DOI:10.16157/j.issn.0258-7998.211497
Author:Rao Zhongjun1,Zhang Zhihao1,2,Zhang Guohao1,2
Author Affilications:1.School of Information, Guangdong University of Technology,Guangzhou 510006,China; 2.Synergy Innovation Institute of GDUT,Heyuan,Heyuan 517000,China
DOI:10.16157/j.issn.0258-7998.211282
Author:Jiang Rundong,Yao Jinjie,Ji Nana,Li Jiahao
Author Affilications:Shanxi Key Laboratory of Signal Capturing & Process,North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.211471
Author:Wu Jiancheng1,Yang Ru1,2,Yu Liande3,Jie Hai1,Liu Zuolian3
Author Affilications:1.School of Electronics and Communication Engineering,Guangzhou University,Guangzhou 510006,China; 2.School of Mechanical and Electrical Engineering,Guangzhou University,Guangzhou 510006,China; 3.School of Phyhics and Materials Science,Guangzhou University,Guangzhou 510006,China
DOI:10.16157/j.issn.0258-7998.201192
Author:Yu Miao1,2,3,Song Limei1,2,3,Li Ke2,3,Cong Mifang2,3,Li Yongqiang2,3,Ren Jianwei2,3
Author Affilications:1.University of Chinese Academy of Sciences,Beijing 100049,China; 2.Institute of Microelectronics of Chinese Academy of Sciences,Beijing 100029,China; 3.Key Laboratory of Science and Technology on Silicon Devices,Chinese Academy of Sciences,Beijing 100029,China
DOI:10.16157/j.issn.0258-7998.201115
Author:Guo Jinpeng1,2,Han Minjie3,Xu Zhengrong2
Author Affilications:1.Zhejiang Uniview Technologies Co.,Ltd.,Hangzhou 310051,China; 2.School of Information and Computer,Anhui Agricultural University,Hefei 230036,China; 3.School of Life Sciences,University of Science and Technology of China, Hefei 230022, China
DOI:10.16157/j.issn.0258-7998.200923
Author:Liu Zhihua1,Wang Zhengye1,Li Fengjun2,Yan Chuanbo2
Author Affilications:1.College of Public Health,Xinjiang Medical University,Urumqi 830011,China; 2.College of Medical Engineering Technology,Xinjiang Medical University,Urumqi 830011,China
DOI:10.16157/j.issn.0258-7998.201173
Author:Xie Bin1,2,Lin Shanling2,3,Lin Zhixian1,2,Guo Tailiang1,2
Author Affilications:1.School of Physics and Information Engineering,Fuzhou University,Fuzhou 350116,China; 2.China Fujian Optoelectronic Information Science and Technology Innovation Laboratory,Fuzhou 350116,China; 3.School of Advanced Manufacturing, Fuzhou University,Quanzhou 362200,China
DOI:10.16157/j.issn.0258-7998.201253
Author:Feng Shiqin,Feng Quanyuan
Author Affilications:Institute of Microelectronics,Southwest Jiaotong University,Chengdu 611756,China
DOI:10.16157/j.issn.0258-7998.211351
Author:Pu Zeyu1,2,Wan Jing2,3,Wang Xiao2,3,Li Yuehua1,Liang Xiaoxin2,3
Author Affilications:1.Nanjing University of Science & Techonlogy,Nanjing 210094,China; 2.Institute of Microelectronic Technology of Kunshan,Kunshan 215347,China; 3.Institute of Microelectronics,Chinese Academy of Sciences,Beijing 100029,China
DOI:10.16157/j.issn.0258-7998.201177
Author:Yang Rongbin,Xu Zhentao
Author Affilications:Chengdu MECS Technology Co.,Ltd.,Chengdu 610051,China
DOI:10.16157/j.issn.0258-7998.201239
Author:Wang Yu,Ma Wei,Hu Weibo,Wang Meiyu
Author Affilications:College of Electronic Information and Optical Engineering,Nankai University,Tianjin 300350,China
DOI:10.16157/j.issn.0258-7998.201039
Author:Wang Renzhi,Kong Ya,Zhang Chunze
Author Affilications:Tianjin Xunlian Technology Co.,Ltd.,Tianjin 300308,China
DOI:10.16157/j.issn.0258-7998.201037
Author:Zhang Anli,Xie Meng,Shi Zhuoyong
Author Affilications:Xi′an Jiaotong University City College,Xi′an 710018,China
DOI:10.16157/j.issn.0258-7998.201235
Author:Yan Tingqiu,Shen Bin,Wang Xin
Author Affilications:School of Communication and Information Engineering,Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.201198
Author:Gao Pengcheng
Author Affilications:The 10th Research Institute of CETC,Chengdu 610036,China
DOI:10.16157/j.issn.0258-7998.200452
Author:Wang Yimin1,Wu Zhenyu1,Zhu Chongye2
Author Affilications:1.Ningbo Institute of Metrology and testing,Ningbo 315048,China; 2.Ningbo Sunrise Instruments Co.,Ltd.,Ningbo 315032,China
DOI:10.16157/j.issn.0258-7998.200643
Author:Jiang Diancheng,Jiang Xuesong,Wang Wanjun,Zhang Xiaohong,Ye Qiaolin
Author Affilications:School of Mechanical and Electronic Engineering,Nanjing Forestry University,Nanjing 210037,China
DOI:10.16157/j.issn.0258-7998.200559
Author:Yang Jiajia1,Xiong Rendou1,Liu Jin1,Tang Qiu1,Zuo Jiao2
Author Affilications:1.National Computer System Engineering Research Institute of China,Beijing 100083,China; 2.China Greatwall Technology Group Co.,Ltd.,Shenzhen 518057,China
DOI:10.16157/j.issn.0258-7998.200524
Author:Shao Qi1,Bao Yongqiang2,Jiang Jiahui1,Zhang Xuxu1
Author Affilications:1.School of Electrical Engineering,Nanjing Institute of Technology,Nanjing 211167,China; 2.School of Information and Communication Engineering,Nanjing Institute of Technology,Nanjing 211167,China
DOI:10.16157/j.issn.0258-7998.211279
Author:Xie Sipu,Wei Rongshan
Author Affilications:School of Physics and Information Engineering,Fuzhou University,Fuzhou 350108,China
DOI:10.16157/j.issn.0258-7998.211300
Author:Zhou Jue1,2,Wu Dongmin2
Author Affilications:1.School of Microelectronics,University of Science and Technology of China,Hefei 230026,China; 2.Suzhou Institue of Nano-Tech and Nano-Bionics,Chinese Academy of Sciences,Suzhou 215000,China
DOI:10.16157/j.issn.0258-7998.201033
Author:Chen Xiaoyu1,Wang Xin1,Wu Ruihong2,Ren Xiaochun2,Deng Chuan2
Author Affilications:1.College of Physical Science and Technology,Central China Normal University,Wuhan 430079,China; 2.China Railway First Survey and Design Institute Group Co.,Ltd.,Xi′an 710043,China
DOI:10.16157/j.issn.0258-7998.201138
Author:Li Haitao1,Li Binkang1,2,Chen Yanli1, Tian Geng1,2,Zhao Qian1,Ruan Linbo1,2
Author Affilications:1.Northwest Institute of Nuclear Technology,Xi′an 710024,China; 2.State Key Laboratory of Simulation and Effect for Intense Pulse Radiation,Xi′an 710024,China
DOI:10.16157/j.issn.0258-7998.201134
Author:Zhen Guoyong,Cao Fei,Chen Jianjun,Jia Xingzhong
Author Affilications:Science and Technology on Electronic Test and Measurement Laboratory,North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.211289
Author:Li Linsen,Wang Tao,Zhu Zhe
Author Affilications:Anhui Province Key Laboratory of Microsystem,East China Research Institute of Microelectronics,Hefei 230088,China
DOI:10.16157/j.issn.0258-7998.211292
Author:Li Fang1,Xu Guangming2,Liu Cheng3,Xiang Hengyong4,Shi Huli1,Jiang Juan5,Ning Yongke6,Qian Xiaolong6
Author Affilications:1.National Astronomical Observation,Chinese Academy of Sciences,Beijing 100012,China; 2.Taiyuan Satellite Launch Center,Taiyuan 030000,China; 3.Beijing Institute of Tracking and Telecommunication Technology,Beijing 100094,China; 4.Institute of Microelectronics of Chinese Academy of Sciences,Beijing 100029,China; 5.Beijing Institute of Space Science and Technology Information,Beijing 100094,China; 6.School of Information and Communication,Guilin University of Electronic Technology,Guilin 541004,China
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