DOI:10.16157/j.issn.0258-7998.211361
Author:Liu Qiuyan1,Li Mingxuan1,Lv Xuan2,Li Jiajun3,Zhang Zhonghao1,Li Fuchang1,Zhu Xuetian1
Author Affilications:1.China Unicom Research Institute,Beijing 100048,China; 2.China Unicom Beijing Branch,Beijing 100031,China;3.China Unicom Huasheng Co.,Ltd.,Beijing 100031,China
DOI:10.16157/j.issn.0258-7998.211374
Author:Wang Yuxin1,2,3,Zhang Xiuyin1,Xu Hanqing2,3,Tang Jie1,Chen Zhen1
Author Affilications:1.School of Electronics and Information,South China University of Technology,Guangzhou 510641,China; 2.ZTE Corporation,Shenzhen 518055,China; 3.State Key Laboratory of Mobile Network and Mobile Multimedia Technology,Shenzhen 518055,China
DOI:10.16157/j.issn.0258-7998.211392
Author:Sun Yaohua,Wang Zeyu,Yuan Shuo,Peng Mugen
Author Affilications:State Key Laboratory of Networking and Switching Technology,Beijing University of Posts and Telecommunications, Beijing 100876,China
DOI:10.16157/j.issn.0258-7998.201191
Author:Kan Yifu1,Zhang Tuo2
Author Affilications:1.Engineering College of Yanbian University,Yanbian 133002,China;2.63850 Army,Baicheng 137000,China
DOI:10.16157/j.issn.0258-7998.200841
Author:Cheng Jiafeng,Wang Hongliang
Author Affilications:National Key Laboratory for Electronic Measurement Technology,North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.200844
Author:Ni Weijian,Qin Huibin
Author Affilications:Institute of New Electronic Devices and Applications,School of Electronic Information,Hangzhou Dianzi University, Hangzhou 310018,China
DOI:10.16157/j.issn.0258-7998.200909
Author:Qin Shuang1,2,Li Jian1,Yang Ying1,Chen Jie1
Author Affilications:1.Institute of Microelectronics of the Chinese Academy of Sciences,Beijing 100029,China; 2.University of Chinese Academy of Sciences,Beijing 100049,China
DOI:10.16157/j.issn.0258-7998.200550
Author:Liu Xuefei1,Liu Hong1,Kuai Liang1,Su Shishi2,Wang Shuai1,Min Xiaoshuang1
Author Affilications:1.The 6th Research Institute of China Electronics Corporation,Beijing 102209,China; 2.CS&S Information System Engineering Co.,Ltd.,Beijing 102209,China
DOI:10.16157/j.issn.0258-7998.200607
Author:Cui Gengtao,Jiang Weihua,Tu Wei
Author Affilications:School of Electrical Information,Wuhan Institute of Technology,Wuhan 443000,China
DOI:10.16157/j.issn.0258-7998.200872
Author:Zhou Wanli1,Wang Ziqian2,Xie Wanli1,Tan Anzu1,Yu Jieyue3
Author Affilications:1.Information Management Office,Eye Hospital, Wenzhou Medical University,Wenzhou 325000,China; 2.Testing Department,Zhejiang Fangyuan Testing Group Co.,Ltd.,Hangzhou 310000,China; 3.College of Digital Media, Hangzhou University of Electronic Science and Technology,Hangzhou 310000,China
DOI:10.16157/j.issn.0258-7998.200561
Author:Su Yuhang,Chen Zhao,Zhai Nuo,Jing Shiqi
Author Affilications:School of Mechanical and Electronic Information,China University of Geosciences Wuhan,Wuhan 430000,China
DOI:10.16157/j.issn.0258-7998.200441
Author:Yang Bo,Liu Chuanli,Wu Yingdi,Cai Yafen
Author Affilications:CTTL-Systems,China Academy of Information and Communications Technology,Beijing 100045,China
DOI:10.16157/j.issn.0258-7998.200300
Author:Cai Juesong,Yan Yingjian,Zhu Chunsheng,Guo Pengfei
Author Affilications:PLA Information Engineering University,Zhengzhou 450002,China
DOI:10.16157/j.issn.0258-7998.200303
Author:Duan Ranyang,Zhou Wenhui,Wei Xiao,Wang Long
Author Affilications:National Computer System Engineering Research Institute of China,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.200294
Author:Wen Fulin1,Zhang Kai2,Pu Feng1,Tang Suli1
Author Affilications:1.Department of Electronics,Sichuan Aerospace Vocational College,Guanghan 618300,China; 2.School of Mechanical Engineering,Sichuan University,Chengdu 610065,China
DOI:10.16157/j.issn.0258-7998.200654
Author:Gao Tong1,Chen Hong1,Zhang Liang2,Wang Jinqi3
Author Affilications:1.State Key Laboratory of Electronic Test Technology,Key Lab of Instrument Science and Dynamic Measurement, North University of China,Taiyuan 030051,China; 2.College of Transportation and Logistics,Taiyuan University of Science and Technology,Taiyuan 030051,China; 3.Shanghai Radio Equipment Research Institute,Shanghai 201109,China
DOI:10.16157/j.issn.0258-7998.200944
Author:Lei Shulan,Wu Huixiang,Li Wenxue
Author Affilications:The fifty-eighth Research Institute of China Electronic Technology Group Corporation,Wuxi 214063,China
DOI:10.16157/j.issn.0258-7998.200960
Author:Mu Junjie,Yao Gang,Sun Tao
Author Affilications:Coastal Defense College,Naval Aviation University,Yantai 264001,China
DOI:10.16157/j.issn.0258-7998.200313
Author:Zhao Jiati,San Hongjun
Author Affilications:School of Mechanical and Electrical Engineering,Kunming University of Science and Technology,Kunming 650550,China
DOI:10.16157/j.issn.0258-7998.200880
Author:Shi Kaimin1,2,Zhang Donglai3,Wang Zicai2,Zhang Hua3,Lv Wenqi3
Author Affilications:1.School of Astronautics,Harbin Institute of Technology,Harbin 150001,China; 2.Shenzhen Academy of Aerospace Technology,Shenzhen 518057,China; 3.School of Mechanical Engineering and Automation,Harbin Institute of Technology(Shenzhen),Shenzhen 518055,China
DOI:10.16157/j.issn.0258-7998.200883
Author:Dai Xinhua1,Su Xinyan1,Yao Jinjie1,Jiang Rundong1,Tang Qiang2
Author Affilications:1.The Key Laboratory of Information Detection and Processing of Shanxi Province,North University of China,Taiyuan 030051,China; 2.Xi′an Institute of Electromechanical Information Technology,Xi′an 710065,China
DOI:10.16157/j.issn.0258-7998.200921
Author:Xu Wei,Pan Minghai,Zhang Yanjing
Author Affilications:School of Electronic Information Engineering,Nanjing University of Aeronautics and Astronautics,Nanjing 211106,China
DOI:10.16157/j.issn.0258-7998.200882
Author:Zeng Xiaodong
Author Affilications:The 10th Research Institute of China Electronics Technology Group Corporation,Chengdu 610036,China
DOI:10.16157/j.issn.0258-7998.200970
Author:Fan Hua1,2,Wu Wenbo2,Jiao Zhi2,Tan Chaobin2
Author Affilications:1.School of Electronic Control,University of North China Institute of Aerospace Technology,Langfang 065000,China; 2.Beijing Institute of Space Mechanics & Electricity,Beijing 100094,China
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