DOI:10.16157/j.issn.0258-7998.2016.03.001
Author:Wang Quan1,2,Xie Yunxiang3,Hui Xiaoqiang1,2
Author Affilications:1.AVIC Computing Technique Research Institute,Xi′an 710068,China; 2.Aviation Key Laboratory of Science and Technology on Integrated Circuit and Micro-System Design,Xi′an 710068,China; 3.Xi′an Xiangteng Microelectronics Technology CO.,LTD,Xi′an 710068,China
DOI:10.16157/j.issn.0258-7998.2016.03.002
Author:Hui Xiaoqiang1,2,Li Chang3,Deng Gaungzhen3
Author Affilications:1.AVIC Computing Technique Research Institute,Xi′an 710068,China; 2.Aviation Key Laboratory of Science and Technology on Integrated Circuit and Micro-System Design,Xi′an 710068,China; 3.Xi′an Xiangteng Microelectronics Technology CO.,LTD,Xi′an 710068,China
DOI:10.16157/j.issn.0258-7998.2016.03.003
Author:Shao Gang1,2,Lang Jing3,Xie Yunxiang3
Author Affilications:1.AVIC Computing Technique Research Institute,Xi′an 710068,China; 2.Aviation Key Laboratory of Science and Technology on Integrated Circuit and Micro-System Design,Xi′an 710068,China; 3.Xi′an Xiangteng Microelectronics Technology CO.,LTD,Xi′an 710068,China
DOI:10.16157/j.issn.0258-7998.2016.03.004
Author:Cai Yefang1,2,Shao Gang1,2,Li Chang3,Xie Yunxiang3
Author Affilications:1.AVIC Computing Technique Research Institute,Xi′an 710068,China; 2.Aviation Key Laboratory of Science and Technology on Integrated Circuit and Micro-System Design,Xi′an 710068,China; 3.Xi′an Xiangteng Microelectronics Technology CO.,LTD,Xi′an 710068,China
DOI:10.16157/j.issn.0258-7998.2016.03.005
Author:Yang Feng1,2,Suo Gaohua3,Xie Yalong3
Author Affilications:1.AVIC Computing Technique Research Institute,Xi′an 710068,China; 2.Aviation Key Laboratory of Science and Technology on Integrated Circuit and Micro-System Design,Xi′an 710068,China; 3.Xi′an Xiangteng Microelectronics Technology CO.,LTD,Xi′an 710068,China
DOI:10.16157/j.issn.0258-7998.2016.03.006
Author:Wang Xin1,2,Zhang Zheng3,Zhang Weihua1,2
Author Affilications:1.Software School,Fudan University,Shanghai 201203,China; 2.Shanghai Key Laboratory of Data Science,Shanghai 200433,China; 3.State Key Laboratory of Mathematical Engineering and Advanced Computing,Zhengzhou 450001,China
DOI:10.16157/j.issn.0258-7998.2016.03.007
Author:Zhang Diya1,2,Liang Ting1,2,Yao Zong1,2,Li Wangwang1,2,Zhang Rui1,2,Xiong Jijun1,2
Author Affilications:1.Key Laboratory of Instrumentation Science & Dynamic Measurement(North University of China), Ministry of Education,Taiyuan 030051,China; 2.Science and Technology on Electronic Test & Measurement Laboratory,North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.2016.03.008
Author:Wang Shuo,Ma Yongkui,Gao Yulong,Zhang Shiwei,Zhao Donglai
Author Affilications:Communication Research Center,Harbin Institute of Technology,Harbin 150001,China
DOI:10.16157/j.issn.0258-7998.2016.03.009
Author:Li Jie,Ren Yongfeng,Li Huijing
Author Affilications:National Key Laboratory for Electronic Measurement Technology,North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.2016.03.010
Author:Wang Shaoqing,Ye Chunhui,Hu Yangcong
Author Affilications:SI-EN Technology Xiamen Ltd.,Xiamen 361005,China
DOI:10.16157/j.issn.0258-7998.2016.03.011
Author:Yin Peipei
Author Affilications:Computer Center,Nanjing University of Aeronautics and Astronautics,Nanjing 210016,China
DOI:10.16157/j.issn.0258-7998.2016.03.012
Author:Lei Xiaofeng1,Li Tao2
Author Affilications:1.School of Computer,Xi′an University of Posts and Telecommunications,Xi′an 710061,China; 2.School of Electronic Engineering,Xi′an University of Posts and Telecommunications,Xi′an 710061,China
DOI:10.16157/j.issn.0258-7998.2016.03.013
Author:Dai Wenqiang,Li Guiyong
Author Affilications:Chongqing University of Posts and Telecommunications,Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.2016.03.014
Author:Zhao Xiaojun,Zhan Zhao,Zhou Xisi
Author Affilications:School of Electronic Information Engineering,Hebei University,Baoding 071000,China
DOI:10.16157/j.issn.0258-7998.2016.03.015
Author:Huang Hu,Tang Hui
Author Affilications:School of Information Science and Technology,Chengdu University of Technology,Chengdu 610059,China
DOI:10.16157/j.issn.0258-7998.2016.03.016
Author:Dong Kun,Chen Bo,Zhao Zhongquan
Author Affilications:Research Institute of Electronic Science and Technology,University of Electronic Science and Technology,Chengdu 611731,China
DOI:10.16157/j.issn.0258-7998.2016.03.017
Author:Tian Guangdong,Ye Xin
Author Affilications:School of Communication and Information Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.2016.03.018
Author:Liang Guangsheng,Cui Wenzhe
Author Affilications:College of Electrical and Electronic Engineering,North China Electric Power University,Beijing 102206,China
DOI:10.16157/j.issn.0258-7998.2016.03.019
Author:Zheng Zhibo,Jiang Guiping
Author Affilications:School of Biomedical Enginnering,Southern Medical University,Guangzhou 510515,China
DOI:10.16157/j.issn.0258-7998.2016.03.020
Author:Li Jinming1,2,Yan Xiaojun1,2,Jiang Xudong1,2,Wen Jie1,2,Huan Tao3
Author Affilications:1.Key Laboratory of instrumentation Science & Dynamic Measurement of Ministry of Education, North University of China,Taiyuan 030051,China; 2.National Key Laboratory for Electronic Measurement Technology,North University of China,Taiyuan 030051,China; 3.Capital Aerospace Machinery Company,Beijing 100076,China
DOI:10.16157/j.issn.0258-7998.2016.03.021
Author:Qin Binyi1,2,Qiu Jie3,Zheng Jincun1,Dong Jiyou4
Author Affilications:1.Electronic and Communication Engineering College,Yulin Normal University,Yulin 537000,China; 2.School of Elecrto-Mechanical Engineering,Xidian University,Xi′an 710071,China; 3.Computer Science and Engineering College,Yulin Normal University,Yulin 537000,China; 4.Department of Student Affairs,Yulin Normal University,Yulin 537000,China
DOI:10.16157/j.issn.0258-7998.2016.03.022
Author:Qiao Ziqiang1,Liu Jin1,2,Zhou Dongping3
Author Affilications:1.College of Safety Engineering,Chongqing University of Science & Technology,Chongqing 401331,China; 2.Chongqing Energy Investment Corp.,Chongqing 401121,China; 3.Chongqing Energy Technology Investment Group Co.,Ltd,Chongqing 400061,China
DOI:10.16157/j.issn.0258-7998.2016.03.023
Author:Song Tingting1,Luo Ruilong1,2
Author Affilications:1.Shanghai Engineering Research Center of Hadal Scicence and Technology,Shanghai 201306,China; 2.Hadal Science and Technology Research Center,Shanghai Ocean University,Shanghai 201306,China
DOI:10.16157/j.issn.0258-7998.2016.03.024
Author:Shi Yaozheng1,Ku Liuheng2
Author Affilications:1.Hohhot Railway Bureau,Hohhot 010020,China; 2.National Computer System Engineering Research Institute of China,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.2016.03.025
Author:Yi Yi1,2,Yan Xuelong1,Hao Jianwei2
Author Affilications:1.School of Electronic Engineering and Automation,Guilin University of Electronic Technology,Guilin 541004,China; 2.Institute of Information Technology,Guilin University of Electronic Technology,Guilin 541004,China
DOI:10.16157/j.issn.0258-7998.2016.03.026
Author:Zhang Yan
Author Affilications:Ningxia Vocational Technical College of Industry and Commerce,Yinchuan 750021,China
DOI:10.16157/j.issn.0258-7998.2016.03.027
Author:Feng Ansong1,2,3,Wang Hong1,4,Zhang Yanwu4
Author Affilications:1.Shenyang Institute of Automation Chinese Academy of Sciences,Shenyang 110016,China; 2.College of Information Engineering,Shenyang University of Chemical Technology,Shenyang 110142,China; 3.University of Chinese Academy of Sciences,Beijing 100039,China; 4.Microcyber Corporation,Shenyang 110179,China
DOI:10.16157/j.issn.0258-7998.2016.03.028
Author:Zhou Enhui1,Liu Yana2
Author Affilications:1.College of Mathematics and Information Science,Hebei Normal University,Shijiazhuang 050024,China; 2.College of Mathematics and Information Science,Shijiazhuang University,Shijiazhuang 050035,China
DOI:10.16157/j.issn.0258-7998.2016.03.029
Author:Jiang Xiaolei,Zhang Tianqi,Zhao Juntao
Author Affilications:Chongqing Key Laboratory of Signal and Information Processing,Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.2016.03.030
Author:Zhao Hongmei,Wu Yanan
Author Affilications:College of Electric and Information Engineering,Zhengzhou University of Light Industry,Zhengzhou 450000,China
DOI:10.16157/j.issn.0258-7998.2016.03.031
Author:Yu Chengbo,Kong Qingda,Qian Zewen,Yu Yujie
Author Affilications:Institute of Remote Test and Control,Chongqing University of Technology,Chongqing 400054,China
DOI:10.16157/j.issn.0258-7998.2016.03.032
Author:Zhou Jingjing,Chen Qinghu,Peng Wenhua,Yan Yuchen
Author Affilications:School of Electronic Information,Wuhan University,Wuhan 430072,China
DOI:10.16157/j.issn.0258-7998.2016.03.033
Author:Zhao Limin,Zhu Xiaojun,Gao Xurui
Author Affilications:College of Computer Science and Technology,Taiyuan University of Technology,Jinzhong 030600,China
DOI:10.16157/j.issn.0258-7998.2016.03.034
Author:Kong Liang,Hu Nan,Sun Bing
Author Affilications:School of Electronic and Information Engineering,Soochow University,Suzhou 215006,China
DOI:10.16157/j.issn.0258-7998.2016.03.035
Author:Ao Yinhui,Wang Cuifen
Author Affilications:College of Electromechanical Engineering,Guangdong University Technology,Guangzhou 510006,China
DOI:10.16157/j.issn.0258-7998.2016.03.036
Author:Zhu Li
Author Affilications:Collge of Computer,Xi′an University of Science and Technology,Xi′an 710054,China
DOI:10.16157/j.issn.0258-7998.2016.03.037
Author:Jia Zhijie,Liu Fan,Gan Degang
Author Affilications:State Grid Sichuan Electric Power Research Institute,Chengdu 610072,China
DOI:10.16157/j.issn.0258-7998.2016.03.038
Author:Wang Su′e1,Hu Yicheng1,Zhang Yixi2
Author Affilications:1.College of Electrical and Information Engineering,Shaanxi University of Science & Technology,Xi′an 710021,China; 2.School of Automoble,Chang'an University,Xi′an 710064,China
DOI:10.16157/j.issn.0258-7998.2016.03.039
Author:Li Zhijun,Qin Xiaoxue,Zhang Xuantao,Liu Hanzheng,Liu Shuang
Author Affilications:Hebei University of Technology,Control Science and Engineering Academy,Tianjin 300130,China
DOI:10.16157/j.issn.0258-7998.2016.03.040
Author:Dou Youting,Ma Haixiao,Ye Haiyun
Author Affilications:Nanjing University of Posts and Telecommunications,Nanjing 210046,China
DOI:10.16157/j.issn.0258-7998.2016.03.041
Author:Yu Zixi,Xie Yue
Author Affilications:College of Mechanical and Electrical Engineering,China Jiliang University,Hangzhou 310018,China
Information Flow and Energy Flow in Industrial Digital Transformation
Special Antenna and Radio Frequency Front End
Radar Target Tracking Technology
Key Technologies of 5G-A and 6G
Key Technologies of 5G and Its Evolution
Key Technologies of 5G and Its Evolution
Processing and Application of Marine Target Characteristic Data
Antenna Technology and Its Applications
5G Vertical Industry Application
Microelectronics in Medical and Healthcare
Application of Edge Computing in IIoT
Deep Learning and Image Recognization
6G Microwave Millimeter-wave Technology
Radar Processing Technology and Evaluation
Space-Ground Integrated Technology
5G Vertical Industry Application
FPGA and Artificial Intelligence
Innovation and Application of PKS System
5G Network Construction and Optimization
Network and Business Requirements for 6G
5G and Intelligent Transportation
5G R16 Core Network Evolution Technology
Satellite Nevigation Technology
5G Wireless Network Evolution Technology
5G Network Planning Technology
5G Co-construction and Sharing Technology
5G and Emergency Communication
5G Slicing Technology and Its Applications
5G Terminal Key Realization Technology
5G and Artificial Intelligence
Terahertz Technology and Its Application
Signal and Information Processing
Internet of Things and the Industrial Big Data
Electronic Techniques of UAV System
Aerospace Electronic Technology
Robot and Industrial Automation
ADAS Technique and Its Implementation
2016 IEEE International Conference on Integrated Circuits and Microsystems
Measurement and Control Technology of Bus Network
Key Techniques of 5G and Algorthm Implement