DOI:10.16157/j.issn.0258-7998.223018
Author:Zhang Yuhui
Author Affilications:Southwest China Institute of Electronic Technology,Chengdu 610036,China
DOI:10.16157/j.issn.0258-7998.223393
Author:Hou Jia,Zhou Xiujie,Li Yanfen,Yuan Xueqi
Author Affilications:Research Institute of China Telecom.,Ltd.,Beijing 102209,China
DOI:10.16157/j.issn.0258-7998.223312
Author:Zhou Tao,Zhang Hao,Bian Cheng,Li Haoyi
Author Affilications:Sichuan Jiuzhou Electric Group Co.,Ltd.,Mianyang 621050,China
DOI:10.16157/j.issn.0258-7998.222631
Author:Peng Libiao1,Deng Yongli2,Shuai Ping1,Bi Dongjie1,Li Xifeng1,Xie Yongle1
Author Affilications:1.School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China; 2.Beijing Aeronautical Technology Research Center, Beijing 100076, China
DOI:10.16157/j.issn.0258-7998.212093
Author:Wang Xin,Cui Peizhang,Tao Jie
Author Affilications:Shijiazhuang Campus of Army Engineering University,Shijiazhuang 050003,China
DOI:10.16157/j.issn.0258-7998.222526
Author:Cai Jing,Yuan Shouguo,Li Rui,Xu Menghui
Author Affilications:School of Instrument Science and Electrical Engineering,Jilin University,Changchun 130061,China
DOI:10.16157/j.issn.0258-7998.222693
Author:Qian Jinyu,Qiang Xiaoyan,Qu Linxiang
Author Affilications:China Electronics Technology Group Corporation No.58 Research Institute,Wuxi 214072,China
DOI:10.16157/j.issn.0258-7998.222610
Author:Ma Wenchao
Author Affilications:China Key System & Integrated Circuit Co., Ltd., Wuxi 214072, China
DOI:10.16157/j.issn.0258-7998.222836
Author:Yang Zhengnan1,Wang Yong2,Ou Changjiang1,Hu Mei1,Zhang Yumeng1
Author Affilications:1.The 43rd Research Institute of CETC,Hefei 230088,China; 2.Anhui Province Key Laboratory of Microsystem,the 43rd Research Institute of CETC,Hefei 230088,China
DOI:10.16157/j.issn.0258-7998.222668
Author:Shang Linlin,Zhou Pan,Zhao Peng
Author Affilications:Shenzhen Guowei Electronics Co.,Ltd.,Shenzhen 518000,China
DOI:10.16157/j.issn.0258-7998.222823
Author:Jiang Bei,Yue Guijun,Zhou Xin
Author Affilications:School of Communication and Information Engineering,Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.222661
Author:Li Ganhua1,2,Dong Li1,2,Li Xianwu1,2,Tai Nengjian1,2,Xia Keqiang1,2,Tai Wenxing1,2,An Yuan1,2
Author Affilications:1.State Key Laboratory of Astronautic Dynamics,Xi′an 710043,China; 2.Xi′an Satellite Control Center,Xi′an 710043,China
DOI:10.16157/j.issn.0258-7998.222577
Author:Li Bei1,Liu Guanghai1,Xu Guoping2,Xiao Tian1,Li Yi1,Hu Yuhua3,Zhu Xiaomeng1,Zheng Yuting1
Author Affilications:1.China Unicom Research Institute,Beijing 100048,China; 2.China United Network Communication Group Co.,Ltd.,Beijing 100033,China; 3.China United Network Communication Co.,Ltd.Zhejiang Branch,Hangzhou 310051,China
DOI:10.16157/j.issn.0258-7998.222641
Author:Lv Lele,Dong Wei,Zhao Yunfei,Feng Zhi,Li Zhicheng,Zhang Yaqin
Author Affilications:National Computer System Engineering Research Institute of China,Beijing 102209,China
DOI:10.16157/j.issn.0258-7998.211942
Author:Jin Miao1,Fan Zhongwen2
Author Affilications:1.Huaxin Consulting Design Institute Co.,Ltd.,Hangzhou 310052,China; 2.Huawei Technology Co.,Ltd.,Hangzhou 310052,China
DOI:10.16157/j.issn.0258-7998.212067
Author:Kong Kang,Li Deying,Sun Zhongsheng
Author Affilications:School of Mechanical Engineering,Nanjing University of Science and Technology,Nanjing 210094,China
DOI:10.16157/j.issn.0258-7998.212166
Author:Min Xiaoshuang,Dong Yan,Liu Hong,Dong Min
Author Affilications:The Sixth Research Institute of China Electronics Corporation,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.212423
Author:Tao Qingping,Shang Guoqing,Zhu Qing
Author Affilications:China Electronics Technology Group Corporation No.58 Research Institute,Wuxi 214035,China
DOI:10.16157/j.issn.0258-7998.212435
Author:Chen Jingjing,Tian Peng,Huang Wei
Author Affilications:School of Mechanical Engineering,Sichuan University,Chengdu 610065,China
DOI:10.16157/j.issn.0258-7998.212213
Author:Shang Qiuming,Wang Lijun,Deng Guiying,Zhao Tong,Zhang Likun
Author Affilications:Technological Research and Development Department,China Internet Network Information Center(CNNIC),Beijing 100190,China
DOI:10.16157/j.issn.0258-7998.222533
Author:Zhong Zhihao1,Rui Xi1,Li Congzhou1,Yuan Bin2
Author Affilications:1.Southwest China Institute of Electronic Technology,Chengdu 610036,China; 2.School of Electronic Science and Engineering,University of Electronic Science and Technology of China,Chengdu 611731,China
DOI:10.16157/j.issn.0258-7998.222874
Author:Wang Chen1,Xu Huijuan2,Yang Long3,Zhou Wentao3,Wang Na3
Author Affilications:1.The Military Representative Office of the Equipment Department of the Aerospace System Department in Chengdu, Chengdu 610036,China; 2.Unit 63620 of the PLA,Lanzhou 730000,China;3.Southwest China Institute of Electronic Technology,Chengdu 610036,China
DOI:10.16157/j.issn.0258-7998.222620
Author:Zhao Shichao,Zuo Jinyin,Wei Xiao,Zhao Zhe
Author Affilications:National Computer System Engineering Research Institute of China,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.222793
Author:Liu Chenhao1,Jin Ge2
Author Affilications:1.School of Microelectronics,University of Science and Technology of China,Hefei 230026,China; 2.Department of Modern Physics, School of Physical Sciences,University of Science and Technology of China,Hefei 230026,China
DOI:10.16157/j.issn.0258-7998.222523
Author:Zhu Yinxia,Zhang Jian,Tian Xiang,Hu Jing, Cheng Jian
Author Affilications:College of Communication Engineering, Army Engineering University of PLA, Nanjing 210007, China
DOI:10.16157/j.issn.0258-7998.222578
Author:Wang Xisheng1,Hou Yuhui2,Guo Bochao2,Cui Zhenyu2,Tian Zijian2,Wang Wenqing3
Author Affilications:1.China Coal Information Technology(Beijing) Co.,Ltd.,Beijing 100029,China; 2.School of Mechanical Electronic and Information Engineering,China University of Mining and Technology(Beijing), Beijing 100083,China; 3.Beijing Polytechnic College,Beijing 100042,China
DOI:10.16157/j.issn.0258-7998.222711
Author:Wu Leiwei,Zhao Shiwei,Yang Xiangyu
Author Affilications:School of Electric Power,South China University of Technology,Guangzhou 510641,China
DOI:10.16157/j.issn.0258-7998.222597
Author:Zhang Yu,Qian Hongwen,Wang Yi
Author Affilications:China Electronics Technology Group Corporation No.58 Research Institute,Wuxi 214072,China
DOI:10.16157/j.issn.0258-7998.222684
Author:Wang Baole,Lin Peng
Author Affilications:Shaanxi Power Company Xianyang Power Supply Company,Xianyang 712000,China
DOI:10.16157/j.issn.0258-7998.222756
Author:Ma Wei1,2, Cui Haitao1, Zhu Xiaoman1, Hu Changzheng1, Hu Weibo1,2
Author Affilications:1.College of Electronic Information and Optical Engineering, Nankai University, Tianjin 300350, China; 2.Nankai University Shenzhen Graduate School, Shenzhen 518063, China
DOI:10.16157/j.issn.0258-7998.222808
Author:Ren Jihong1,2,Liu Chang1,2
Author Affilications:1.Aerospace Information Research Institute, Chinese Academy of Sciences, Beijing 100190, China; 2.University of Chinese Academy of Sciences, Beijing 100049, China
DOI:10.16157/j.issn.0258-7998.222673
Author:Cheng Zhang,Cai Chunxia,Jiang Wei,Chen Xing
Author Affilications:Science and Technology on Electronic Information Control Laboratory, Chengdu 610036, China
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