DOI:10.16157/j.issn.0258-7998.191360
Author:Li Hongyi,Zhao Yirong,Li Jinyan,Zhu Xuetian
Author Affilications:China Telecom Corporation Limited Technology Innovation Center,Beijing 102209,China
DOI:10.16157/j.issn.0258-7998.191355
Author:Xu Dan1,Wang Haining1,Yuan Xiangfeng1,Zhu Xuetian2
Author Affilications:1.China Telecom Research Institute AI R & D Center,Beijing 102209,China; 2.China Telecom Intelligent Network and Terminal Research Institute,Beijing 102209,China
DOI:10.16157/j.issn.0258-7998.191362
Author:Zhang Lei,Zhu Xuetian,Li Jinyan
Author Affilications:China Telecom Corporation Limited Technology Innovation Center,Beijing 102209,China
DOI:10.16157/j.issn.0258-7998.191131
Author:Xia Xu1,Yuan Xin2,Liang Yun3,Zhang Lei1
Author Affilications:1.China Telecom Intelligent Networks and Devices Research Institute,Beijing 102209,China; 2.Chinese Enterprises Elephant Financial Services Co.,Ltd.,Beijing 100089,China; 3.Global Energy Interconnection Research Institute Co.,Ltd.,Beijing 102200,China
DOI:10.16157/j.issn.0258-7998.190961
Author:Wu Wenjun,Lan Xuemei
Author Affilications:School of Automation and Information Engineering,Xi′an University of Technology,Xi′an 710048,China
DOI:10.16157/j.issn.0258-7998.191013
Author:Gong Yonggang,Pei Chenchen,Lian Xiaoqin,Wang Jiaxin
Author Affilications:College of Computer and Information Engineering Beijing Key Laboratory of Food Safety Big Data Technology, Beijing Technology and Business University,Beijing 100048,China
DOI:10.16157/j.issn.0258-7998.190870
Author:Wang Jingbo,Meng Lingjun
Author Affilications:National Key Laboratory for Electronic Measurement Technology,North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.190977
Author:Xie Heling,Jin Jianhui,Xie Jiaming,Wan Zhou
Author Affilications:School of Information Engineering and Automation,Kunming University of Science and Technology,Kunming 650504,China
DOI:10.16157/j.issn.0258-7998.190920
Author:Huo Dexuan,Zhang Guojun
Author Affilications:State Key Laboratory of Electronic Thin Films and Integrated Devices,University of Electronic Science and Technology of China, Chengdu 610054,China
DOI:10.16157/j.issn.0258-7998.191092
Author:Gao Yuhong,Li Junlong
Author Affilications:Lvliang University,Lvliang 033000,China
DOI:10.16157/j.issn.0258-7998.190954
Author:Ding Kun1,Tian Ruizhi1,Wang Tao1,2,Wang Peng1,Yi Maoxiang1,Zhang Qingzhe1
Author Affilications:1.National Model Institute of Microelectronics,School of Electronic Science and Applied Physics,Hefei University of Technology, Hefei 230009,China; 2.School of Information Science and Technology,University of Science and Technology of China,Hefei 230027,China
DOI:10.16157/j.issn.0258-7998.191070
Author:Wang Chunlin,Tan Kejun
Author Affilications:Information Science and Technology College,Dalian Maritime University,Dalian 116026,China
DOI:10.16157/j.issn.0258-7998.190715
Author:Ren Yongfeng,Zhang Zefang,Wang Guozhong,Zhang Kaihua
Author Affilications:National Key Laboratory for Electronic Measurement Technology,North University of China,Taiyuan 030051,Shanxi
DOI:10.16157/j.issn.0258-7998.190812
Author:Li Dongming1,Wang Xiang2,3,Xu Junfeng4,Chai Xiaopeng1,2,Hu Yabin1,Wang Yongtao1
Author Affilications:1.School of Automation,China University of Geosciences,Wuhan 430074,China; 2.China Railway Bridge Science Research Institude Ltd.,Wuhan 430034,China; 3.State Key Laboratory of Bridge Structure Health and Safety,Wuhan 430034,China; 4.The 722 Institute of China Shipbuilding Industry Corporation(CSIC),Wuhan 430074,China
DOI:10.16157/j.issn.0258-7998.190836
Author:Kong Ming1,Dong Ping1,Shan Liang2,Zhao Jun1
Author Affilications:1.College of Metrology & Measurement Engineering,China Jiliang University,Hangzhou 310018,China; 2.College of Information Engineering,China Jiliang University,Hangzhou 310018,China
DOI:10.16157/j.issn.0258-7998.190863
Author:Liu Qihua1,Zhang Shijie2
Author Affilications:1.State Key Laboratory of Precision Measuring Technology and Instruments,Tianjin University,Tianjin 300072,China; 2.Tianjin Research Institute for Water Transport Engineering,M.O.T,Tianjin 300456,China
DOI:10.16157/j.issn.0258-7998.190966
Author:Zeng Ke,Yu Simin,Hu Yingchun,Zhang Zeqing
Author Affilications:College of Automation, Guangdong University of Technology,Guangzhou 510006,China
DOI:10.16157/j.issn.0258-7998.191001
Author:Tang Tao1,Ma Huan2,Wu Zhidong1
Author Affilications:1.Institute of Engineering Information Engineering University,Zhengzhou 450001,China; 2.Tongfang Electronic Technology Co.,Ltd.,Jiujiang 332007,China
DOI:10.16157/j.issn.0258-7998.190962
Author:Wu Xiaochao,Chen Hong
Author Affilications:School of Instrument and Electronics,North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.190761
Author:Ren Lijuan,Lu Jun,Guo Wei
Author Affilications:Software Engineering Institute,Chengdu University of Information Technology,Chengdu 610225,China
DOI:10.16157/j.issn.0258-7998.190773
Author:Chen Yan1,Chen Yalin2,Zheng Jun1
Author Affilications:1.School of Mathematics and Information Science,Guiyang University,Guiyang 550002,China; 2.School of Management Science,Nanjing University of Finance & Economics,Nanjing 210046,China
DOI:10.16157/j.issn.0258-7998.190981
Author:Yu Meixin,Shi Wei,Jiang Long,Wang Hao
Author Affilications:Institute of Mechanical Engineering,Jiangsu Polytechnic,Changzhou 213000,China
DOI:10.16157/j.issn.0258-7998.190935
Author:Wang Xingtao,Zhao Xunwei,Fu Haixuan,Li Jin′an,Ding Gaoquan,Wu Qing,Li Wenjing
Author Affilications:State Grid Information & Telecommunication Group Co.,Ltd.,Beijing 102211,China
DOI:10.16157/j.issn.0258-7998.190930
Author:Jin Shanshan1,2,Zhang Donglai3,Wang Chao2,Wang Zicai1,Zhang Hua2
Author Affilications:1.Aerospace Department,Harbin Institute of Technology,Harbin 150001,China; 2.Power Electronics Department,Shenzhen Academy of Aerospace Technology,Shenzhen 518057,China; 3.School of Mechanical Engineer and Automation,Harbin Institute of Technology(Shenzhen),Shenzhen 518055,China
DOI:10.16157/j.issn.0258-7998.191004
Author:Jiang Rundong,Yao Jinjie,Wang Min,Wang Ruirui
Author Affilications:Shanxi Key Laboratory of Signal Capturing & Process,North University of China,Taiyuan 030051,China
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