DOI:10.16157/j.issn.0258-7998.191062
Author:Li Yaning1,Zhan Tongjie2,Liu Ying1,Yin Yangpeng1,Lou Zhaohui1,Yang Yanran1
Author Affilications:1.China Academy of Information and Communications Technology, The Research Institute of Informatization and Industrialization Integration,Beijing 100191,China; 2.College of Electrical and Information Engineering,Hunan University,Changsha 410012,China
DOI:10.16157/j.issn.0258-7998.191035
Author:Deng Rendi,Liu Xiong,Wu Chun
Author Affilications:School of Defense Science and Technology,Southwest University of Science and Technology,Mianyang 621000,China
DOI:10.16157/j.issn.0258-7998.191208
Author:Liu Jianbing
Author Affilications:Beijing VRV Software Corporation Limited,Beijing 100044,China
DOI:10.16157/j.issn.0258-7998.191040
Author:Li Shiqi,Han Qingmin,Du Junzhao,Li Mojun
Author Affilications:National Computer System Engineering Research Institute of China,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.191162
Author:Zhang Lei,Xia Xu,Zhu Xuetian
Author Affilications:China Telecom Intelligent Network and Terminal Research Institute,Beijing 102209,China
DOI:10.16157/j.issn.0258-7998.191153
Author:Yang Xin1,Shi Xiaohou1,Shen Yun1,Xiong Xiaomin1,Duan Huibin1,Zhu Xuetian2
Author Affilications:1.China Telecom Strategy and Innovation Research Institute,Beijing 102209,China; 2.China Telecom Intelligent Network and Terminal Research Institute,Beijing 102209,China
DOI:10.16157/j.issn.0258-7998.191220
Author:Zhou Wei1,Zhu Xuetian2,Xia Xu2
Author Affilications:1.Datang Mobile Communications Equipment Co.,Ltd.,Beijing 100083,China; 2.China Telecom Intelligent Network and Terminal Research Institute,Beijing 1002209,China
DOI:10.16157/j.issn.0258-7998.191104
Author:Li Kunlun1,Li Kai1,Zhu Xuetian2
Author Affilications:1.China Telecom Corporation Limited Strategy Innovate Research Institute,Beijing 102209,China; 2.China Telecom Corporation Limited Intelligence Network and Terminal Research Institute,Beijing 102209,China
DOI:10.16157/j.issn.0258-7998.190818
Author:Chen Yuxiang1,2,Hao Yao1,2,Zhao Yue1,2,Cheng Lin3,Wu Kaijun1,2,Liao Sijie1
Author Affilications:1.No.30 Institute,China Electronics Technology Group Corporation,Chengdu 610041,China; 2.Science and Technology on Communication Security Laboratory,Chengdu 610041,China; 3.China Information Technology Security Evaluation Center,Beijing 100085,China
DOI:10.16157/j.issn.0258-7998.190668
Author:Zhang Yongchao1,Li Jincai1,Zhao Luhuai2
Author Affilications:1.Xi′an Jiaotong University City College,Xi′an 710018,China; 2.Electrical College,Xi′an Jiaotong University,Xi′an 710048,China
DOI:10.16157/j.issn.0258-7998.191130
Author:Yang Wei
Author Affilications:IT Department,State Grid Customer Service Center,Tianjin 300000,China
DOI:10.16157/j.issn.0258-7998.190639
Author:Zhang Lin,Yang Fengshang
Author Affilications:School of Opto-Electronic and Communication Engineering,Xiamen University of Technology,Xiamen 361024,China
DOI:10.16157/j.issn.0258-7998.190885
Author:Cai Haotian,Chen Xing
Author Affilications:College of Electronics and Information Engineering,Sichuan University,Chengdu 610065,China
DOI:10.16157/j.issn.0258-7998.190802
Author:Xue Haiwei1,Zhang Menghua1,Yang Guang′an2
Author Affilications:1.The 58th Institute of China Electronics Technology Group Corp.,Wuxi 214035,China; 2.Southeast University,Nanjing 210001,China
DOI:10.16157/j.issn.0258-7998.190876
Author:Xu Jinfu,Dong Yongxing,Li Junwei
Author Affilications:The PLA Information Engineering University,Zhengzhou 450001,China
DOI:10.16157/j.issn.0258-7998.190903
Author:Ruan Yi,Wang Jia,Zhang Bingbing
Author Affilications:Shanghai Belling Corp.,Ltd.,Shanghai 200233,China
DOI:10.16157/j.issn.0258-7998.190913
Author:Ou Lixiang,Li Sizhen,Yu Kai,Zhang Guohao
Author Affilications:School of Information Engineering,Guangdong University of Technology,Guangzhou 510006,China
DOI:10.16157/j.issn.0258-7998.190688
Author:Tian Rui1,2,Sun Difei1
Author Affilications:1.Department of Basic Science,Henan Polytechnic Institute,Nanyang 473000,China; 2.Institute of Physical Science and Engineering,Zhengzhou University,Zhengzhou 450001,China
DOI:10.16157/j.issn.0258-7998.190691
Author:Wu Yuhan,Wang Yunbao,Xue Qingquan,Qie Xiaobin,Li Zhiqiang
Author Affilications:Beijing Institute of Space Launch Technology,Beijing 100076,China
DOI:10.16157/j.issn.0258-7998.190638
Author:Ren Yongfeng,Huang Qiaofeng,Jia Xingzhong,Xie Lingfang
Author Affilications:National Key Laboratory for Electronic Measurement and Technology,North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.190760
Author:Zhou Hanbing,Li Mingwei,Zhang Chuanyuan,Qian Zhankui,Xie Shiyin,Liang Wei
Author Affilications:Beijing Guodiantong Network Technology Co.,Ltd.,Beijing 100081,China
DOI:10.16157/j.issn.0258-7998.190631
Author:Zhou Ning,Hu Tao,Hu Yuxiang,Wang Binqiang
Author Affilications:PLA Strategic Support Force Information Engineering University,Zhengzhou 450002,China
DOI:10.16157/j.issn.0258-7998.190704
Author:Chen Jicheng,Chen Hongchang,Li Shaomei
Author Affilications:China National Digital Switching System Engineering & Technological R & D Center(NDSC),Zhengzhou 450002,China
DOI:10.16157/j.issn.0258-7998.190733
Author:Zhou Weiyi
Author Affilications:College of Computer Science and Engineering,Jiangsu University of Science and Technology,Zhenjiang 212000,China
DOI:10.16157/j.issn.0258-7998.190731
Author:Zhang Junyong,Liu Ronglin,Li Yihan
Author Affilications:Tianjin 712 Communication & Broadcasting Co.,Ltd.,Tianjin 300140,China
DOI:10.16157/j.issn.0258-7998.190831
Author:Li Haiting,Hu Xin,Zeng Shuang,She Junchao,Lu Qiang,Sui Jun
Author Affilications:Southwest Institute of Technical Physics,Chengdu 610041,China
DOI:10.16157/j.issn.0258-7998.190825
Author:Song Jinhua,Wu Lin,Xie Qishao,Lu Zhirong
Author Affilications:Tongfang Electronic Science and Technology Co.,Ltd.,Jiujiang 332002,China
DOI:10.16157/j.issn.0258-7998.190887
Author:Wang Shaobin,Su Shujing,Ren Ting
Author Affilications:Key Laboratory of Instrumentation Science and Dynamic Measurement,North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.190897
Author:Ding Jie,Zhao Shiwei,Wen Chuqiang
Author Affilications:Electric Power College,South China University of Technology,Guangzhou 510640,China
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