DOI:10.16157/j.issn.0258-7998.200283
Author:Yang Xin1,2,Li Linqian3,Wei Bing3
Author Affilications:1.College of Big Data and Information Engineering,Guizhou University,Guiyang 550025,China; 2.Engineering Research Center of Semiconductor Power Device Reliability,Ministry of Education,Guiyang 550025,China; 3.School of Physics and Optoelectronic Engineering,Xidian University,Xi′an 710071,China
DOI:10.16157/j.issn.0258-7998.200264
Author:Li He,Liang Kun,Liu Min,He Ying,Zhang Hui
Author Affilications:China Electronics Technology Group Corporation No.58 Research Institute,Wuxi 214072,China
DOI:10.16157/j.issn.0258-7998.200302
Author:Peng Lin,Li Jiajin,Liang Zhaoming,Zhang Guohao
Author Affilications:School of Information Engineering,Guangdong University of Technology,Guangzhou 510006,China
DOI:10.16157/j.issn.0258-7998.200135
Author:Li Xiaofeng,Peng Lin
Author Affilications:School of Information and Communication,Guilin University of Electronic Technology,Guilin 541004,China
DOI:10.16157/j.issn.0258-7998.191221
Author:Dong Liang,Wei Ming
Author Affilications:No.36 Research Institute of CETC,Jiaxing 314033,China
DOI:10.16157/j.issn.0258-7998.200582
Author:Wang Yongsen1,Jin Chao2,Han Lei2
Author Affilications:1.China Telecom Corporation Limited Zhejiang Branch,Hangzhou 310000,China; 2.Huaxin Consulting Design & Research Institute Co.,Ltd.,Hangzhou 310026,China
DOI:10.16157/j.issn.0258-7998.200584
Author:Li Yifeng,Jin Chao,Tao Xin
Author Affilications:Huaxin Consulting Design & Research Institute Co.,Ltd.,Hangzhou 310026,China
DOI:10.16157/j.issn.0258-7998.200188
Author:Chen Yu,Shen Jianjun
Author Affilications:China Telecom Research Institute,Guangzhou 510630,China
DOI:10.16157/j.issn.0258-7998.200478
Author:Tan Rumeng1,Xiong Shangkun1,Wu Tong2
Author Affilications:1.Mobile Communication Institute,China Telecom Research Institute,Guangzhou 510630,China; 2.Center for Advanced Metering Infrastructure,National Institute of Metrology,Beijing 100029,China
DOI:10.16157/j.issn.0258-7998.200583
Author:Jin Chao,Xu Xisheng
Author Affilications:Huaxin Consulting Design & Research Institute Co.,Ltd.,Hangzhou 310026,China
DOI:10.16157/j.issn.0258-7998.200306
Author:Ge Wenshuang,Zheng Hefang,Liu Tianlong,Ma Zhao,Zhang Ruiquan,Wu Chengsheng
Author Affilications:The 6th Research Institute of China Electronics Corporation,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.209801
Author:Bian Shaoxian1,Micheal Feng1,David Yue1,Luan Xiaokun1,Cai Zhun2,Jiang Jianfeng1
Author Affilications:1.Tianjin Phytium Technology Co.,Ltd.,Changsha 410000,China;2.Cadence Design Systems,Inc.,Shanghai 202014,China
DOI:10.16157/j.issn.0258-7998.209803
Author:Zeng Jinwei
Author Affilications:Sanechips Technology Co.,Ltd.,Chengdu 610041,China
DOI:10.16157/j.issn.0258-7998.209802
Author:Zhang Yanwei1,Si Qiang1,Lv Zhijun2
Author Affilications:1.Beijing Zhaoxin Electronic Technology Co.,Ltd.,Beijing 100094,China 2.Cadence Design Systems,Inc.,Beijing 100013,China
DOI:10.16157/j.issn.0258-7998.209804
Author:Lin Kaizhi,Zong Yanyan,Sun Long,Tian Minzheng,Ma Junchi
Author Affilications:Inspur Electronic Information Industry Co.,Ltd.,Jinan 250101,China
DOI:10.16157/j.issn.0258-7998.209805
Author:Fan Junjian1,Chao Zhanghu1,Yang Qingna1,Liu Qi1,Zhu Hong1,Shan Jianqi2
Author Affilications:1.Tianjin Phytium Technology Co.,Ltd.,Tianjin 102209,China;2.Cadence,Shenzhen 518040,China
DOI:10.16157/j.issn.0258-7998.200189
Author:Hao Qiangyu,Wang Riyan,Zhou Lingli,He Hongyin
Author Affilications:Guangzhou Runxin Information Technology Co.,Ltd.,Guangzhou 510700,China
DOI:10.16157/j.issn.0258-7998.209806
Author:Hao Qiang
Author Affilications:Shanghai Hi-Performance IC Design Center,Shanghai 201204,China
DOI:10.16157/j.issn.0258-7998.200043
Author:Lv Sihong,Feng Quanyuan
Author Affilications:Institute of Microelectronics,Southwest Jiaotong University,Chengdu 611756,China
DOI:10.16157/j.issn.0258-7998.191125
Author:Wen Ke,Zhu Zheng,Ma Minshu
Author Affilications:Sichuan Institute of Solid-State Circuits, China Electronics Technology Group Corp,Chongqing 400060,China
DOI:10.16157/j.issn.0258-7998.191343
Author:He Linfei,Li Xiaofei,Han Junbo
Author Affilications:Tianjin Xunlian Technology Co.,Ltd.,Tianjin 300000,China
DOI:10.16157/j.issn.0258-7998.200113
Author:Yan Wei,Shen Bin,Liu Xiaoxiao
Author Affilications:School of Communication and Information Engineering,Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.191316
Author:Chen Xi1,2,Jiang Yaguang2,Li Jianbin3,Yan Jingchen3,Liu Shuyuan4,Li Kunchang3
Author Affilications:1.School of Software & Microelectronics,Peking University,Beijing 102600,China; 2.Department of CSTC in Network Security Inspection and Evaluation of Industrial Control System,Beijing 100044,China; 3.School of Control and Computer Engineering,North China Electric Power University,Beijing 100026,China; 4.Beijing Huadian TianRen Electric Power Control Technology Company Limited,Beijing 100039,China
DOI:10.16157/j.issn.0258-7998.191225
Author:Chen Bingrong1,Zhang Yanhua1,Sun Enchang1,Li Meng1,Yang Kui2
Author Affilications:1.Faculty of Information Technology,Beijing University of Technology,Beijing 100124,China; 2.Unicom Systems Integration Co.,Ltd.,Beijing 100176,China
DOI:10.16157/j.issn.0258-7998.190737
Author:He Jia1,Xi Zhenghao1,2,Kan Xiu1
Author Affilications:1.School of Electronic and Electrical Engineering,Shanghai University of Engineering Science,Shanghai 201620,China; 2.State Key Laboratory of Intelligent Technology and Systems,Department of Computer Science,Tsinghua University, Beijing 100091,China
DOI:10.16157/j.issn.0258-7998.191324
Author:Huang Mingxiang
Author Affilications:State Grid Fujian Electric Power Co.,LTD.,Construction Branch,Fuzhou 350012,China
DOI:10.16157/j.issn.0258-7998.200290
Author:Qian Hongwen,Wang Yi,Liu Hui
Author Affilications:China Electronics Technology Group Corporation No.58 Research Institute,Wuxi 214072,China
DOI:10.16157/j.issn.0258-7998.200027
Author:Chen Xuefei,Zhang Hongsheng,Wang Guoyu
Author Affilications:College of Electronic Engineering,Chongqing University of Posts and Telecommunications,Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.200341
Author:Wang Songming
Author Affilications:Southwest China Institute of Electronic Technology,Chengdu 610036,China
DOI:10.16157/j.issn.0258-7998.200259
Author:Hao Guofeng,Zhu Chen,Gu Xiaoxue
Author Affilications:China Electronics Technology Group Corporation No.58 Research Institute,Wuxi 214072,China
Information Flow and Energy Flow in Industrial Digital Transformation
Special Antenna and Radio Frequency Front End
Radar Target Tracking Technology
Key Technologies of 5G-A and 6G
Key Technologies of 5G and Its Evolution
Key Technologies of 5G and Its Evolution
Processing and Application of Marine Target Characteristic Data
Antenna Technology and Its Applications
5G Vertical Industry Application
Microelectronics in Medical and Healthcare
Application of Edge Computing in IIoT
Deep Learning and Image Recognization
6G Microwave Millimeter-wave Technology
Radar Processing Technology and Evaluation
Space-Ground Integrated Technology
5G Vertical Industry Application
FPGA and Artificial Intelligence
Innovation and Application of PKS System
5G Network Construction and Optimization
Network and Business Requirements for 6G
5G and Intelligent Transportation
5G R16 Core Network Evolution Technology
Satellite Nevigation Technology
5G Wireless Network Evolution Technology
5G Network Planning Technology
5G Co-construction and Sharing Technology
5G and Emergency Communication
5G Slicing Technology and Its Applications
5G Terminal Key Realization Technology
5G and Artificial Intelligence
Terahertz Technology and Its Application
Signal and Information Processing
Internet of Things and the Industrial Big Data
Electronic Techniques of UAV System
Aerospace Electronic Technology
Robot and Industrial Automation
ADAS Technique and Its Implementation
2016 IEEE International Conference on Integrated Circuits and Microsystems
Measurement and Control Technology of Bus Network
Key Techniques of 5G and Algorthm Implement