DOI:10.16157/j.issn.0258-7998.234261
Author:Ying Junjie1,2,Lou Lufei1,2,Xin Yu1,2
Author Affilications:1.College of Information Science and Engineering, Ningbo University, Ningbo 315211, China; 2.Key Laboratory of Mobile Network Application Technology of Zhejiang Province, Ningbo 315211, China
DOI:10.16157/j.issn.0258-7998.234745
Author:Miao Yajun,Li Minghan,Qi Wei
Author Affilications:CAS Quantum Network Co., Ltd., Shanghai 200123, China
DOI:10.16157/j.issn.0258-7998.234428
Author:Li Yao,Hu Junguo,Le Yang
Author Affilications:School of Mathematics and Computer Science, Zhejiang A&F University, Hangzhou 311300, China
DOI:10.16157/j.issn.0258-7998.234075
Author:Fang Haiquan1,2,Deng Mingming1
Author Affilications:1.Zhejiang University of Technology, Hangzhou 310023, China;2.Zhejiang University, Hangzhou 310058, China
DOI:10.16157/j.issn.0258-7998.233831
Author:Wen Xin1,Feng Quanyuan1,Cheng Jian2
Author Affilications:1.Institute of Microelectronics, Southwest Jiaotong University, Chengdu 611756, China; 2.Science & Technology Department of Sichuan Province, Chengdu 610016, China
DOI:10.16157/j.issn.0258-7998.233800
Author:Wang Feng,Zhang Lirong,Wang Lei
Author Affilications:Xi′an R&D Institute, New H3C Semiconductor, Xi′an 710075, China
DOI:DOI: 10.16157/j.issn.0258-7998.234101
Author:Sun Weidong,Hu Xiaogang
Author Affilications:The 58th Research Institute of China Electronics Technology Group Corporation, Wuxi 214072,China
DOI:10.16157/j.issn.0258-7998.233932
Author:Su Xing1,Liu Wei1,2,3,4
Author Affilications:1.School of Physical Science and Technology, Wuhan University, Wuhan 430072, China; 2.School of Microelectronics, Wuhan University, Wuhan 430072, China;3.Hubei Luojia Laboratory, Wuhan 430072, China; 4.Wuhan Institute of Quantum Technology, Wuhan 430072, China
DOI:10.16157/j.issn.0258-7998.234012
Author:Yin Hongquan
Author Affilications:CRRC Nanjing Puzhen Co., Ltd., Nanjing 210000, China
DOI:10.16157/j.issn.0258-7998.234163
Author:Yao Dingyi1,2,Jing Ning1,2,Zhang Minjuan1,2,Yu Tian2
Author Affilications:1.School of Information and Communication Engineering,North University of China, Taiyuan 030051, China; 2.Research Institute of Frontier Interdisciplinary Sciences, North University of China, Taiyuan 030051, China
DOI:10.16157/j.issn.0258-7998.234354
Author:Li Zhanxiong,Liu Liping,Fang Liang,Lv Jiafeng,Wang Ci
Author Affilications:School of Electronic-Electrical Engineering, Ningxia University, Yinchuan 750021, China
DOI:10.16157/j.issn.0258-7998.234333
Author:Li Xinyu1,Zhao Zhijin1,2
Author Affilications:1.School of Communication Engineering, Hangzhou Dianzi University, Hangzhou 310018, China; 2.National Key Laboratory of Communication System Information Control Technology, 36th Research Institute of China Electronics Technology Group, Jiaxing 314001, China
DOI:10.16157/j.issn.0258-7998.234404
Author:Yang Longfei,Lu Shi,Peng Kuang
Author Affilications:School of Microelectronics, Hubei University, Wuhan 430062, China
DOI:10.16157/j.issn.0258-7998.234046
Author:Gu Baoguo,Hao Yaofeng,Ma Dongyang,Zhou Lixin,Tu Jiamu
Author Affilications:Unit 63726 of PLA, Yinchuan 750004, China
DOI:10.16157/j.issn.0258-7998.234583
Author:Du Lin1,2,Zhu Junhu2,Bai Yongqiang1
Author Affilications:1.32085 Unit, Beijing 100000, China; 2.PLA Strategic Support Force Information Engineering University, Zhengzhou 450001, China
DOI:10.16157/j.issn.0258-7998.233885
Author:Zhang Yuhui
Author Affilications:Southwest China Institute of Electronic Technology, Chengdu 610036, China
DOI:10.16157/j.issn.0258-7998.234281
Author:Zhang Kai,Wei Yelong,Chen Qiuju,Wu Congfeng,Pang Jian,Tang Yungai,Du Baiting,Zhang Shancai,Feng Guangyao
Author Affilications:University of Science and Technology of China, Hefei 230026, China
DOI:10.16157/j.issn.0258-7998.234018
Author:Qian Hongwen,Chen Guangwei
Author Affilications:No.58 Research Institute of China Electronics Technology Group Gorporation,Wuxi 214035,China
DOI:10.16157/j.issn.0258-7998.233912
Author:Ji Yanping1,Li Jiawei1,Chai Donglin2,Zhao Boyan1,Zhao Yanran1,Wang Shirui1,Wang Wensi1, Zheng Mengyi3
Author Affilications:1.Key Laboratory of Optoelectronic Techology, Ministry of Education, Beijing University of Technology, Beijing 100124, China; 2.School of Control and Computer Engineering, North China Electric Power University, Beijing 100096, China; 3.School of Social Sciences, China University of Political Science and Law, Beijing 100091, China
DOI:10.16157/j.issn.0258-7998.233749
Author:Yang Bozan1,Ni Ziyue2,Wang Yingqian1
Author Affilications:1.NCS Testing Technology Co., Ltd., Beijing 100094, China; 2.Central Iron and Steel Research Institute, Beijing 100083, China
DOI:10.16157/j.issn.0258-7998.233941
Author:Tang Jie1,Huang Ming1,Lin Jianxi2,Cheng Cheng2,Yang Jingjing1
Author Affilications:1.School of Information Science and Engineering, Yunnan University, Kunming 650091, China; 2.Radio Monitoring Center of Yunnan Province, Kunming 650228, China
DOI:10.16157/j.issn.0258-7998.234228
Author:Zhou Yang,Li Jianpeng,Wang Zhiyu,Liang Qingzhen
Author Affilications:Sichuan Cric Technology Co., Ltd., Chengdu 610041, China
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