DOI:10.16157/j.issn.0258-7998.173812
Author:Chen Fatang,Liu Yifan,Tang Cheng
Author Affilications:Chongqing Key Lab of Mobile Communication Technology,The Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.173805
Author:Wang Chang1,Sun Fuming1,Li Yang2
Author Affilications:1.School of Electronic and Information Engineering,University of Liaoning University of Technology,Jinzhou 121001,China; 2.Dalian Cloud Force Technologies CO.LTD,Dalian 116000,China
DOI:10.16157/j.issn.0258-7998.173936
Author:Xing Ningzhe
Author Affilications:State Grid Jibei Electric Power Company Branch of Information and Communication,Beijing 100053,China
DOI:10.16157/j.issn.0258-7998.173409
Author:Wang Lei1,Zhang Cuixia2
Author Affilications:1.School of Automation,Beijing Union University,Beijng 100101,China; 2.Beijing Union University Integrated Experimental Teaching Demonstration Center,Beijng 100101,China
DOI:10.16157/j.issn.0258-7998.173985
Author:Fang Fang1,Tian Shiming2,Bu Fanpeng2,Su Yun3
Author Affilications:1.State Grid Beijing Changping Electric Power Supply Company,Beijing 102200,China; 2.China Electric Power Research Institute,Beijing 100192,China;3.Shanghai Electric Power Company,Shanghai 200437,China
DOI:10.16157/j.issn.0258-7998.171931
Author:Liu Qinglong1,2,Dong Jiashan2
Author Affilications:1.School of Electronic and Information Engineering,South China University of Technology,Guangzhou 510640,China; 2.Guangzhou Haige Communications Group Incorporated Company,Guangzhou 510663,China
DOI:10.16157/j.issn.0258-7998.171962
Author:Liu Zhiqiang,Xu Jinfu,Dai Qiang,Li Junwei
Author Affilications:The PLA Information Engineering University,Zhengzhou 450001,China
DOI:10.16157/j.issn.0258-7998.166586
Author:Liu Xiaohui, Liu Kecheng
Author Affilications:Information Construction and Management Center,Nanyang Institute of Technology,Nanyang 473004,China
DOI:10.16157/j.issn.0258-7998.171805
Author:Gao Hua,Li Hui
Author Affilications:School of Information Science and Technology,University of Science and Technology of China,Hefei 230026,China
DOI:10.16157/j.issn.0258-7998.171740
Author:Su Yijun1,Ma Kui1,2,Hu Rui3,Yang Fashun1,2
Author Affilications:1.Department of electronics,Guizhou University,Guiyang 550025,China; 2.Engineering Research Center of the Reliability of Semiconductor Power Device of Ministry of Education,Guiyang 550025,China; 3.Guizhou Zhenhua Feng Gang Semiconductor Co.Ltd.,Guiyang 550018,China
DOI:10.16157/j.issn.0258-7998.171801
Author:Li Dongya1,Huang Haisheng1,Li Xin1,Cao Xinliang2,Yin Qiang1
Author Affilications:1.School of Electronic Engineering,Xi′an University of Posts and Telecommunications,Xi′an 710121,China; 2.School of Physics and Electronic Information,Yan′an University,Yan′an 716000,China
DOI:10.16157/j.issn.0258-7998.170943
Author:Liu Yibing,Li Rongkuan
Author Affilications:School of Electronic Engineering,University of Electronic Science and Technology,Chengdu 611730,China
DOI:10.16157/j.issn.0258-7998.171128
Author:Li Chong1,Xu Wujun1,2,Fan Hong1,2
Author Affilications:1.College of Information Science and Technology,Donghua University,Shanghai 201620,China; 2.Engineering Research Center of Digitized Textile & Fashion Technology,Ministry of Education,Shanghai 201620,China
DOI:10.16157/j.issn.0258-7998.171051
Author:Fu Jun1,Zhong Bin2,Chen Yongbing1
Author Affilications:1.College of Electrical Engineering,Naval University of Engineering,Wuhan 430033,China; 2.Administrative Office of Training,Naval University of Engineering,Wuhan 430033,China
DOI:10.16157/j.issn.0258-7998.171590
Author:Zhang Dafeng,Liu Yuhong,Zhang Rongfen
Author Affilications:College of Big Data and Information Engineering,Guizhou University,Guiyang 550025,China
DOI:10.16157/j.issn.0258-7998.171411
Author:Jia Tianzhen1,2,Yang Ting3,Wei Jianlei4,Wang Chen3,Fang Zhen1,2,Tang Xianbao4
Author Affilications:1.Insititute of Electrics,Chinese Academy of Sciences,Beijing 100190,China; 2.University of Chinese Academy of Sciences,Beijing 100049,China; 3.China-Japan Friendship Hospital,Beijing 100029,China;4.Orange Family Technology(Tianjin) CO.,LTD,Tianjin 300457,China
DOI:10.16157/j.issn.0258-7998.171118
Author:Liu Dali1,2,Zhang Jianbo3,Yan Hengping3
Author Affilications:1.School of Electrical Engineering and Automation,Tianjin Polytechnic University,Tianjin 300387,China; 2.State Key Laboratory of Acoustics,Institute of Acoustics,Chinese Academy of Sciences,Beijing 100190,China; 3.HaiYing Enterprise Group Co.Ltd.,Wuxi 214061,China
DOI:10.16157/j.issn.0258-7998.171898
Author:Wang Yana,Cai Chenglin,Li Simin,Yu Honggang
Author Affilications:School of Information and Communication,Guilin University of Electronic Technology,Guilin 541004,China
DOI:10.16157/j.issn.0258-7998.171430
Author:Shang Xiaohui1,Cui Xiaowei1,Guo Jing2,Guan Feng1
Author Affilications:1.Department of Electronic Engineering,Tsinghua University,Beijing 100084,China; 2.Chinese Civil Aviation Institute of Science and Technology,Beijing 100028,China
DOI:10.16157/j.issn.0258-7998.171404
Author:Dong Qianyan,Wang Li,Jiang Bencong,Hu Xiao
Author Affilications:School of Mechanical and Electrical Engineering,Guangzhou University,Guangzhou 510006,China
DOI:10.16157/j.issn.0258-7998.172029
Author:Wang Zheng1,2,3,Wang He1,2,3,Deng Changsheng4,Liu Yu4,Du Zebao4, Wang Xiaosong4,Ou Haiqing3,Zhao Junfeng5,Xia Yuanyi5
Author Affilications:1.State Grid Key Laboratory of Power Industrial Chip Design and Analysis Technology, Beijing Smart-Chip Microelectronics Technology Co.,Ltd.,Beijing 100192,China; 2.Beijing Engineering Research Center of High-reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co.,Ltd.,Beijing 100192,China; 3.State Grid Information A Telecommunication Group Co.,Ltd.,Beijing 102211,China; 4.Institute of Microelectronics of Chinese Academy of Sciences, Beijing Key Laboratory of Radio Frequency IC Technology for Next Generation Communications,Beijing 100029,China; 5.State Grid Jiangsu Electric Information & Telecommunication Company,Nanjing 210000,China
DOI:10.16157/j.issn.0258-7998.171337
Author:Liu Jiwei,Zhao Yang,Li Shaohui
Author Affilications:Network and Information Security Administration Center Hebei Center,Shijiazhuang 050021,China
DOI:10.16157/j.issn.0258-7998.171576
Author:Sun Haifeng,Song Lili
Author Affilications:School of Computer Science and Technology,Southwest University of Science and Technology,Mianyang 621010,China
DOI:10.16157/j.issn.0258-7998.171111
Author:Jiang Congyuan1,Yang Jie2
Author Affilications:1.Department of Electrical and Electronic Engineering,Sichuan Vocational and Technical College,Suining 629000,China; 2.School of Electronic and Information Engineering,Hunan University of Science and Engineering,Yongzhou 425000,China
DOI:10.16157/j.issn.0258-7998.170751
Author:Huang Junwei,Lv Xiaobo,Zhang Heng,Ren Zhuang
Author Affilications:School of Communication and Information Engineering,Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.170593
Author:Yin Hang,Wang Min,Wu Wen
Author Affilications:The Ministerial Key Laboratory of JGMT,Nanjing University of Science and Technology,Nanjing 210094,China
DOI:10.16157/j.issn.0258-7998.170678
Author:Zhou Hua1,2,3,Weng Shaohui1,3,Feng Jiao1,3
Author Affilications:1.Nanjing University of Information Science and Technology,Nanjing 210044,China; 2.Jiangsu Collaborative Innovation Center on Atmospheric Environment and Equipment Technology,Nanjing 210044,China; 3.Jiangsu Key Laboratory of Meteorological Observation and Information Processing,Nanjing 210044,China
DOI:10.16157/j.issn.0258-7998.166788
Author:Jiao Dongdong1,Zhang Chen2,Fang Zhiqi1,Kang Wei1
Author Affilications:1.National Computer System Engineering Research Institute of China,Beijing 100083,China; 2.University of Science and Technology Beijing,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.170294
Author:Liang Qingqing1,2,Li Hui1,2,Zhou Yu1,2,Chen Mei1,2,Zhu Ming3
Author Affilications:1.Guizhou Engineering Laboratory for Advanced Computing and Medical Information Services,Guizhou University,Guiyang 550025,China; 2.College of Computer Science and Technology,Guizhou University,Guiyang 550025,China; 3.National Astronomical Observatories,Chinese Academy of Sciences,Beijing 100016,China
DOI:10.16157/j.issn.0258-7998.170108
Author:Zhang Jianzhong1,Hao Yunliang1,Liu Haiyang1,Li Xiaojun2,Xu Yunxiang2
Author Affilications:1.College of Electrical Engineering and Automation,Shandong University of Science and Technology,Qingdao 266590,China; 2.College of Mechanical and Electronic Engineering,Shandong University of Science and Technology,Qingdao 266590,China
DOI:10.16157/j.issn.0258-7998.170403
Author:Ma Wen1,Geng Zhenwei1,Zhang Lina1,Yu Fengrong2
Author Affilications:1.Department of Application Technology,Yunnan Power Grid Co., Ltd. Information Center,Kunming 650217,China; 2.Faculty of Metallurgical and Energy Engineering,Kunming University of Science and Technology,Kunming 650093,China
DOI:10.16157/j.issn.0258-7998.166484
Author:Tang Yan,Xiao Pengbo,Li Faqin,Li Wenyong
Author Affilications:GuiLin University of Electronic Science and Technology,Guilin 541004,China
DOI:10.16157/j.issn.0258-7998.173731
Author:Zhang Xinwei1,Zhang Hua2,Guo Xiaowang1,Zhang Wen3
Author Affilications:1.The 6th Research Institute of China Electronics Corporation,Beijing 100083,China; 2.Beijing Aerospace Control Center,Beijing 102206,China;3.IThinking Inc,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.166960
Author:Zhang Liang1,2,Yan Tiesheng1,2,Wang Jun1,2,Chen Haichuan1,2,Hu Peng3
Author Affilications:1.Sichuan Province Key Laboratory of Power Electronics Energy-saving Technologies & Equipment, Xihua University,Chengdu 610039,China; 2.School of electrical and electronic information,Xihua University,Chengdu 610039,China; 3.Chengdu MOLO Electric Ltd.,Chengdu 610500,China
DOI:10.16157/j.issn.0258-7998.165909
Author:Zhang Genmiao,Li Bin,Wang Qun,Wang Jun
Author Affilications:The 41st Institute of CETC,Anhui Province Key Laboratory of Electronic Measurement Technology,Bengbu 233006,China
DOI:10.16157/j.issn.0258-7998.171588
Author:Huang Feng1,Chen Haibin1,Jiang Chao1,Chen Shengze1,Chen Liwen1,Wu Kun2,Chen Yaogao2,Lin Yuhan2
Author Affilications:1.State Grid Shanghai Electric Power Research Institute,Shanghai 200051,China; 2.Xiamen RED PHASE Instruments INC.,Xiamen 361000,China
DOI:10.16157/j.issn.0258-7998.170370
Author:Li Delu1,2,Deng Xianming1
Author Affilications:1.School of Electrical and Power Engineering,China University of Mining and Technology,Xuzhou 221116,China; 2.Jiangsu Vocational Institute of Architectural Technology,Xuzhou 221116,China
High Speed Wired Communication Chip
Information Flow and Energy Flow in Industrial Digital Transformation
Special Antenna and Radio Frequency Front End
Radar Target Tracking Technology
Key Technologies of 5G-A and 6G
Key Technologies of 5G and Its Evolution
Key Technologies of 5G and Its Evolution
Processing and Application of Marine Target Characteristic Data
Antenna Technology and Its Applications
5G Vertical Industry Application
Microelectronics in Medical and Healthcare
Application of Edge Computing in IIoT
Deep Learning and Image Recognization
6G Microwave Millimeter-wave Technology
Radar Processing Technology and Evaluation
Space-Ground Integrated Technology
5G Vertical Industry Application
Innovation and Application of PKS System
FPGA and Artificial Intelligence
5G Network Construction and Optimization
Network and Business Requirements for 6G
5G and Intelligent Transportation
5G R16 Core Network Evolution Technology
Satellite Nevigation Technology
5G Wireless Network Evolution Technology
5G Network Planning Technology
5G Co-construction and Sharing Technology
5G and Emergency Communication
5G Slicing Technology and Its Applications
5G Terminal Key Realization Technology
5G and Artificial Intelligence
Terahertz Technology and Its Application
Signal and Information Processing
Internet of Things and the Industrial Big Data
Electronic Techniques of UAV System
Aerospace Electronic Technology
Robot and Industrial Automation
ADAS Technique and Its Implementation
2016 IEEE International Conference on Integrated Circuits and Microsystems
Measurement and Control Technology of Bus Network
Key Techniques of 5G and Algorthm Implement