DOI:10.16157/j.issn.0258-7998.200459
Author:Wang Jianzhong
Author Affilications:Artificial Intelligence Department,Chongqing Youth Vocational & Technical College,Chongqing 400712,China
DOI:10.16157/j.issn.0258-7998.200422
Author:Zhu Feng1,Yin Hao1,Bai Haitong2,Zhou Gan1
Author Affilications:1.National Computer System Engineering Research Institute of China,Beijing 100083,China; 2.The Staff Department of People′s Liberation Army,Beijing 100044,China
DOI:10.16157/j.issn.0258-7998.200792
Author:Tian Xiang1,Zhu Yinxia1,Shi Yang2,Hu Jing1
Author Affilications:1.College of Communication Engineering,Army Engineering University of PLA,Nanjing 210007,China; 2.PLA 31121 Unit,Nanjing 210000,China
DOI:10.16157/j.issn.0258-7998.200220
Author:He Xulei1,2,Liu Cheng3,Wang Wei3,Li Jian1,Liu Xueyong1,Yang Ying1,Ba Xiaohui1,2,Chen Jie1
Author Affilications:1.Institute of Microelectronics of Chinese Academy of Sciences,Beijing 100029,China; 2.University of Chinese Academy of Sciences,Beijing 100049,China;3.China Satellite Navigation Office,Beijing 100094,China
DOI:10.16157/j.issn.0258-7998.200219
Author:Liu Xinhua1,Shang Junna1,Shi Huli2
Author Affilications:1.College of Telecommunication Engineering,Hangzhou Dianzi University,Hangzhou 310018,China; 2.National Astronomical Observatories of Chinese Academy of Sciences,Beijing 100012,China
DOI:10.16157/j.issn.0258-7998.200993
Author:Ma Ruitao,Wang Guangquan,Ren Chi,Mu Jia
Author Affilications:China Unicom Research Institute,Beijing 100048,China
DOI:10.16157/j.issn.0258-7998.200986
Author:Nie Heng,Xing Yanxia
Author Affilications:China Telecom Corporation Limited Research Institute,Beijing 102209,China
DOI:10.16157/j.issn.0258-7998.201010
Author:Xia Xu
Author Affilications:China Telecom Research Institute,Beijing 102209,China
DOI:10.16157/j.issn.0258-7998.200907
Author:Wang Heng
Author Affilications:China Telecommunication Corporation Research Institute,Beijing 102209,China
DOI:10.16157/j.issn.0258-7998.200991
Author:Xing Yanxia,Nie Heng
Author Affilications:China Telecom Corporation Limited Research Institute,Beijing 102209,China
DOI:10.16157/j.issn.0258-7998.200489
Author:Chen Yujie
Author Affilications:School of Information Engineering,Engineering University of CAPF,Xi′an 710086,China
DOI:10.16157/j.issn.0258-7998.200327
Author:Xia Ding,Xu Wentao
Author Affilications:School of Science,Nanjing University of Aeronautics and Astronautics,Nanjing 211106,China
DOI:10.16157/j.issn.0258-7998.200121
Author:Li Lize,Zhang Chenjie,Yang Xiaohui,Sun Wenbin,Guo Bin
Author Affilications:School of Electronics and Information Engineering, Changchun University of Science and Technology,Changchun 130022,China
DOI:10.16157/j.issn.0258-7998.200118
Author:Xiang Cheng,Yu Feng,Peng Zicheng,Liu Yuxuan
Author Affilications:Swan College,Central South University of Forestory and Technology,Changsha 410211,China
DOI:10.16157/j.issn.0258-7998.200082
Author:Li Qiang1,Wang Xing1,Zhang Shuai2
Author Affilications:1.College of Automation and Information Engineering,Xi′an University of Technology,Xi′an 710048,China; 2.Xi′an Dayi Electronic Technology Co.,Ltd.,Xi′an 710100,China
DOI:10.16157/j.issn.0258-7998.200317
Author:Zhang Guanghai,Wang Lixin,Chen Maoyang
Author Affilications:School of Communication Engineering,Hangzhou Dianzi University,Hangzhou 310018,China
DOI:10.16157/j.issn.0258-7998.200355
Author:Ni Lei,Li Xiaoyu,Zhang Yong
Author Affilications:School of Network & Communication Engineering,Chengdu Technological University,Chengdu 610400,China
DOI:10.16157/j.issn.0258-7998.200148
Author:Fu Yaling1,Yang Wenzhong1,2,Woxur Silamu1,Yang Mengmeng1,Liang Fan1
Author Affilications:1.College of Information Science and Engineering,Xinjiang University,Urumqi 830046,China; 2.National Engineering Laboratory of Social Security Risk Perception and Prevention and Control of Big Data Application, Chinese Academy of Electronic Sciences,Urumqi 830000,China
DOI:10.16157/j.issn.0258-7998.200117
Author:Wang Qiuting1,Qi Wei1,Wo Qizhong2
Author Affilications:1.Zhejiang University City College,Hangzhou 310015,China; 2.Institute of Measurement for Quality and Technique Supervision,Hangzhou 311400,China
DOI:10.16157/j.issn.0258-7998.200096
Author:Xiong Rendu1,Yang Jiajia1,Zhu Guangyu1,Tang Qiu1,Sui Ran2
Author Affilications:1.North China Institute of Computer Systems Engineering,Beijing 100083,China; 2.Information Center,Logistics Support Department,CMC,Beijing 100842,China
DOI:10.16157/j.issn.0258-7998.200036
Author:Xu Shaobo1,Li Xin1,Liu Haitao1,Wei Li2
Author Affilications:1.State Network Shiyan Power Supply Company,Shiyan 442000,China;2.Wuhan Institute of Technology,Wuhan 430070,China
DOI:10.16157/j.issn.0258-7998.200419
Author:Chen Xiaoyu,Ye Jiadong
Author Affilications:College of Physical Science and Technology,Central China Normal University,Wuhan 430079,China
DOI:10.16157/j.issn.0258-7998.200521
Author:Chen Xiaomin1,Xue Zhichao2,Zhang Zhilong2,Weng Feng1,Yuan Xiaokang1
Author Affilications:1.National Key Laboratory for Electronic Measurement Technology,North University of China,Taiyuan 030051,China; 2.Key Laboratory of Space Physics, China Academy of Launch Vehicle Technology,Beijing 100076,China
DOI:10.16157/j.issn.0258-7998.200517
Author:Wu Zhenwei,Li Shuanggang,Zhang Li,He Jiaojiao
Author Affilications:Shanghai Institute of Space Power-Sources,Shanghai 200245,China
DOI:10.16157/j.issn.0258-7998.200601
Author:Liu Song1,2,Wu Xianmei1,2,Kong Chao1
Author Affilications:1.State Key Laboratory on Acoustics,Institute of Acoustics,Chinese Academy of Sciences,Beijing 100190,China; 2.University of Chinese Academy of Sciences,Beijing 100049,China
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