DOI:10.16157/j.issn.0258-7998.174798
Author:Yang Lichun1,2,Gu Yinyan1,Bai Yu2
Author Affilications:1.Jiangsu Automation Research Institute,Lianyungang 222061,China; 2.School of Electronic and Information Engineering,Beihang University,Beijing 100191,China
DOI:10.16157/j.issn.0258-7998.174525
Author:Sheng Wei,He Biao,Gao Tong
Author Affilications:School of Instrument and Opto-Electronics Engineering,Beihang University,Beijing 100191,China
DOI:10.16157/j.issn.0258-7998.172880
Author:Fu Songyuan
Author Affilications:The 7th Institute of China Electronics Technology Group Corporation,Guangzhou 510310,China
DOI:10.16157/j.issn.0258-7998.175076
Author:Jiang Haitao,Chang Qing,Wang Yaoli
Author Affilications:School of Information and Computer,Taiyuan University of Technology,Taiyuan 030024,China
DOI:10.16157/j.issn.0258-7998.174365
Author:Zhu Yingkai,Luo Wenguang,Bin Yang
Author Affilications:School of Electrical and Information Engineering,Guangxi University of Science and Technology,Liuzhou 545006,China
DOI:10.16157/j.issn.0258-7998.174887
Author:Chu Fei1,2,Song Kuixin2,Zhao Yuanchuang2,Guo Wei2,Ma Yue2,Kong Ying2
Author Affilications:1.College of Economics and Management,Nanjing University of Aeronautics and Astronautics,Nanjing 211106,China; 2.Min Xin Tronics Corporation,Beijing 100076,China
DOI:10.16157/j.issn.0258-7998.173486
Author:Zhou Songjiang,Li Shengchen,Liu Ming
Author Affilications:Institute of Information Photonics and Optical Communications,Beijing University of Posts and Telecommunications,Beijing 100876
DOI:10.16157/j.issn.0258-7998.173191
Author:Wang Baosheng,Zhao Gangbin
Author Affilications:School of Computer and Information Engineering,Nanyang Institute of Technology,Nanyang 473000,China
DOI:10.16157/j.issn.0258-7998.173393
Author:Li Xin,Zhang Haining,Liu Min
Author Affilications:School of Information Science and Engineering,Shenyang University of Technology,Shenyang 110870,China
DOI:10.16157/j.issn.0258-7998.173333
Author:Jiang Ping,Huang Chunliang,Ye Baosheng
Author Affilications:No.36 Research Institute of China Electronics Technology Group Corporation,Jiaxing 314033,China
DOI:10.16157/j.issn.0258-7998.173548
Author:Gao Hu,Feng Erqiang,Zhao Gang
Author Affilications:China Aero-Polytechnology Establishment,Beijing 100028,China
DOI:10.16157/j.issn.0258-7998.173847
Author:Lv Zhipeng1,2,Ma Xiaobing1,Yu Weidong1
Author Affilications:1.Institute of Electronics,Chinese Academy of Sciences,Beijing 100190,China; 2.School of Electronic Electrical and Communication Engineering,University of Chinese Academy of Sciences,Beijing 100039,China
DOI:10.16157/j.issn.0258-7998.173727
Author:Dong Mengsha,Zhang Yousai,Wang Yajun
Author Affilications:School of Electronics and Information,Jiangsu University of Science and Technology,Zhenjiang 212003,China
DOI:10.16157/j.issn.0258-7998.173250
Author:Zhao Lijie1,Wei Haochen1,2,Tian Zhiying1,2
Author Affilications:1.Institute of Information Engineering,Shenyang University of Chemical Technology,Shenyang 110142,China; 2. Institute of Navigation,Northwestern Polytechnical University,Xi′an 710072,China
DOI:10.16157/j.issn.0258-7998.174184
Author:Zhang Xiaolin,Ding Lei,Gu Liming
Author Affilications:No.36 Research Institute of CETC,Jiaxing 314033,China
DOI:10.16157/j.issn.0258-7998.173734
Author:Chen Shili,Wang Zhe,Bai Zhiliang,Zeng Zhoumo
Author Affilications:State Key Laboratory of Precision Measurement Technology and Instrument,Tianjin University,Tianjin 300072,China
DOI:10.16157/j.issn.0258-7998.173846
Author:Li Zhao,Shu Zhibing,Yan Liang
Author Affilications:College of Electrical Engineering and Control Science,Nanjing Tech University,Nanjing 211816,China
DOI:10.16157/j.issn.0258-7998.174336
Author:Wang Li1,Dong Qianyan1,Huang Zhipeng1,Xie Yuhuai2,Hu Xiao1
Author Affilications:1.School of Mechanical and Electric Engineering,Guangzhou University,Guangzhou 510006,China; 2.Guangzhou Laiming Biological Technology Co.,Ltd.,Guangzhou 510330,China
DOI:10.16157/j.issn.0258-7998.174468
Author:Guo Fuzhi,Du Hongmian,Li Xiaoshu,Qin Sichao,Ge Zhu
Author Affilications:Key Laboratory of Instrument Science and Dynamic Test,Ministry of Education,North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.174429
Author:Li Wenjie1,2,Li Dongmei1
Author Affilications:1.Department of Electronic Engineering,Tsinghua University,Beijing 100084,China; 2.Beijing NAURA Microelectronics Equipment Co.,Ltd.,Beijing 100176,China
DOI:10.16157/j.issn.0258-7998.173315
Author:Chai Xiaorong,Lei Xuemei,Cheng Shaoting
Author Affilications:School of Electronic Information Engineering,Inner Mongolia University,Hohhot 010021,China
DOI:10.16157/j.issn.0258-7998.172823
Author:Wang Qiang1,Yang Junbo2,Ran Yaozong1,Shi Wei3
Author Affilications:1.School of Data Science,Tongren University,Tongren 554300,China; 2.School of Science,National Defense Science and Technology University,Changsha 410000,China; 3.School of Materials and Chemical Engineering,Tongren University,Tongren 554300,China
DOI:10.16157/j.issn.0258-7998.173066
Author:Zhao Feng,Zou Chuanyun,Xu Lei,He Yi
Author Affilications:School of Information Engineering,Southwest University of Technology and Science,Mianyang 621010,China
DOI:10.16157/j.issn.0258-7998.173200
Author:Teng Deyang,Wang Qiong,Zhou Xiaohai,Liu Yafei,Ge Changwei
Author Affilications:School of Communication and Information Engineering,Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.173167
Author:Wang Peng
Author Affilications:College of Physics & Electronics,Xinyang Normal University,Xinyang 464000,China
DOI:10.16157/j.issn.0258-7998.172725
Author:Zhou Wangping,Rui Zhenlei,Tian Yan
Author Affilications:Nanjing University of Information Science and Technology,Nanjing 210044,China
DOI:10.16157/j.issn.0258-7998.173354
Author:Dou Qingli1,Zhang Wenwu1,Zhu Huadong2,Xu Jun2,Chen Mufeng3,Li Chao3,Duan Weiqian4,Miao Jungang4
Author Affilications:1.The People′s Hospital in Baoan,Shenzhen 518100,China;2.Peking Union Medical College Hospital,Beijing 100037,China; 3.Shenzhen Liluya e-Tech Co.,Ltd.,Shenzhen 518020,China; 4.Beijing Key Laboratory of Microwave Sensing and Security Applications,BUAA,Beijing 100191,China
DOI:10.16157/j.issn.0258-7998.171041
Author:Cheng Bicheng,Liu Renhui,Zhao Yunfei,Xu Fengkai
Author Affilications:National Engineering Laboratory for Industrial Control System Information Security Technology, National Computer System Engineering Research Institute of China,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.173485
Author:Sun Lei1,2,Zhuang Jianmin1,Zhang Zhaofeng1
Author Affilications:1.Shanghai Advanced Research Institute,Chinese Academy of Science,Shanghai 201210,China; 2.University of the Chinese Academy of Science(UCAS),Beijing 100190,China
DOI:10.16157/j.issn.0258-7998.173038
Author:Hu Qingsong1,2,Zhang Liang1,2
Author Affilications:1.Internet of Things Perception Mine Research Center,China University of Mining and Technology,Xuzhou 221008,China; 2.School of Information and Control Engineering,China University of Mining and Technology,Xuzhou 221008,China
DOI:10.16157/j.issn.0258-7998.172747
Author:Li Zhengming,Zhang Jiajun,He Bin
Author Affilications:College of Electrical and Information Engineering,Jiangsu University,Zhenjiang 212013,China
DOI:10.16157/j.issn.0258-7998.172895
Author:Cui Chao,Li Hongmei,Zhang Hengguo,Zeng Shenjie
Author Affilications:School of Electrical Engineering and Automation,Hefei University of Technology,Hefei 230009,China
DOI:10.16157/j.issn.0258-7998.172792
Author:Chen Chunkai,Li Yinlong
Author Affilications:School of Electronics and Information Engineering,Tianjin Polytechnic University,Tianjin 300387,China
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