DOI:10.16157/j.issn.0258-7998.174811
Author:Ma Xiaohong1,Yin Xianglei2
Author Affilications:1.Electrical and Electronic Experiment Teaching Center,Shannxi University of Technology,Hanzhong 723000,China; 2.School of Electrical Engineering,Shannxi University of Technology,Hanzhong 723000,China
DOI:10.16157/j.issn.0258-7998.174703
Author:Chen Zheng
Author Affilications:Software Department,Shanghai Zhaoxin Semiconductor Co.,Ltd. Shanghai 201203,China
DOI:10.16157/j.issn.0258-7998.180612
Author:Cao Pengpeng1,2,Chen Jia1,2,Zhang Shaofeng1,2
Author Affilications:1.AVIC Computing Technique Research Institute,Xi′an 710068,China; 2.Aviation Key Laboratory of Science on Integrated Circuit and Micro-System Design,Xi′an 710068,China
DOI:10.16157/j.issn.0258-7998.174633
Author:Wei Wei1,2,Cao Suzhi2,Zhong Hongen2
Author Affilications:1.University of Chinese Academy of Sciences,Beijing 100049,China; 2.Technology and Engineering Center for Space Utilization,Chinese Academy of Sciences,Beijing 100094,China
DOI:10.16157/j.issn.0258-7998.174781
Author:Hou Xiangyun,Huang Letian
Author Affilications:School of Microelectronics and Solid State Electronics,University of Electronic Science and Technology of China, Chengdu 610054,China
DOI:10.16157/j.issn.0258-7998.174654
Author:Wei Guo
Author Affilications:Lontium Semiconductor Corporation,Hefei 230001,China
DOI:10.16157/j.issn.0258-7998.174020
Author:Zhang Qingchun1,Yang Mingwu1,Jiang Zhaoneng1,2,Lu Xiaochi1,Gao Sheng1,Zhang Hua3
Author Affilications:1.School of Electronic Science and Applied Physics,Hefei University of Technology,Hefei 230009,China; 2.State Key Laboratory of Millimeter Waves,Nanjing 210096,China; 3.Anhui Power Source Technology Co.,Ltd,Xuancheng 242199,China
DOI:10.16157/j.issn.0258-7998.175009
Author:Xiao Siqi1,2,Quan Huimin1,Zhong Xiaoxian2
Author Affilications:1.College of Electrical and Information Engineering,Hunan University,Changsha 410000,China; 2.Communication Product Line,Zhuhai Zhonghui Microelectronics Company Limited,Zhuhai 519000,China
DOI:10.16157/j.issn.0258-7998.174797
Author:Wang Ping,Yu Xiangchun
Author Affilications:School of Automation,Chongqing University of Posts and Telecommunications,Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.174680
Author:Ji Yuanfa1,2,Liang Tao1,2,Sun Xiyan1,2,Yan Suqing1,2,Lu Weijun1,2
Author Affilications:1.School of Information and Communication,Guilin University of Electronic Technology,Guilin 541004,China; 2.Guangxi Key Laboratory of Precision Navigation Technology and Application,Guilin 541004,China
DOI:10.16157/j.issn.0258-7998.174841
Author:Qiao Ruiping,Sun He,Dong Yuanchen,Wang Fang
Author Affilications:School of Electronic and Information Engineering,Xi′an Jiao Tong University,Xi′an 710049,China
DOI:10.16157/j.issn.0258-7998.174566
Author:Zhang Kaisheng,Wang Xiaorui,Huang Qian
Author Affilications:College of Electrical and Information Engineering, Shannxi University of Science and Technology,Xi′an 710021,China
DOI:10.16157/j.issn.0258-7998.174744
Author:Lv Ming,Teng Bin
Author Affilications:Xi′an ZhongFei Aviation Test Technology Development Co.,Ltd.,Xi′an 710089,China
DOI:10.16157/j.issn.0258-7998.174743
Author:Jin Yong1,Liang Lixin1,Liu Tingzhang2,Xing Chen2
Author Affilications:1.Shanghai International Automobile City Co.,Ltd.,Shanghai 201805,China; 2.Shanghai Key Laboratory of Power Station Automation Technology,Shanghai University,Shanghai 200072,China
DOI:10.16157/j.issn.0258-7998.174959
Author:Yuan Zhengwu,He Gege
Author Affilications:Chongqing Key Lab of Mobile Communications Technology,Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.174938
Author:Liang Longkai1,2,Zhang Liying1,He Wenchao1,2,Lv Xuhao1,2
Author Affilications:1.Automotive Electronics and Services Engineering Department,College of Humanities & Sciences of Northeast Normal University, Changchun 130117,China; 2.Jilin Provincial University Automotive Electronic Technology Engineering Research Center,Changchun 130117,China
DOI:10.16157/j.issn.0258-7998.174930
Author:Cheng Yuzhu,Li Zhaochun
Author Affilications:Measurement and Control Technology Department,Mechanical and Electronic Engineering College, Nanjing Forestry University,Nanjing 210037,China
DOI:10.16157/j.issn.0258-7998.174570
Author:Lin Fuchun,Liu Yuhong,Zhang Dafeng,Zhang Rongfen
Author Affilications:College of Big Data and Information Engineering,Guizhou University,Guiyang 550025,China
DOI:10.16157/j.issn.0258-7998.175084
Author:Liu Yanping,Li Jie,Jin Fei
Author Affilications:College of Electrical and Information Engineering,Hebei University of Technology,Tianjin 300401,China
DOI:10.16157/j.issn.0258-7998.174033
Author:Zhang Chuang1,Shao Tan2,Wang Huiwu1
Author Affilications:1.Harbin Research Institute of Electrical Instruments Co.,Ltd.,Harbin 150028,China; 2.Henan XJ Instrument Co.,Ltd.,Xuchang 461000,China
DOI:10.16157/j.issn.0258-7998.174255
Author:Xing Yongqiang1,Huang Haisheng1,Cao Xinliang2
Author Affilications:1.School of Electronic Engineering,Xi′an University of Posts and Telecommunications,Xi′an 710121,China; 2.School of Physics and Electronic Information,Yan′an University,Yan′an 716000,China
DOI:10.16157/j.issn.0258-7998.173810
Author:Chen Mengjia,Zhao Yisheng,Huang Jinjin,Dong Zhixiang,Chen Zhonghui
Author Affilications:College of Physics and Information Engineering,Fuzhou University,Fuzhou 350108,China
DOI:10.16157/j.issn.0258-7998.174687
Author:Yang Guanxia1,Zhou Di2,Zhang Zhan3
Author Affilications:1.Department of Computer and Information Technology,Zhejiang Changzheng Vocational & Technical College, Hangzhou 310023,China; 2.Sichuan University of Arts and Science,Dazhou 635000,China; 3.School of Electrical Engineering and Automation,Henan Polytechnic University,Jiaozuo 454000,China
DOI:10.16157/j.issn.0258-7998.173601
Author:Wang Dan,Li Mengjie,Li Yuhe,Jia Dongsheng
Author Affilications:Chongqing Key Lab of Mobile Communications,Chongqing University of Posts and Telecommunications,Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.174810
Author:Wan Hang1,Wang Xuecheng2
Author Affilications:1.Institute of Logistics Technology,Zhejiang Technical Institute of Economics,Hangzhou 310018,China; 2.College of Computer Science and Technology,Jilin University,Changchun 130012,China
DOI:10.16157/j.issn.0258-7998.174144
Author:Wu Peng1,Zhou Jie1,2,Chen Jianggaolu1,Kikuchi Hisakazu2
Author Affilications:1.Department of Communications, Nanjing University of Information Science and Technology, Nanjing 210044, China; 2.Department of Electronic and Electrical Engineering,Niigata University,Niigata 950-2181,Japan
DOI:10.16157/j.issn.0258-7998.180803
Author:Xu Shaowei,Chen Siyu
Author Affilications:Xi′an Aeronautics Computing Technique Research Institute,AVIC,Xi′an 710065,China
DOI:10.16157/j.issn.0258-7998.174536
Author:Liu Shuo1,Lv Hao1,2,Gao Hao1
Author Affilications:1.Xi′an Aeronautical Computing Technique Research Institute,AVIC,Xi′an 710065,China; 2.School of Computer Science,Northwestern Polytechnical University,Xi′an 710072,China
DOI:10.16157/j.issn.0258-7998.173766
Author:Wei Zhaochuan,Pan Jundao,Wu Guozeng
Author Affilications:School of Information and Communication,Guilin University of Electronic Technology,Guilin 541004,China
DOI:10.16157/j.issn.0258-7998.173844
Author:Li Lifu,Li Hongliang,Gu Yongjun
Author Affilications:Communication NCO Academy,the Army Engineering University of PLA,Chongqing 400035,China
DOI:10.16157/j.issn.0258-7998.180895
Author:Yang Xiaojun,Zang Fei,Li Chunlei
Author Affilications:The 28th Research Institute of China Electronics Technology Group Corporation, Nanjing 210007,China
DOI:10.16157/j.issn.0258-7998.174081
Author:Zeng Kangming,Wu Xing
Author Affilications:College of Information Engineering,Nanning University,Nanning 530200,China
DOI:10.16157/j.issn.0258-7998.173204
Author:Yan Changguo1,Gong Renxi2,Liu Xiaoyong1,Xiong Zhonggang1,Yang Hang1
Author Affilications:1.School of Engineering,Zunyi Normal College,Zunyi 563006,China; 2.School of Electrical Engineering,Guangxi University,Nanning 530004,China
DOI:10.16157/j.issn.0258-7998.173373
Author:Dong Feiju,Shao Ruping,Wang Da
Author Affilications:College of Electrical Engineering and Control Science,Nanjing Tech University,Nanjing 211816,China
DOI:10.16157/j.issn.0258-7998.173375
Author:Feng Baogang1,2,Zhang Lanhong2,Lu Guangping2
Author Affilications:1.School of Electronic and Information Engineering,Jiangsu University,Zhenjiang 212013,China; 2.School of Electrical Engineering,Yancheng Institute of Technology,Yancheng 224051,China
DOI:10.16157/j.issn.0258-7998.172905
Author:Chen Kai1,2,Li Hongzuo1,Liu Shuangyi2
Author Affilications:1.Chongqing Institute of Green and Intelligent Technology,Chinese Academy of Sciences,Chongqing 400714,China; 2.College of Electronic Information Engineering,Changchun University of Science and Technology,Changchun 130022,China
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