DOI:10.16157/j.issn.0258-7998.200711
Author:Lin Pingping1,Zhang Guanghui2,Li Xiao1
Author Affilications:1.China Telecom Research Institute,Beijing 102209,China;2.China Telecom Group Co.,Ltd.,Beijing 100033,China
DOI:10.16157/j.issn.0258-7998.200738
Author:Zhou Yuetian,Xu Xiaohang,Xie Weiliang,Chen Jiangang,Li Zhijun,Li Xiao
Author Affilications:China Telecom Intelligent Network and Terminal Research Institute,Beijing 102209,China
DOI:10.16157/j.issn.0258-7998.200466
Author:Dong Qiuli1,Li Jing1,Han Xiao1,Hu Haiyan2
Author Affilications:1.Network Technology Research Institute,China United Network Communications Corporation Limited,Beijing 100048,China; 2.Fujian Branch, China United Network Communications Corporation Limited,Xiamen 361000,China
DOI:10.16157/j.issn.0258-7998.200712
Author:Guo Han,Zhao Xiaoyin,Xie Weiliang
Author Affilications:China Telecom Research Institute,Beijing 102209,China
DOI:10.16157/j.issn.0258-7998.200716
Author:Hou Jia1,Hu Chunlei1,Li Peng2,Lu Na2,Xie Weiliang1,Zhou Yuetian1
Author Affilications:1.China Telecom Research Institute,Beijing 102209,China;2.China Telecom Group Co.,Ltd.,Beijing 100033,China
DOI:10.16157/j.issn.0258-7998.200332
Author:Li Dan1,Zhang Xiao2
Author Affilications:1.Southwest Institute of Electronic Technology,Chengdu 610036,China; 2.The Third Military Representative Office of the Air Force Equipment Department in Chengdu,Chengdu 610036,China
DOI:10.16157/j.issn.0258-7998.200067
Author:Wang Lin,Huang Sanli
Author Affilications:School of Automation and Information Engineering,Xi′an University of Technology,Xi′an 710048,China
DOI:10.16157/j.issn.0258-7998.200109
Author:Liu Xin,Zhang Canming
Author Affilications:Anhui Academy of Coal Science,Hefei 230001,China
DOI:10.16157/j.issn.0258-7998.200051
Author:Liu Jia,An Henan,Li Wei,Zhang Changlin,Tu Zhiwei
Author Affilications:College of Electronics and Information Engineering,Shenzhen University,Shenzhen 518061,China
DOI:10.16157/j.issn.0258-7998.200299
Author:Du Peide,Li Xiaolu,Zhu Wenjin,Zhou Shengtao,Chu Zhujun,Li Yaqing
Author Affilications:North Night Vision Technology Co.,Ltd.,Kunming 650217,China
DOI:10.16157/j.issn.0258-7998.200258
Author:Tan Chuanwu,Liu Hongmei
Author Affilications:Department of Communication and Signal,Hunan Railway Professional Technology College,Zhuzhou 412001,China
DOI:10.16157/j.issn.0258-7998.191377
Author:Fan Jing,Wu Hui
Author Affilications:The 6th Research Institute of China Electronics Corporation,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.191295
Author:Xu Hongwei,Qin Huibin,Zhou Jijun
Author Affilications:Institute of New Electron Device & Application,Hangzhou Dianzi University,Hangzhou 310000,China
DOI:10.16157/j.issn.0258-7998.191163
Author:Yang Fan1,2,Hu Guanghao1
Author Affilications:1.School of Electrical and Information Engineering,Wuhan Institute of Technology,Wuhan 430205,China; 2.Hubei Video Image and HD Projections Engineering Research Center,Wuhan 430205,China
DOI:10.16157/j.issn.0258-7998.200149
Author:He Wei,Hu Anqi,Tian Zengshan,Li Ze
Author Affilications:Chongqing Key Laboratory of Mobile Communications Technology,Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.200203
Author:Cao Rong1,2,Zhao Dezheng2,Guo Jia2,Li Jiaxin1
Author Affilications:1.National Computer System Engineering Research Institute of China,Beijing 100083,China; 2.Intelligence Technology of CEC Co.,Ltd.,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.191313
Author:Liu Hong,Liu Jin,Yuan Huifeng,Liu Xuefei
Author Affilications:The 6th Research Institute of China Electronics Corporation,Beijing 102209,China
DOI:10.16157/j.issn.0258-7998.191282
Author:Meng Hao1,2,Li Zisheng1,2
Author Affilications:1.School of Manufacturing Science and Engineering,Southwest University of Science and Technology,Mianyang 621010,China; 2.Key Laboratory of Testing Technology for Manufacturing Process,Southwest University of Science and Technology, Mianyang 621010,China
DOI:10.16157/j.issn.0258-7998.190998
Author:Chen Yuening,Guo Shizeng,Zhang Jiayan,Pu Yiming
Author Affilications:School of Electronic and Information Engineering,Harbin Institute of Technology,Harbin 150001,China
DOI:10.16157/j.issn.0258-7998.191335
Author:Qiu Kai1,Si Pengbo1,Zeng Tao2,Li Meng1,Zhang Yanhua1
Author Affilications:1.Faculty of Information Technology,Beijing University of Technology,Beijing 100124,China; 2.China Construction Science & Technology Co.,Ltd.,Beijing 100070,China
DOI:10.16157/j.issn.0258-7998.191290
Author:Dai Shaosheng,Li Jinxin
Author Affilications:College of Communication and Information Engineering,Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.200178
Author:Zou Fenghua,Wang Zhu,Qian Qiufei,Xu Yueming,Dong Junqi
Author Affilications:School of Physics and Technology,Wuhan University,Wuhan 430072,China
DOI:10.16157/j.issn.0258-7998.200225
Author:Chen Sitao1,Luo Suyun1,Wu Changshui1,Cong Tianzeng2
Author Affilications:1.School of Mechanical & Vehicle Engineering,Shanghai University of Engineering Science,Shanghai 201620,China; 2.Weifang Litro Electrical Technology Co.,Ltd.,Weifang 261000,China
DOI:10.16157/j.issn.0258-7998.200289
Author:Yang Chunling,Zuo Ling
Author Affilications:Electrical Engineering and Automation School,Harbin Institute of Technology,Harbin 150001,China
DOI:10.16157/j.issn.0258-7998.200032
Author:Liu Yongbing,He Wei,Zhang Ling
Author Affilications:School of Microelectronics and Communication Engineering,Chongqing University,Chongqing 400000,China
DOI:10.16157/j.issn.0258-7998.200247
Author:Cui Junguo
Author Affilications:Wuhu Risingchip Electronic Technology,Co.,Ltd,Shanghai 201209,China
DOI:10.16157/j.issn.0258-7998.200240
Author:Zhang Hongqiang,Wang Yong,Liu Naian
Author Affilications:School of Telecommunications Engineering,Xidian University,Xi′an 710126,China
DOI:10.16157/j.issn.0258-7998.200322
Author:Jiao Yongbin,Qin Huibin,Hua Yongzhu,Zhou Jijun
Author Affilications:Institute of New Electron Device & Application,Hangzhou Dianzi University,Hangzhou 310018,China
DOI:10.16157/j.issn.0258-7998.200527
Author:Chen Shanzhuo1,Song Yang2,Gao Yachen1
Author Affilications:1.College of Electronic Engineering,Heilongjiang University,Harbin 150080,China; 2.Department of Information Engineering,Chaoyang Teachers′ College,Chaoyang 122000,China
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