DOI:10.16157/j.issn.0258-7998.223134
Author:Li Dejian1,2
Author Affilications:1.Beijing Smartchip Microelectronics Technology Co., Ltd., Beijing 102200, China; 2.School of Integrated Circuits, Tsinghua University, Beijing 100084, China
DOI:10.16157/j.issn.0258-7998.223255
Author:Yu Huijun1,Xiao Yutao1,Jiang Zhihui2
Author Affilications:1.College of Electrical and Information Engineering, Hunan University of Technology, Zhuzhou 412007, China; 2.College of Railway Transportation, Hunan University of Technology, Zhuzhou 412007, China
DOI:10.16157/j.issn.0258-7998.223108
Author:Li Yun1,2,Pan Yali1,Xiao Dong1
Author Affilications:1.School of Electronics Information, Hangzhou Dianzi University, Hangzhou 310018, China; 2.Zhejiang Provincial Key Laboratory of Equipment Electronics, Hangzhou 310018, China
DOI:10.16157/j.issn.0258-7998.223103
Author:Zhao Jiahe,Song Runquan,Xu Weichao,Wang Yunhao,Zhang Xuan
Author Affilications:Shanghai Aerospace Electronic Technology Institute, Shanghai 201109, China
DOI:10.16157/j.issn.0258-7998.223046
Author:Zhang Xiaolei,Dai Zibin,Guo Pengfei,Li Yang
Author Affilications:Information Engineering University, Zhengzhou 450001, China
DOI:10.16157/j.issn.0258-7998.223036
Author:Yuan Jinhuan,Wang Yanling,Yin Lili,Yang Qiao
Author Affilications:Xi′an Microelectronics Technology Institute, Xi′an 710054,China
DOI:10.16157/j.issn.0258-7998.222955
Author:Li Xiang
Author Affilications:Southwest China Institute of Electronic Technology,Chengdu 610036,China
DOI:10.16157/j.issn.0258-7998.223026
Author:Deng Jiawei,Wang Qi,Zhang Meijuan,Zhang Mingyue,Yang Chuwei
Author Affilications:The No.58 Research Institute of China Electronics Technology Group Corporation, Wuxi 214060, China
DOI:10.16157/j.issn.0258-7998.223182
Author:Zhong Shaowu1,Hu Yanhai1,Xu Jianlei2,Chen Haihui2,Zhou Taiping2
Author Affilications:1.Faculty of Mechanical Engineering & Mechanics, Ningbo University, Ningbo 315211, China; 2.Ningbo Hanggong Intelligent Equipment Co., Ltd., Ningbo 315311, China
DOI:10.16157/j.issn.0258-7998.223053
Author:Xu Jinglin,Wang Dong,Wei Bin,Wang Yun,Dou Zhijun,Cheng Song
Author Affilications:Beijing Smart-Chip Microelectronics Technology Co., Ltd., Beijing 100192, China
DOI:10.16157/j.issn.0258-7998.223691
Author:Ma Junwei,Liu Nana,Cheng Sihua,Zang Qi
Author Affilications:Xi′an North Electro-optic Science &Technology Defense Co., Ltd., Xi′an 710043, China
DOI:10.16157/j.issn.0258-7998.223242
Author:Tang Ting
Author Affilications:Southwest China Institute of Electronic Technology, Chengdu 610036, China
DOI:10.16157/j.issn.0258-7998.223075
Author:Yang Xiaotian,Ma Ran,Li Jiang,Gao Fei
Author Affilications:School of Information Science and Technology, Tibet University, Lhasa 850000,China
DOI:10.16157/j.issn.0258-7998.222757
Author:Qian Hongwen1,Zhu Jiangwei1,Wu Yihu1,Yang Xu2,Fang Hai2,Chen Xianzhou2
Author Affilications:1.China Electronics Technology Group Gorporation No.58 Research Institute,Wuxi 214072,China; 2.Xi'an Branch,China Academy of Space Technology,Xi'an 710100,China
DOI:10.16157/j.issn.0258-7998.222866
Author:Gao Bo1,2,Chen Lin1,Yan Yingjian1
Author Affilications:1.Information Engineering University, Zhengzhou 450001, China;2.92957 Troops of PLA, Zhoushan 316000, China
DOI:10.16157/j.issn.0258-7998.222750
Author:Dong Yan,Kuai Liang,Ren Jing,Min Xiaoshuang,Yang Yue
Author Affilications:The Sixth Research Institute of China Electronics Corporation, Beijing 100083, China
DOI:10.16157/j.issn.0258-7998.222826
Author:Ding Zhaohui,Zhang Wei,Yang Guoyu,Liu Teng
Author Affilications:China Datang Group Science and Technology Research Institute Co., Ltd., Beijing 100043, China
DOI:10.16157/j.issn.0258-7998.223009
Author:Zhou Hao,Yan Huizeng,Shi Mengqiao,Cheng Kai
Author Affilications:The 55 Research Institute of China Electronics Technology Group Corporation, Nanjing 210016, China
DOI:10.16157/j.issn.0258-7998.223377
Author:Wang Yi
Author Affilications:Southwest China Institute of Electronic Technology, Chengdu 610036, China
DOI:10.16157/j.issn.0258-7998.223049
Author:Ma Shijuan,Xiao Yongping,Ni Xiaodong
Author Affilications:China Keys System & Integrated Circuit Co.,Ltd., Wuxi 214072, China
DOI:10.16157/j.issn.0258-7998.223374
Author:Liu Tianyun,Liu Shaobin
Author Affilications:College of Electronic and Information Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing 211100, China
DOI:10.16157/j.issn.0258-7998.223113
Author:Guan Jian1,Qian Xuelei2,Han Liujun1,Xue Pei1,Shao Chunwei1
Author Affilications:1.Wuxi Hope Microelectronics Co., Ltd.,Wuxi 214000, China; 2.China Key System&Integrated Circuit Co.,Ltd.,Wuxi 214000, China
DOI:10.16157/j.issn.0258-7998.223024
Author:Wang Yi1,Yi Huan1,Li Songnong2,Feng Ling3,Liu Qilie1,Song Runan4
Author Affilications:1.Communication and Information Engineering College, Chongqing University of Posts and Telecommunications, Chongqing 400067, China;2.Chongqing Electric Power Research Institute, Chongqing 400014, China; 3.Postdoctoral Workstation of the Chongqing Electric Power Corporation, Chongqing 400014, China; 4.China Electric Power Research Institute,Beijing100192,China
DOI:10.16157/j.issn.0258-7998.222980
Author:Li Jianwen,Pan Yongxiong,Xu Jiarui,Liang Kang
Author Affilications:School of Physics and Optoelectronic Engineering, Guangdong University of Technology, Guangzhou 510006, China
DOI:10.16157/j.issn.0258-7998.223631
Author:Yuan Jianfu,Yi Jin,Li Xin,Li Chang,Yan Dong,Ye Linlin
Author Affilications:Chang Guang Satellite Technology Co.,Ltd., Changchun 130000, China
DOI:10.16157/j.issn.0258-7998.223050
Author:Min Xiaoshuang,Kuai Liang,Fang Zhiqi,Dong Yan,Jin Shuyun,Yang Yue
Author Affilications:The Sixth Research Institute of China Electronics Corporation, Beijing 100083, China
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