe
Author Affilications:State Grid Jibei Electric Power Company Branch of Information and Communication,Beijing 100053,China
DOI:10.16157/j.issn.0258-7998.173409
Author:Wang Lei1,Zhang Cuixia2
Author Affilications:1.School of Automation,Beijing Union University,Beijng 100101,China; 2.Beijing Union University Integrated Experimental Teaching Demonstration Center,Beijng 100101,China
DOI:10.16157/j.issn.0258-7998.173985
Author:Fang Fang1,Tian Shiming2,Bu Fanpeng2,Su Yun3
Author Affilications:1.State Grid Beijing Changping Electric Power Supply Company,Beijing 102200,China; 2.China Electric Power Research Institute,Beijing 100192,China;3.Shanghai Electric Power Company,Shanghai 200437,China
DOI:10.16157/j.issn.0258-7998.171931
Author:Liu Qinglong1,2,Dong Jiashan2
Author Affilications:1.School of Electronic and Information Engineering,South China University of Technology,Guangzhou 510640,China; 2.Guangzhou Haige Communications Group Incorporated Company,Guangzhou 510663,China
DOI:10.16157/j.issn.0258-7998.171962
Author:Liu Zhiqiang,Xu Jinfu,Dai Qiang,Li Junwei
Author Affilications:The PLA Information Engineering University,Zhengzhou 450001,China
DOI:10.16157/j.issn.0258-7998.166586
Author:Liu Xiaohui, Liu Kecheng
Author Affilications:Information Construction and Management Center,Nanyang Institute of Technology,Nanyang 473004,China
DOI:10.16157/j.issn.0258-7998.171805
Author:Gao Hua,Li Hui
Author Affilications:School of Information Science and Technology,University of Science and Technology of China,Hefei 230026,China
DOI:10.16157/j.issn.0258-7998.171740
Author:Su Yijun1,Ma Kui1,2,Hu Rui3,Yang Fashun1,2
Author Affilications:1.Department of electronics,Guizhou University,Guiyang 550025,China; 2.Engineering Research Center of the Reliability of Semiconductor Power Device of Ministry of Education,Guiyang 550025,China; 3.Guizhou Zhenhua Feng Gang Semiconductor Co.Ltd.,Guiyang 550018,China
DOI:10.16157/j.issn.0258-7998.171801
Author:Li Dongya1,Huang Haisheng1,Li Xin1,Cao Xinliang2,Yin Qiang1
Author Affilications:1.School of Electronic Engineering,Xi′an University of Posts and Telecommunications,Xi′an 710121,China; 2.School of Physics and Electronic Information,Yan′an University,Yan′an 716000,China
DOI:10.16157/j.issn.0258-7998.170943
Author:Liu Yibing,Li Rongkuan
Author Affilications:School of Electronic Engineering,University of Electronic Science and Technology,Chengdu 611730,China
DOI:10.16157/j.issn.0258-7998.171128
Author:Li Chong1,Xu Wujun1,2,Fan Hong1,2
Author Affilications:1.College of Information Science and Technology,Donghua University,Shanghai 201620,China; 2.Engineering Research Center of Digitized Textile & Fashion Technology,Ministry of Education,Shanghai 201620,China
DOI:10.16157/j.issn.0258-7998.171051
Author:Fu Jun1,Zhong Bin2,Chen Yongbing1
Author Affilications:1.College of Electrical Engineering,Naval University of Engineering,Wuhan 430033,China; 2.Administrative Office of Training,Naval University of Engineering,Wuhan 430033,China
DOI:10.16157/j.issn.0258-7998.171590
Author:Zhang Dafeng,Liu Yuhong,Zhang Rongfen
Author Affilications:College of Big Data and Information Engineering,Guizhou University,Guiyang 550025,China
DOI:10.16157/j.issn.0258-7998.171411
Author:Jia Tianzhen1,2,Yang Ting3,Wei Jianlei4,Wang Chen3,Fang Zhen1,2,Tang Xianbao4
Author Affilications:1.Insititute of Electrics,Chinese Academy of Sciences,Beijing 100190,China; 2.University of Chinese Academy of Sciences,Beijing 100049,China; 3.China-Japan Friendship Hospital,Beijing 100029,China;4.Orange Family Technology(Tianjin) CO.,LTD,Tianjin 300457,China
DOI:10.16157/j.issn.0258-7998.171118
Author:Liu Dali1,2,Zhang Jianbo3,Yan Hengping3
Author Affilications:1.School of Electrical Engineering and Automation,Tianjin Polytechnic University,Tianjin 300387,China; 2.State Key Laboratory of Acoustics,Institute of Acoustics,Chinese Academy of Sciences,Beijing 100190,China; 3.HaiYing Enterprise Group Co.Ltd.,Wuxi 214061,China
DOI:10.16157/j.issn.0258-7998.171898
Author:Wang Yana,Cai Chenglin,Li Simin,Yu Honggang
Author Affilications:School of Information and Communication,Guilin University of Electronic Technology,Guilin 541004,China
DOI:10.16157/j.issn.0258-7998.171430
Author:Shang Xiaohui1,Cui Xiaowei1,Guo Jing2,Guan Feng1
Author Affilications:1.Department of Electronic Engineering,Tsinghua University,Beijing 100084,China; 2.Chinese Civil Aviation Institute of Science and Technology,Beijing 100028,China
DOI:10.16157/j.issn.0258-7998.171404
Author:Dong Qianyan,Wang Li,Jiang Bencong,Hu Xiao
Author Affilications:School of Mechanical and Electrical Engineering,Guangzhou University,Guangzhou 510006,China
DOI:10.16157/j.issn.0258-7998.172029
Author:Wang Zheng1,2,3,Wang He1,2,3,Deng Changsheng4,Liu Yu4,Du Zebao4, Wang Xiaosong4,Ou Haiqing3,Zhao Junfeng5,Xia Yuanyi5
Author Affilications:1.State Grid Key Laboratory of Power Industrial Chip Design and Analysis Technology, Beijing Smart-Chip Microelectronics Technology Co.,Ltd.,Beijing 100192,China; 2.Beijing Engineering Research Center of High-reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co.,Ltd.,Beijing 100192,China; 3.State Grid Information A Telecommunication Group Co.,Ltd.,Beijing 102211,China; 4.Institute of Microelectronics of Chinese Academy of Sciences, Beijing Key Laboratory of Radio Frequency IC Technology for Next Generation Communications,Beijing 100029,China; 5.State Grid Jiangsu Electric Information & Telecommunication Company,Nanjing 210000,China
DOI:10.16157/j.issn.0258-7998.171337
Author:Liu Jiwei,Zhao Yang,Li Shaohui
Author Affilications:Network and Information Security Administration Center Hebei Center,Shijiazhuang 050021,China
DOI:10.16157/j.issn.0258-7998.171576
Author:Sun Haifeng,Song Lili
Author Affilications:School of Computer Science and Technology,Southwest University of Science and Technology,Mianyang 621010,China
DOI:10.16157/j.issn.0258-7998.171111
Author:Jiang Congyuan1,Yang Jie2
Author Affilications:1.Department of Electrical and Electronic Engineering,Sichuan Vocational and Technical College,Suining 629000,China; 2.School of Electronic and Information Engineering,Hunan University of Science and Engineering,Yongzhou 425000,China
DOI:10.16157/j.issn.0258-7998.170751
Author:Huang Junwei,Lv Xiaobo,Zhang Heng,Ren Zhuang
Author Affilications:School of Communication and Information Engineering,Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.170593
Author:Yin Hang,Wang Min,Wu Wen
Author Affilications:The Ministerial Key Laboratory of JGMT,Nanjing University of Science and Technology,Nanjing 210094,China
DOI:10.16157/j.issn.0258-7998.170678
Author:Zhou Hua1,2,3,Weng Shaohui1,3,Feng Jiao1,3
Author Affilications:1.Nanjing University of Information Science and Technology,Nanjing 210044,China; 2.Jiangsu Collaborative Innovation Center on Atmospheric Environment and Equipment Technology,Nanjing 210044,China; 3.Jiangsu Key Laboratory of Meteorological Observation and Information Processing,Nanjing 210044,China
DOI:10.16157/j.issn.0258-7998.166788
Author:Jiao Dongdong1,Zhang Chen2,Fang Zhiqi1,Kang Wei1
Author Affilications:1.National Computer System Engineering Research Institute of China,Beijing 100083,China; 2.University of Science and Technology Beijing,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.170294
Author:Liang Qingqing1,2,Li Hui1,2,Zhou Yu1,2,Chen Mei1,2,Zhu Ming3
Author Affilications:1.Guizhou Engineering Laboratory for Advanced Computing and Medical Information Services,Guizhou University,Guiyang 550025,China; 2.College of Computer Science and Technology,Guizhou University,Guiyang 550025,China; 3.National Astronomical Observatories,Chinese Academy of Sciences,Beijing 100016,China
DOI:10.16157/j.issn.0258-7998.170108
Author:Zhang Jianzhong1,Hao Yunliang1,Liu Haiyang1,Li Xiaojun2,Xu Yunxiang2
Author Affilications:1.College of Electrical Engineering and Automation,Shandong University of Science and Technology,Qingdao 266590,China; 2.College of Mechanical and Electronic Engineering,Shandong University of Science and Technology,Qingdao 266590,China
DOI:10.16157/j.issn.0258-7998.170403
Author:Ma Wen1,Geng Zhenwei1,Zhang Lina1,Yu Fengrong2
Author Affilications:1.Department of Application Technology,Yunnan Power Grid Co., Ltd. Information Center,Kunming 650217,China; 2.Faculty of Metallurgical and Energy Engineering,Kunming University of Science and Technology,Kunming 650093,China
DOI:10.16157/j.issn.0258-7998.166484
Author:Tang Yan,Xiao Pengbo,Li Faqin,Li Wenyong
Author Affilications:GuiLin University of Electronic Science and Technology,Guilin 541004,China
DOI:10.16157/j.issn.0258-7998.173731
Author:Zhang Xinwei1,Zhang Hua2,Guo Xiaowang1,Zhang Wen3
Author Affilications:1.The 6th Research Institute of China Electronics Corporation,Beijing 100083,China; 2.Beijing Aerospace Control Center,Beijing 102206,China;3.IThinking Inc,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.166960
Author:Zhang Liang1,2,Yan Tiesheng1,2,Wang Jun1,2,Chen Haichuan1,2,Hu Peng3
Author Affilications:1.Sichuan Province Key Laboratory of Power Electronics Energy-saving Technologies & Equipment, Xihua University,Chengdu 610039,China; 2.School of electrical and electronic information,Xihua University,Chengdu 610039,China; 3.Chengdu MOLO Electric Ltd.,Chengdu 610500,China
DOI:10.16157/j.issn.0258-7998.165909
Author:Zhang Genmiao,Li Bin,Wang Qun,Wang Jun
Author Affilications:The 41st Institute of CETC,Anhui Province Key Laboratory of Electronic Measurement Technology,Bengbu 233006,China
DOI:10.16157/j.issn.0258-7998.171588
Author:Huang Feng1,Chen Haibin1,Jiang Chao1,Chen Shengze1,Chen Liwen1,Wu Kun2,Chen Yaogao2,Lin Yuhan2
Author Affilications:1.State Grid Shanghai Electric Power Research Institute,Shanghai 200051,China; 2.Xiamen RED PHASE Instruments INC.,Xiamen 361000,China
DOI:10.16157/j.issn.0258-7998.170370
Author:Li Delu1,2,Deng Xianming1
Author Affilications:1.School of Electrical and Power Engineering,China University of Mining and Technology,Xuzhou 221116,China; 2.Jiangsu Vocational Institute of Architectural Technology,Xuzhou 221116,China
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