DOI:10.16157/j.issn.0258-7998.200783
Author:Zhao Zhangyuan,Zhu Canyan
Author Affilications:School of Rail Transportation,Soochow University,Suzhou 215000,China
DOI:10.16157/j.issn.0258-7998.200767
Author:Wang Shuo1,Ma Kui1,2,Yang Fashun1,2
Author Affilications:1.College of Big Data and Information Engineering,Guizhou University,Guiyang 550025,China; 2.Semiconductor Power Device Reliability Engineering Research Center of Ministry of Education,Guiyang 550025,China
DOI:10.16157/j.issn.0258-7998.200420
Author:Wang Kang,Huo Chaobin,Li Qingxu
Author Affilications:National Computer System Engineering Research Institute of China,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.200488
Author:Ji Caoting,Ma Weifeng,Lou Jiao,Ma Laibin
Author Affilications:School of Information and Electronic Engineering, Zhejiang University of Science and Technology, Hangzhou 310023,China
DOI:10.16157/j.issn.0258-7998.201207
Author:Zhang Xuxin,Zhang Jia,Li Xinzeng,Jin Jie
Author Affilications:College of Electronic and Electrical Engineering,Shanghai University of Engineering Science,Shanghai 201600,China
DOI:10.16157/j.issn.0258-7998.200567
Author:Cong Lin,Ma Jin,Hu Wendong,Cheng Shan,Zhang Taihui
Author Affilications:School of Aerospace Medicine,Air Force Medical University,Xi′an 710032,China
DOI:10.16157/j.issn.0258-7998.200349
Author:Cui Zhicheng,Ma Sheng
Author Affilications:Electrical Instrument Engineering Branch,Hebei Huabei Petroleum Engineering Construction Co.,Ltd.,Renqiu 062552,China
DOI:10.16157/j.issn.0258-7998.200125
Author:Xia Lunteng1,2,3,Zhang Li1,2,3,Wu Fei1,2,3
Author Affilications:1.School of Biomedical Engineering, South-Central University for Nationalities,Wuhan 430070,China; 2.Central Laboratory of Testing and Instrument Engineering, South-Central University for Nationalities,Wuhan 430070,China; 3.Key Laboratory of Brain Cognition,State Ethnic Affairs Commission,South-Central University for Nationalities,Wuhan 430070,China
DOI:10.16157/j.issn.0258-7998.201098
Author:Li Shuang1,2,3,Qiu Yifan1,2,3,Tong Feng1,2,3
Author Affilications:1.Key Laboratory of Underwater Acoustic Communication and Marine Information Technique of the Ministry of Education, Xiamen University,Xiamen 361005,China; 2.College of Earth and Ocean Sciences, Xiamen University,Xiamen 361005,China; 3.Shenzhen Research Institute,Xiamen University,Shenzhen 518000,China
DOI:10.16157/j.issn.0258-7998.200920
Author:Yang Ge1,2,Zhang Heng1
Author Affilications:1.Key Laboratory of Intelligent Multimedia Technology,Beijing Normal University(Zhuhai Campus),Zhuhai 519087,China; 2.Engineering Lab on Intelligent Perception for Internet of Things(ELIP),Shenzhen Graduate School, Peking University,Shenzhen 518055,China
DOI:10.16157/j.issn.0258-7998.200183
Author:Pan Zhiqian
Author Affilications:Internet Information Research Institute, Communication University of China,Beijing 100024,China
DOI:10.16157/j.issn.0258-7998.200224
Author:Li Xiang1,2,Te Rigen1,2,3
Author Affilications:1.Chang Guang Satellite Technology Co.,Ltd.,Changchun 130000,China; 2.Main Laboratory of Satellite Remote Sensing Technology of Jilin Province,Changchun 130000,China; 3.Changchun Institute of Optics,Fine Mechanics and Physics,Chinese Academy of Sciences,Changchun 130000,China
DOI:10.16157/j.issn.0258-7998.200209
Author:Li Jianyong,Zhao Jing,Liu Xuemei,Li Xuexia
Author Affilications:Northwestern Polytechnical University Ming De College,Xi′an 710124,China
DOI:10.16157/j.issn.0258-7998.200316
Author:Chen Xiaoshun,Wang Liangjun
Author Affilications:School of Computer Science and Telecommunication Engineering, Jiangsu University,Zhenjiang 212013,China
DOI:10.16157/j.issn.0258-7998.191345
Author:Fan Jing,Jia Xuguang
Author Affilications:National Computer System Engineering Research Institute of China,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.200806
Author:Chen Ziwei,Chen Long,Zhu Meiji,Su Luyang
Author Affilications:School of Electronic Engineering, Chengdu University of Information Technology,Chengdu 610225,China
DOI:10.16157/j.issn.0258-7998.200824
Author:Wang Chao,Zhen Guoyong,Shan Yanhu
Author Affilications:Science and Technology on Electronic Test and Measurement Laboratory,North University of China,Taiyuan 030051,Chain
DOI:10.16157/j.issn.0258-7998.200735
Author:Xu Shengnan1,Fu Guie1,2,Wang Wei2,Zhang Yijin1
Author Affilications:1.School of Electronic and Optical Engineering,Nanjing University of Science and Technology,Nanjing 210094,China; 2.Nanjing Ruihe Electronics Co. Ltd.,Nanjing 210018,China; 3.No.8 Institute of China State Shipbuilding Co.,Ltd.,Nanjing 211100,China
DOI:10.16157/j.issn.0258-7998.200863
Author:Yu Guang,Li Fengkun,Tian Hua
Author Affilications:School of Intelligence & Electronic Engineering,Dalian Neusoft University of Information,Dalian 116023,China
DOI:10.16157/j.issn.0258-7998.200858
Author:Wang Ting,Chen Binyue,Zhang Fuhai
Author Affilications:College of Electronic Information and Optical Engineering,Nankai University,Tianjin 300350,China
DOI:10.16157/j.issn.0258-7998.200672
Author:Zhou Wenhui
Author Affilications:Unit 43,No.91404 Troops of PLA,Qinhuangdao 066000,China
DOI:10.16157/j.issn.0258-7998.200984
Author:Hou Huan,Shi Hongsheng
Author Affilications:School of Electrical Engineering,Beijing Jiaotong University,Beijing 100044,China
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