DOI:10.16157/j.issn.0258-7998.211772
Author:Mang Ge
Author Affilications:China Telecom Research Institute,Beijing 102209,China
DOI:10.16157/j.issn.0258-7998.211764
Author:Zhang Shaowei
Author Affilications:China Telecom Research Institute,Beijing 102209,China
DOI:10.16157/j.issn.0258-7998.211305
Author:Li Gang1,2,Wang Yuxin1,2,3,Zhang Xiuyin3,Chen Zhen3,Chen Yijian1,2,Dou Jianwu1,2,Yang Jun1,2,Lu Haitao1,2
Author Affilications:1.ZTE Corporation, Shenzhen 518055, China; 2.State Key Laboratory of Mobile Network and Mobile Multimedia Technology,Shenzhen 518055,China; 3.South China University of Technology,Guangzhou 510641,China
DOI:10.16157/j.issn.0258-7998.201144
Author:Zhang Huili
Author Affilications:Chongqing Academy of Information and Communication Technology,Chongqing 400000,China
DOI:10.16157/j.issn.0258-7998.201087
Author:Qiao Yi,Qu Yi
Author Affilications:College of Information Engineering,Engineering University of PAP,Xi′an 710086,China
DOI:10.16157/j.issn.0258-7998.200968
Author:Kuang Chaoqing1,2,3,He Chao1,2,3,Wang Juncheng1,2,3,Zou Jianwen1,2,3
Author Affilications:1.School of Communication and Information Engineering,Chongqing University of Posts and Telecommunications, Chongqing 400065,China; 2.Optical Communications and Networks Key Laboratory of Chongqing,Chongqing 400065,China; 3.Ubiquitous Sensing and Networking Key Laboratory of Chongqing,Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.200976
Author:Zhang Jiejun1,Tang Yingchun1,Ji Shuyun2,Li Jinglin2
Author Affilications:1.China Telecom Corporation Limited Shanghai Branch,Shanghai 200041,China; 2.State Key Laboratory of Networking and Switching Technology,Beijing University of Posts and Telecommunications, Beijing 100876,China
DOI:10.16157/j.issn.0258-7998.201211
Author:Meng Yuting,Yuan Haiying,Ding Dong
Author Affilications:School of Microelectronics,Faculty of Information Technology,Beijing University of Technology,Beijing 100124,China
Author:Zhai Pengfei1,Zhou Xiong1,Li Qiang1,2
Author Affilications:1.School of Electronic Science and Engineering,University of Electronic Science and Technology of China,Chengdu 610054,China; 2.Pazhou Lab(Guangdong Artificial Intelligence and Digital Economy Laboratory(Guangzhou)),Guangzhou 510330,China
DOI:10.16157/j.issn.0258-7998.201078
Author:Li Fang,Jiao Jiye,Ma Caicai
Author Affilications:College of Electronic Engineer,Xi′an University of Posts and Telecommunications,Xi′an 710000,China
DOI:10.16157/j.issn.0258-7998.201076
Author:Bi Yanfeng1,Li Jie1,Hu Chenjun2
Author Affilications:1.State Key Laboratory of Electronic Testing Technology,North University of China,Taiyuan 030051,China; 2.Suzhou Zhongsheng Nanotechnology Company,Suzhou 215123,China
DOI:10.16157/j.issn.0258-7998.200861
Author:Zhou Yang,Xiong Junqiao
Author Affilications:School of Electrical and Information Engineering,Wuhan Institute of Technology,Wuhan 430205,China
DOI:10.16157/j.issn.0258-7998.200827
Author:Li Qiang,Xu Yihua
Author Affilications:China Mobile(Hangzhou) Information Technology Co.,Ltd.,Hangzhou 311121,China
DOI:10.16157/j.issn.0258-7998.201053
Author:Shao Kai1,2,Li Hui1,2,Zhou Juanhong1,2
Author Affilications:1.School of Communication and Information Engineering,Chongqing University of Posts and Telecommunications, Chongqing 400065,China; 2.Chongqing Key Laboratory of Mobile Communications Technology,Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.200384
Author:Wang Peng,Liu Zhengqing,Tian Yi
Author Affilications:College of Airworthiness,Civil Aviation University of China,Tianjin 300300,China
DOI:10.16157/j.issn.0258-7998.200280
Author:Li Guoqiang1,Peng Chigang1,Wang Yong1,Xiang Dongwei2,Yang Chengcheng2
Author Affilications:1.Machine Operation Center,Guangdong Power Grid Co.,Ltd.,Guangzhou 510062,China; 2.Wuhan Huizhuohang Technology Co.,Ltd.,Wuhan 430070,China
DOI:10.16157/j.issn.0258-7998.200398
Author:Yu Yifei,Li Xuan,He Yushan,Xie Jincheng,Zhu Xiaowei,Yang Rubai
Author Affilications:School of Quality and Safety Engineering,China Jiliang University,Hangzhou 310018,China
DOI:10.16157/j.issn.0258-7998.200237
Author:Zang Junbin1,2,Bai Yang2
Author Affilications:1.Key Laboratory of Instrumentation Science & Dynamic Measurement,Ministry of Education North University of China, Taiyuan 030051,China; 2.North University of China,Shuozhou 036000,China
DOI:10.16157/j.issn.0258-7998.201119
Author:Hao Weiqi,Wang Xianhui,Li Zheng,Xiao Deyong,Chen Kuixi
Author Affilications:Beijing Smart Chip Microelectronic Co.,Ltd.,Beijing 102200,China
DOI:10.16157/j.issn.0258-7998.201025
Author:Zhang Jian,Wu Qianwen,Gao Zefeng,Zhou Zhigang
Author Affilications:School of Electronic Information,Hangzhou Dianzi University,Hangzhou 310018,China
DOI:10.16157/j.issn.0258-7998.201022
Author:Li Shuxuan,Bu Gang
Author Affilications:School of Electronic Information Engineering,Nanjing University of Aeronautics and Astronautics,Nanjing 211106,China
DOI:10.16157/j.issn.0258-7998.200979
Author:Li Jianxiang1,2,Yang Yuhua1,2,Liu Donghai1,2,Li Qiuyuan1,2
Author Affilications:1.Key Laboratory of Instrumentation Science and Dynamic Measurement of Ministry of Education,North University of China, Taiyuan 030051,China; 2.National Key Laboratory for Electronic Measurement Technology,North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.201212
Author:Zhu Min1,Wu Nan1,Yang Chunling1,Chen Haiyan2,Li Rui2
Author Affilications:1.School of Electrical Engineering and Automation,Harbin Institute of Technology,Harbin 150001,China; 2.China Air-borne Missile Academy,Luoyang 471009,China
DOI:10.16157/j.issn.0258-7998.201221
Author:Luo Qiang
Author Affilications:Southwest China Institute of Electronic Technology,Chengdu 610036,China
DOI:10.16157/j.issn.0258-7998.201167
Author:Song Yan1,Ying Binjie1,Yang Chenggang1,Hao Zifei1,Mao Lizhen2
Author Affilications:1.Lishui Power Supply Company,State Grid Zhejiang Electric Power Co.,Ltd,Lishui 316021,China; 2.Hangzhou Quantum Sensing Technology Co.,Ltd.,Hangzhou 310019,China
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