DOI:10.16157/j.issn.0258-7998.181486
Author:Chen Xi,Hu Bin
Author Affilications:China Industrial Control Systems Cyber Emergency Response Team,Beijing 100040,China
DOI:10.16157/j.issn.0258-7998.189014
Author:Peng Shutao1,Huang Wei1,Bian Shaoxian1,Du Guangshan2
Author Affilications:1.Tianjing Phytium Technology Co.,Ltd.,Tianjing 102209,China;2.Cadence Design Systems,Inc.,Shanghai 201204,China
DOI:10.16157/j.issn.0258-7998.189017
Author:Li Xuan,Li Yuan,Qi Jingfeng,Feng Lei,Zhai Lukun,Qian Yingqi,Zhang Wentao,Shao Wanxin
Author Affilications:GLOBALFOUNDRIES China(Shanghai)Co.,Ltd.,Shanghai 201204,China
DOI:10.16157/j.issn.0258-7998.189016
Author:Chen Zhao1,Cheng Liang1,Lin Zhiqiang1,Zhuang Zhemin2,Liu Huanyan2
Author Affilications:1.Shenzhen Hisilicon Technologies CO.,LTD.,Shenzhen 518129,China;2.Cadence Design Systems,Inc.,Shanghai 201204,China
DOI:10.16157/j.issn.0258-7998.189019
Author:Liu Mingyang,Li Yongliang
Author Affilications:Analog Devices Inc.,Beijing 100192,China
DOI:10.16157/j.issn.0258-7998.174966
Author:Peng Xiaomei,Zhao Aifeng,Wang Jun
Author Affilications:School of Information Engineering,Southwest University of Science and Technology,Mianyang 621010,China
DOI:10.16157/j.issn.0258-7998.174832
Author:Lu Yu
Author Affilications:The 10th Research Institute of CETC,Chengdu 610036,China
DOI:10.16157/j.issn.0258-7998.174762
Author:Li Zhen1,Wang Pengjun1,Cheng Xu2,Li Gang1
Author Affilications:1.Institute of Circuits and Systems,Ningbo University,Ningbo 315211,China; 2.State Key Laboratory of ASIC and System,Fudan University,Shanghai 201203,China
DOI:10.16157/j.issn.0258-7998.180772
Author:Jiang Lin,Heng Qian,Zhang Chunming,Deng Junyong,Wang Xijuan
Author Affilications:School of Electronic Engineering,Xi′an University of Posts and Telecommunications,Xi′an 710121,China
DOI:10.16157/j.issn.0258-7998.174770
Author:Fan Xinxin,Yang Lianying,Chen Xiuguo,Xu Bin
Author Affilications:State Grid Tongling Power Supply Company,Tongling 244000,China
DOI:10.16157/j.issn.0258-7998.174735
Author:Cai Hongyan1,Du Tao1,Meng Xianggang2,Li Guofeng3,Liang Ke3,Chen Xinwei4,5
Author Affilications:1.Tianjin Key Laboratory of Optoelectronic Sensor and Sensing Network Technology,Tianjin 300350,China; 2.Tianjin Key Laboratory of Photo-electronics Thin Film Devices and Technique,Tianjin 300350,China; 3.Laboratory of Integrated Circuit and System Integration,Nankai University,Tianjin 300350,China; 4.Fujian Provincial Key Laboratory of Information Processing and Intelligent Control,Fuzhou 350108,China; 5.Fuzhou Joint Laboratory of Robot Technology Application,Fuzhou 350108,China
DOI:10.16157/j.issn.0258-7998.189018
Author:Yuan Jiahong
Author Affilications:Phytium Technology Co.,Ltd.,Changsha 410000,China
DOI:10.16157/j.issn.0258-7998.189015
Author:Xu Huimin,Zhu Weiwei,Shi Jian′an
Author Affilications:NVIDIA Semiconductor Technology(Shanghai) Co.,Shanghai 201210,China
DOI:10.16157/j.issn.0258-7998.180064
Author:Zhang Mengxin,Liao Yuan,Liu Wenhan,Huang Qijun
Author Affilications:School of Physics and Technology,Wuhan University,Wuhan 430072,China
DOI:10.16157/j.issn.0258-7998.180358
Author:Hu Zemin,Shi Hongsheng,Kang Kai,Yan Yuanhai
Author Affilications:National Active Distribution Network Technology Research Center,Beijing Jiaotong University,Beijing 100044,China
DOI:10.16157/j.issn.0258-7998.175108
Author:Li Jiaqi1,Liu Biqi2,Li Bin1,Geng Lina1,Ma Yiling1,Wang Shuai1
Author Affilications:1.Liaoning Electric Power Research Institute of SGCC,Shenyang 110006,China; 2.Liaoning Electric Power Information and Communication Branch of SGCC,Shenyang 110006,China
DOI:10.16157/j.issn.0258-7998.180347
Author:Zhang Jingrong1,2,3,Gu Binbin1,2,3,Miao Chengyu1,2,3,Li Jianqiao4
Author Affilications:1.Jiangsu Collaborative Innovation Center on Atmospheric Environment and Equipment Technology, Nanjing University of Information Science and Technology,Nanjing 210044,China; 2.Jiangsu Meteorological Sensor Network Technology Engineering Center,Nanjing University of Information Science and Technology, Nanjing 210044,China; 3.Jiangsu Key Laboratory of Meteorological Observation and Information Procession, Nanjing University of Information Science and Technology,Nanjing 210044,China; 4.School of Electronic Science and Engineering,Nanjing University of Posts and Telecommunications,Nanjing 210003,China
DOI:10.16157/j.issn.0258-7998.180777
Author:Song Yongkun1,Jiang Liubing2,Che Li2
Author Affilications:1.School of Information and Communication Engineering,Guilin University of Electronic Technology,Guilin 541004,China; 2.School of Computer Science and Information Security, Guilin University of Electronic Technology,Guilin 541004,China
DOI:10.16157/j.issn.0258-7998.180384
Author:Zhao Dechun1,Fang Cheng2,Liu Mengmeng1,Li Shuyue1
Author Affilications:1.School of Biological Information,Chongqing University of Posts and Telecommunications,Chongqing 400065,China; 2.School of Automation, Chongqing University of Posts and Telecommunications,Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.180006
Author:Yang Jiaxiang1,Long Tao2,Qui Chunling1,Bao Zemin2,Wang Peizhi2,Liu Dunyi2
Author Affilications:1.College of Instrumentation and Electrical Engineering,Jilin University,Changchun 130021,China; 2.SHRIMP Center,Institute of Geology Chinese Academy of Geological Sciences,Beijing 102206,China
DOI:10.16157/j.issn.0258-7998.180457
Author:Li Beiguo1,Yang Shenglong2,Li Huijing2
Author Affilications:1.Beijing Changzheng Aerospace Vehicle Research Institute,Beijing 100076,China; 2.Key Laboratory of Instrumentation Science & Dynamic Measurement,North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.181040
Author:Sha Yan,Wang Dan,Zhang Hongwei,Ma Jinfeng
Author Affilications:School of Medical Informatics,Xuzhou Medical University,Xuzhou 221004,China
DOI:10.16157/j.issn.0258-7998.174948
Author:Chang Wei1,Sun Xuehong2,3,Liu Liping1,3,Xue Jianan1
Author Affilications:1.School of Physics and Electronic-Electrical Engineering,Ningxia University,Yinchuan 750021,China; 2.School of Information Engineering,Ningxia University,Yinchuan 750021,China; 3.Key Laboratory Intelligent Sensing for Desert Information,Yinchuan 750021,China
DOI:10.16157/j.issn.0258-7998.175183
Author:Li Guiyong,Shu Qiang,Li Wenbin
Author Affilications:Chongqing Key Lab of Mobile Communication Technology,Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.175047
Author:Zhang Bugao,Ma Xizhi
Author Affilications:Electrical and Mechanical College,Nanjing University of Aeronautics and Astronautics,Nanjing 210016,China
DOI:10.16157/j.issn.0258-7998.175067
Author:Su Yan,Yang Meijun
Author Affilications:College of Electronic and Information Engineering,Guangzhou College of South China University of Technology, Guangzhou 510800,China
DOI:10.16157/j.issn.0258-7998.174995
Author:Sheng Xuefeng1,Yao Yufeng2
Author Affilications:1.Department of Computer Science and Technology,Suzhou Information Career Technical College,Suzhou 215000,China; 2.School of Computer Science,Soochow University,Suzhou 215000,China
DOI:10.16157/j.issn.0258-7998.174574
Author:Hu Xiaodong,Gao Peng,Tang Lun,Chen Qianbin
Author Affilications:Key Laboratory of Mobile Communication Technology,Chongqing University of Post and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.181004
Author:Ren Qiujie1,Pan Gang2,Bai Yongqiang2,Mi Shichao2
Author Affilications:1.Luoyang Institute of Science and Technology,Luoyang 471000,China; 2.Luoyang Electronic Equipment Test Center of China,Luoyang 471003,China
DOI:10.16157/j.issn.0258-7998.175074
Author:Wu Dalei1,Sun Yansong1,Lin Jun1,Huang Kailai1,Qi Bin1,Jin Zuliang2,Lu Jiaying2
Author Affilications:1.Hainan Power Grid Co.,Ltd.,Electric Energy Metering Center,Haikou 570100,China; 2.Ningbo Sunrise Instruments Co.,Ltd.,Ningbo 315010,China
DOI:10.16157/j.issn.0258-7998.174212
Author:Yang Rui1,Huang Haisheng1,Li Xin1,Cao Xinliang2
Author Affilications:1.School of Electronic Engineering,Xi′an University of Posts and Telecommunications,Xi′an 710121,China; 2.School of Physics and Electronic Information,Yan′an University,Yan′an 716000,China
DOI:10.16157/j.issn.0258-7998.174285
Author:Fang Yanhong,Yang Xuemei,Zhang Hongying,Wang Xueyuan
Author Affilications:School of Information Engineering,Southwest University of Science and Technology,Mianyang 621010,China
DOI:10.16157/j.issn.0258-7998.174463
Author: Zhang Zhenning,Li Zheng,Zheng Junwei
Author Affilications:College of Computer Science,Sichuan University,Chengdu 610065,China
DOI:10.16157/j.issn.0258-7998.173798
Author:Yang Jie,Chen Xiyou,Li Guanlin,Wu Maopeng
Author Affilications:School of Electrical Engineering,Dalian University of Technology,Dalian 116024,China
DOI:10.16157/j.issn.0258-7998.173562
Author:Yang Xiaoguang1,2,Gao Linghu1,2,Xu Linliang1,2,Liu Weimin1,2,Jin Shuangshuang1,2
Author Affilications:1.State Key Laboratory of Reliability and Intelligence of Electrical Equipment,Hebei University of Technology, Tianjin 300130,China; 2.Key Laboratory of Electromagnetic Field and Electrical Apparatus Reliability of Hebei Province,Hebei University of Technology, Tianjin,300130,China
DOI:10.16157/j.issn.0258-7998.173769
Author:Hua Zaijun,Huang Fengchen,Chen Zhao,Li Jianni
Author Affilications:College of Computer and Information,Hohai University,Nanjing 211100,China
DOI:10.16157/j.issn.0258-7998.173841
Author:Liu Xinrui1,Lin Jingli1,Guo Xiaoying2,Zhang Yufeng1,Wan Min3,Cao Taiqiang1
Author Affilications:1.School of Electric Information,Xihua University,Chengdu 610039,China; 2.School of Information and Electric Engineering,Panzhihua University,Panzhihua 617000,China; 3.School of Science,Xihua University,Chengdu 610039,China
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