DOI:10.16157/j.issn.0258-7998.222721
Author:Wang Bo,Wang Xuedi,Shi Guangyi,Yan Wei
Author Affilications:School of Software and Microelectronics,Peking University,Beijing 102627,China
DOI:10.16157/j.issn.0258-7998.211554
Author:Zhang Liguo1,Liu Qiang1,Yan Wei2,Li Fukun1,Wu Pengfei2,Wang Bo2
Author Affilications:1.Institute of Electrical Engineering,Yanshan University,Qinhuangdao 066000,China; 2.School of Solftware & Microelectronics,Peking University,Beijing 100871,China
DOI:10.16157/j.issn.0258-7998.222722
Author:Wang Xuedi,Wang Bo,Shi Guangyi,Yan Wei
Author Affilications:School of Software & Microelectronics,Peking University,Beijing 102627,China
DOI:10.16157/j.issn.0258-7998.211551
Author:Zhang Liguo1,Li Fukun1,Yan Wei2,Liu Qiang1,Wang Xuedi2
Author Affilications:1.School of Electrical Engineering,Yanshan University,Qinhuangdao 066000,China; 2.School of Software and Microelectronics,Peking University,Beijing 100871,China
DOI:10.16157/j.issn.0258-7998.222657
Author:Yu Huiqun,Huang Yihai,Peng Daogang,Wang Yixue,Ma Tao
Author Affilications:School of Automation Engineering,Shanghai University of Electric Power,Shanghai 200090,China
DOI:10.16157/j.issn.0258-7998.211747
Author:Yang Ge1,2,Wang Zhenyao1
Author Affilications:1.Key Laboratory of Intelligent Multimedia Technology,Beijing Normal University,Zhuhai 519087,China; 2.Research Center for Intelligent Engineering and Educational Application,Beijing Normal University,Zhuhai 519087,China
DOI:10.16157/j.issn.0258-7998.212086
Author:Ma Tian1,2,Yu Benguo3,Zhang Jing1,2,Song Wenai1,2,Jing Yu1
Author Affilications:1.Software School,North University of China,Taiyuan 030051,China; 2.Shanxi Military and Civilian Integration Software Engineering Technology Research Center,Taiyuan 030051,China; 3.School of Biomedical Information and Engineering,Hainan Medical University,Haikou 571199,China
DOI:10.16157/j.issn.0258-7998.212245
Author:Hao Xiaoliang,Zhao Yingwei,Sun Hu,Wang Xiuhai,Cao Jian,Ma Peisheng,Ren Zesheng
Author Affilications:The 13th Research Institute of China Electronics Technology Group Corporation,Shijiazhuang 050051,China
DOI:10.16157/j.issn.0258-7998.212146
Author:Kang Yukuang1,Zheng Hanlin2,Huang Qiao2,Shen Wei2
Author Affilications:1.City College,Southwest University of Science and Technology,Mianyang 621000,China; 2.School of Information Engineering,Southwest University of Science and Technology,Mianyang 621000,China
DOI:10.16157/j.issn.0258-7998.211946
Author:Li Jian
Author Affilications:South West Weapon Industry Co.,Ltd.,Chongqing 400042,China
DOI:10.16157/j.issn.0258-7998.212120
Author:Li Haitao1,Li Binkang1,2,Tian Geng1,2,Ruan Linbo1,2,Lv Zongjing1
Author Affilications:1.Northwest Institute of Nuclear Technology,Xi′an 710024,China; 2.State Key Laboratory of Intense Pulsed Radiation Simulation and Effect,Xi′an 710024,China
DOI:10.16157/j.issn.0258-7998.212221
Author:Huang Zhen,Bai Zhengyao
Author Affilications:School of Information Science and Engineering,Yunnan University,Kunming 650500,China
DOI:10.16157/j.issn.0258-7998.212012
Author:Feng Pingxing1,Zhang Hongbo2,Li Wenxiang1
Author Affilications:1.School of Network and Communication Engineering,Chengdu Technological University,Chengdu 611731,China; 2.School of Communication and Information Engineering,Chengdu University of Information Technology,Chengdu 610103,China
DOI:10.16157/j.issn.0258-7998.211682
Author:Feng Shaohua,Chen Qinghua,Ouyang Zhonghui,Li Zhao
Author Affilications:College of Coastal Defense,Navy Aviation University,Yantai 264001,China
DOI:10.16157/j.issn.0258-7998.211773
Author:Zhang Lizhi1,2,Li Xuewen2,3
Author Affilications:1.College of Engineering,Xi′an International University,Xi′an 710077,China; 2.Xi′an Xike Security Technology Co.,Ltd.,Xi′an 710054,China; 3.College of Safety Science and Engineering,Xi′an University of Science and Technology,Xi′an 710054,China
DOI:10.16157/j.issn.0258-7998.211677
Author:Zhen Chaoping,Zeng Siming
Author Affilications:Experimental Teaching Center, Guangdong University of Technology,Guangzhou 510006,China
DOI:10.16157/j.issn.0258-7998.211637
Author:Lei Fang1,Chen Bo1,Lv Jingzhao1,Li Pingan1,Du Haitao2,Li Su2
Author Affilications:1.School of Communication and Information Engineering,Chongqing University of Posts and Telecommunications, Chongqing 400065,China; 2.Research Institute of China Mobile Communications Group Corporation,Beijing 100053,China
DOI:10.16157/j.issn.0258-7998.200192
Author:Pan Gang,Mi Shichao,Guo Ronghua,Huang Ligang,Wang Jinsuo,Li Kai
Author Affilications:Key Laboratory of Optoelectronic Countermeasures Measurement and Evaluation Technology,Luoyang 471003,China
DOI:10.16157/j.issn.0258-7998.211506
Author:Gao Ruochen,Huai Xiaoyong,Zhang Zhida,Li Baiwen
Author Affilications:National Computer System Engineering Research Institute of China,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.212377
Author:He Moxu1,Hu Junjian2,Gao Bo2,He Liangjin2
Author Affilications:1.Chengdu Aircraft Industry(Group) Co.,Ltd.,Chengdu 610090,China; 2.College of Physics,Sichuan University,Chengdu 610065,China
DOI:10.16157/j.issn.0258-7998.212199
Author:Xue Xin,Dong Liang,Wu Jiaqian
Author Affilications:No.36 Research Institute of CETC,Jiaxing 314033,China
DOI:10.16157/j.issn.0258-7998.212364
Author:Ge Xuefei1,Zhang Xupu2,You Bin1
Author Affilications:1.School of Electronic Information,Hangzhou Dianzi University,Hangzhou 310018,China; 2.Hangzhou Ziguang Network Technology Co.,Ltd.,Hangzhou 310051,China
DOI:10.16157/j.issn.0258-7998.212360
Author:Yan Huizeng,Shi Mengqiao,Zhou Hao,Chen Huanbei
Author Affilications:Nanjing Electronic Devices Institute,Nanjing 210016,China
DOI:10.16157/j.issn.0258-7998.222676
Author:Ma Hanyang1,Zhou Yujin2,Zhou Jun2
Author Affilications:1.Nanjing Electronic Devices Institute,Nanjing 210016,China; 2.Nanjing Guobo Electronics Company Limited,Nanjing 211100,China
DOI:10.16157/j.issn.0258-7998.211820
Author:Gao Jiuxiang1,Yuan Yanning1,Shi Zhensheng2,Xi Xiaoli1
Author Affilications:1.School of Automation and Information Engineering,Xi′an University of Technology,Xi′an 710048,China; 2.School of Information and Communications Engineering,Xi′an Jiaotong University,Xi′an 710049,China
DOI:10.16157/j.issn.0258-7998.211862
Author:Liu Boming1,Zhang Qinghai2,Zhao Zhengxu2
Author Affilications:1.School of Information Science and Technology,Shijiazhuang Tiedao University,Shijiazhuang 050043,China; 2.School of Mechanical & Automotive Engineering,Qingdao University of Technology,Qingdao 266525,China
DOI:10.16157/j.issn.0258-7998.211903
Author:Ai Kaixuan1,2,Liu Yunting1,Liu Yang2
Author Affilications:1.Metrology and Testing Center,China Academy of Engineering Physics,Mianyang 621999,China; 2.School of Electronic Science and Engineering,University of Electronic Science and Technology of China,Chengdu 610054,China
DOI:10.16157/j.issn.0258-7998.211948
Author:Wang Disheng,Qin Huibin,Fan Cuihong
Author Affilications:Institute of New Electronic Devices and Applications,Hangzhou Dianzi University,Hangzhou 310018,China
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