DOI:10.16157/j.issn.0258-7998.223015
Author:Wang Hucheng,Xu Hui,Sun Shaohui
Author Affilications:Datang Mobile Communication Equipment Co.,Ltd.,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.222988
Author:Wu Jian,Jia Min,Zhang Liang
Author Affilications:School of Electronics and Information Engineering,Harbin Institute of Technology,Harbin 150006,China
DOI:10.16157/j.issn.0258-7998.222790
Author:Zhang Wei,Lan Zhicheng,Wu Zhicheng
Author Affilications:Tianjin Institute of Power Sources,Tianjin 300384,China
DOI:10.16157/j.issn.0258-7998.222665
Author:Song Shuyuan1,Fan Guohao2,Wang Yan1,Xia Lei1,Zhang Min1
Author Affilications:1.China Electronic System Technology Co.,Ltd.,Beijing 100141,China;2.China Electronics Corporation,Shenzhen 518057,China
DOI:10.16157/j.issn.0258-7998.222706
Author:Liu Jianfeng,Zhong Guoyun
Author Affilications:School of Information Engineering,East China University of Technology,Nanchang 330013,China
DOI:10.16157/j.issn.0258-7998.212080
Author:Wei Ruobing,He Jiafeng,Qiu Xiaofang,Liu Qi
Author Affilications:College of Information Engineering,Guangdong University of Technology,Guangzhou 510006,China
DOI:10.16157/j.issn.0258-7998.222731
Author:Wei Shiyue,Xu Hongzhen
Author Affilications:School of Information Engineering,East China University of Technology,Nanchang 330013,China
DOI:10.16157/j.issn.0258-7998.211723
Author:Cai Jing1,Liu Guangda1,Wang Yaoyao1,Gong Xiaoyu2
Author Affilications:1.College of Instrumentation & Electrical Engineering,Jilin University,Changchun 130012,China; 2.Educational Technology Center,Jilin University,Changchun 130061,China
DOI:10.16157/j.issn.0258-7998.212337
Author:Liu Sentai,Pang Yu,Wei Dong
Author Affilications:Chongqing University of Posts and Telecommunications,Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.212353
Author:Wang Qiushi,Meng Shaopeng,Wu Hongqiang
Author Affilications:Anhui Siliepoch Technology Co.,Ltd.,Hefei 230031,China
DOI:10.16157/j.issn.0258-7998.212339
Author:Lu Chao,Mi Wenlong,Hu Dingrui
Author Affilications:Southwest China Institute of Electronic Technology,Chengdu 610036,China
DOI:10.16157/j.issn.0258-7998.212139
Author:Su Ming1,Fan Wenqiang1,Xiao Dong2
Author Affilications:1.School of Opto-Electronic Information Science and Technology,University of Yantai,Yantai 264000,China; 3.GuoLong Intelligent Technology(WeiHai) Co.,Ltd.,Weihai 264200,China
DOI:10.16157/j.issn.0258-7998.212094
Author:Pan Weiyu1,Zhao Zhijin1,2
Author Affilications:1.School of Communication Engineering,Hangzhou Dianzi University,Hangzhou 310018,China; 2.State Key Lab of Information Control Technology in Communication System of No.36 Research Institute, China Electronic Technology Corporation,Jiaxing 314001,China
DOI:10.16157/j.issn.0258-7998.212211
Author:Zhu Jialin1,Zhang Min1,Li Kai1,Liu Xin2,Zhang Liwei2
Author Affilications:1.Research Institute of China Telecom Co.,Ltd.,Beijing 102209,China;2.China Telecom Co.,Ltd.,Beijing 100010,China
DOI:10.16157/j.issn.0258-7998.212273
Author:Li Weilong1,Wang Qing2,Liu Xin1,Zhang Canming1
Author Affilications:1.Anhui Academy of Coal Science,Hefei 230001,China;2.Anhui Xinhua University,Hefei 230000,China
DOI:10.16157/j.issn.0258-7998.222725
Author:Lei Genhua1,Wang Lei1,2,Zhang Zhiyong1
Author Affilications:1.School of Information Engineering,East China University of Technology,Nanchang 330013,China; 2.Jiangxi Engineering Technology Research Center of Nuclear Geoscience Data Science and System,Nanchang 330013,China
DOI:10.16157/j.issn.0258-7998.211847
Author:Yao Liping1,Liu Weizhang2,Wu Wenming1,Jiang Yangyang1,Lei Peng1,Tan Zhongwei1,Wang Kangning1, Li Guixiang1,Xu Fei1,Tang Yuanliang1,Wu Xinshe1,Huang Dequn1,Chen Jun1,Gu Heng1
Author Affilications:1.Institute of Medicine and Health,Guangdong Academy of Sciences,Guangzhou 510500,China; 2.College of Mathematics and Informatics,South China Agricultural University,Guangzhou 510642,China
DOI:10.16157/j.issn.0258-7998.211584
Author:Zhang Wenyu,Xing Rongying,Li Guodong
Author Affilications:School of Mathematics and Computing Science,Guilin University of Electronic and Technology,Guilin 541004,China
DOI:10.16157/j.issn.0258-7998.211771
Author:Cong Lin1,Yang Jinghua2,Sun Jicheng1,Cheng Shan1,Zhang Taihui1,Hu Wendong1
Author Affilications:1.School of Aerospace Medicine,Air Force Medical University,Xi′an 710032,China; 2.Department of Basics,Air Force Engineering University,Xi′an 710051,China
DOI:10.16157/j.issn.0258-7998.211839
Author:Chen Bo,Wu Yunfeng,Lu Kai
Author Affilications:The 6th Research Institute of China Electronics Corporation,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.212461
Author:Yu Guanzhong,Wei Xiong,Tian Qingwang,Shi Xuming
Author Affilications:State Nuclear Power Automation System Engineering Corp,Shanghai 200241,China
DOI:10.16157/j.issn.0258-7998.222527
Author:Su Dongnan1,2,Shang Peng2,Hu Zhigang1,Zeng Zilin1,Wei Feng2,Wu Jipeng2,Yang Delong2
Author Affilications:1.College of Medical Technology and Engineering,Henan University of Science and Technology,Luoyang 471000,China; 2.Shenzhen Institute of Advanced Technology,Chinese Academy of Sciences,Shenzhen 518055,China
DOI:10.16157/j.issn.0258-7998.211960
Author:Liu Tao,Zong Yanyan,Wang Qianhui,Qin Yuqian,Tian Minzheng,Yu Huaguo
Author Affilications:Inspur Electronic Information Industry Co.,Ltd.,Jinan 250101,China
DOI:10.16157/j.issn.0258-7998.212222
Author:Zhang Xinjian1,Bi Yan1,Lu Yanmin1,Wu Yanping2,Yang Jiajun1,2,Yang Weihong1,Fan Juan1
Author Affilications:1.Mechanical and Electrical Engineering Department,Wenhua College,Wuhan 430074,China; 2.School of Mechnical Science & Engineering,Huazhong University of Science and Technology,Wuhan 430074,China
DOI:10.16157/j.issn.0258-7998.212170
Author:Zhou Ya,Dai Wei,Zhang Xin,Xu Li
Author Affilications:China Key System & Integrated Circuit Co.,Ltd.,Nanjing 210000,China
DOI:10.16157/j.issn.0258-7998.222602
Author:Liu Zhuang,Huang Xiaomeng
Author Affilications:Department of Earth System Science,Tsinghua University,Beijing 100084,China
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