DOI:10.16157/j.issn.0258-7998.2016.03.001
Author:Wang Quan1,2,Xie Yunxiang3,Hui Xiaoqiang1,2
Author Affilications:1.AVIC Computing Technique Research Institute,Xi′an 710068,China; 2.Aviation Key Laboratory of Science and Technology on Integrated Circuit and Micro-System Design,Xi′an 710068,China; 3.Xi′an Xiangteng Microelectronics Technology CO.,LTD,Xi′an 710068,China
DOI:10.16157/j.issn.0258-7998.2016.03.002
Author:Hui Xiaoqiang1,2,Li Chang3,Deng Gaungzhen3
Author Affilications:1.AVIC Computing Technique Research Institute,Xi′an 710068,China; 2.Aviation Key Laboratory of Science and Technology on Integrated Circuit and Micro-System Design,Xi′an 710068,China; 3.Xi′an Xiangteng Microelectronics Technology CO.,LTD,Xi′an 710068,China
DOI:10.16157/j.issn.0258-7998.2016.03.003
Author:Shao Gang1,2,Lang Jing3,Xie Yunxiang3
Author Affilications:1.AVIC Computing Technique Research Institute,Xi′an 710068,China; 2.Aviation Key Laboratory of Science and Technology on Integrated Circuit and Micro-System Design,Xi′an 710068,China; 3.Xi′an Xiangteng Microelectronics Technology CO.,LTD,Xi′an 710068,China
DOI:10.16157/j.issn.0258-7998.2016.03.004
Author:Cai Yefang1,2,Shao Gang1,2,Li Chang3,Xie Yunxiang3
Author Affilications:1.AVIC Computing Technique Research Institute,Xi′an 710068,China; 2.Aviation Key Laboratory of Science and Technology on Integrated Circuit and Micro-System Design,Xi′an 710068,China; 3.Xi′an Xiangteng Microelectronics Technology CO.,LTD,Xi′an 710068,China
DOI:10.16157/j.issn.0258-7998.2016.03.005
Author:Yang Feng1,2,Suo Gaohua3,Xie Yalong3
Author Affilications:1.AVIC Computing Technique Research Institute,Xi′an 710068,China; 2.Aviation Key Laboratory of Science and Technology on Integrated Circuit and Micro-System Design,Xi′an 710068,China; 3.Xi′an Xiangteng Microelectronics Technology CO.,LTD,Xi′an 710068,China
DOI:10.16157/j.issn.0258-7998.2016.03.006
Author:Wang Xin1,2,Zhang Zheng3,Zhang Weihua1,2
Author Affilications:1.Software School,Fudan University,Shanghai 201203,China; 2.Shanghai Key Laboratory of Data Science,Shanghai 200433,China; 3.State Key Laboratory of Mathematical Engineering and Advanced Computing,Zhengzhou 450001,China
DOI:10.16157/j.issn.0258-7998.2016.03.007
Author:Zhang Diya1,2,Liang Ting1,2,Yao Zong1,2,Li Wangwang1,2,Zhang Rui1,2,Xiong Jijun1,2
Author Affilications:1.Key Laboratory of Instrumentation Science & Dynamic Measurement(North University of China), Ministry of Education,Taiyuan 030051,China; 2.Science and Technology on Electronic Test & Measurement Laboratory,North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.2016.03.008
Author:Wang Shuo,Ma Yongkui,Gao Yulong,Zhang Shiwei,Zhao Donglai
Author Affilications:Communication Research Center,Harbin Institute of Technology,Harbin 150001,China
DOI:10.16157/j.issn.0258-7998.2016.03.009
Author:Li Jie,Ren Yongfeng,Li Huijing
Author Affilications:National Key Laboratory for Electronic Measurement Technology,North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.2016.03.010
Author:Wang Shaoqing,Ye Chunhui,Hu Yangcong
Author Affilications:SI-EN Technology Xiamen Ltd.,Xiamen 361005,China
DOI:10.16157/j.issn.0258-7998.2016.03.011
Author:Yin Peipei
Author Affilications:Computer Center,Nanjing University of Aeronautics and Astronautics,Nanjing 210016,China
DOI:10.16157/j.issn.0258-7998.2016.03.012
Author:Lei Xiaofeng1,Li Tao2
Author Affilications:1.School of Computer,Xi′an University of Posts and Telecommunications,Xi′an 710061,China; 2.School of Electronic Engineering,Xi′an University of Posts and Telecommunications,Xi′an 710061,China
DOI:10.16157/j.issn.0258-7998.2016.03.013
Author:Dai Wenqiang,Li Guiyong
Author Affilications:Chongqing University of Posts and Telecommunications,Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.2016.03.014
Author:Zhao Xiaojun,Zhan Zhao,Zhou Xisi
Author Affilications:School of Electronic Information Engineering,Hebei University,Baoding 071000,China
DOI:10.16157/j.issn.0258-7998.2016.03.015
Author:Huang Hu,Tang Hui
Author Affilications:School of Information Science and Technology,Chengdu University of Technology,Chengdu 610059,China
DOI:10.16157/j.issn.0258-7998.2016.03.016
Author:Dong Kun,Chen Bo,Zhao Zhongquan
Author Affilications:Research Institute of Electronic Science and Technology,University of Electronic Science and Technology,Chengdu 611731,China
DOI:10.16157/j.issn.0258-7998.2016.03.017
Author:Tian Guangdong,Ye Xin
Author Affilications:School of Communication and Information Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.2016.03.018
Author:Liang Guangsheng,Cui Wenzhe
Author Affilications:College of Electrical and Electronic Engineering,North China Electric Power University,Beijing 102206,China
DOI:10.16157/j.issn.0258-7998.2016.03.019
Author:Zheng Zhibo,Jiang Guiping
Author Affilications:School of Biomedical Enginnering,Southern Medical University,Guangzhou 510515,China
DOI:10.16157/j.issn.0258-7998.2016.03.020
Author:Li Jinming1,2,Yan Xiaojun1,2,Jiang Xudong1,2,Wen Jie1,2,Huan Tao3
Author Affilications:1.Key Laboratory of instrumentation Science & Dynamic Measurement of Ministry of Education, North University of China,Taiyuan 030051,China; 2.National Key Laboratory for Electronic Measurement Technology,North University of China,Taiyuan 030051,China; 3.Capital Aerospace Machinery Company,Beijing 100076,China
DOI:10.16157/j.issn.0258-7998.2016.03.021
Author:Qin Binyi1,2,Qiu Jie3,Zheng Jincun1,Dong Jiyou4
Author Affilications:1.Electronic and Communication Engineering College,Yulin Normal University,Yulin 537000,China; 2.School of Elecrto-Mechanical Engineering,Xidian University,Xi′an 710071,China; 3.Computer Science and Engineering College,Yulin Normal University,Yulin 537000,China; 4.Department of Student Affairs,Yulin Normal University,Yulin 537000,China
DOI:10.16157/j.issn.0258-7998.2016.03.022
Author:Qiao Ziqiang1,Liu Jin1,2,Zhou Dongping3
Author Affilications:1.College of Safety Engineering,Chongqing University of Science & Technology,Chongqing 401331,China; 2.Chongqing Energy Investment Corp.,Chongqing 401121,China; 3.Chongqing Energy Technology Investment Group Co.,Ltd,Chongqing 400061,China
DOI:10.16157/j.issn.0258-7998.2016.03.023
Author:Song Tingting1,Luo Ruilong1,2
Author Affilications:1.Shanghai Engineering Research Center of Hadal Scicence and Technology,Shanghai 201306,China; 2.Hadal Science and Technology Research Center,Shanghai Ocean University,Shanghai 201306,China
DOI:10.16157/j.issn.0258-7998.2016.03.024
Author:Shi Yaozheng1,Ku Liuheng2
Author Affilications:1.Hohhot Railway Bureau,Hohhot 010020,China; 2.National Computer System Engineering Research Institute of China,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.2016.03.025
Author:Yi Yi1,2,Yan Xuelong1,Hao Jianwei2
Author Affilications:1.School of Electronic Engineering and Automation,Guilin University of Electronic Technology,Guilin 541004,China; 2.Institute of Information Technology,Guilin University of Electronic Technology,Guilin 541004,China
DOI:10.16157/j.issn.0258-7998.2016.03.026
Author:Zhang Yan
Author Affilications:Ningxia Vocational Technical College of Industry and Commerce,Yinchuan 750021,China
DOI:10.16157/j.issn.0258-7998.2016.03.027
Author:Feng Ansong1,2,3,Wang Hong1,4,Zhang Yanwu4
Author Affilications:1.Shenyang Institute of Automation Chinese Academy of Sciences,Shenyang 110016,China; 2.College of Information Engineering,Shenyang University of Chemical Technology,Shenyang 110142,China; 3.University of Chinese Academy of Sciences,Beijing 100039,China; 4.Microcyber Corporation,Shenyang 110179,China
DOI:10.16157/j.issn.0258-7998.2016.03.028
Author:Zhou Enhui1,Liu Yana2
Author Affilications:1.College of Mathematics and Information Science,Hebei Normal University,Shijiazhuang 050024,China; 2.College of Mathematics and Information Science,Shijiazhuang University,Shijiazhuang 050035,China
DOI:10.16157/j.issn.0258-7998.2016.03.029
Author:Jiang Xiaolei,Zhang Tianqi,Zhao Juntao
Author Affilications:Chongqing Key Laboratory of Signal and Information Processing,Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.2016.03.030
Author:Zhao Hongmei,Wu Yanan
Author Affilications:College of Electric and Information Engineering,Zhengzhou University of Light Industry,Zhengzhou 450000,China
DOI:10.16157/j.issn.0258-7998.2016.03.031
Author:Yu Chengbo,Kong Qingda,Qian Zewen,Yu Yujie
Author Affilications:Institute of Remote Test and Control,Chongqing University of Technology,Chongqing 400054,China
DOI:10.16157/j.issn.0258-7998.2016.03.032
Author:Zhou Jingjing,Chen Qinghu,Peng Wenhua,Yan Yuchen
Author Affilications:School of Electronic Information,Wuhan University,Wuhan 430072,China
DOI:10.16157/j.issn.0258-7998.2016.03.033
Author:Zhao Limin,Zhu Xiaojun,Gao Xurui
Author Affilications:College of Computer Science and Technology,Taiyuan University of Technology,Jinzhong 030600,China
DOI:10.16157/j.issn.0258-7998.2016.03.034
Author:Kong Liang,Hu Nan,Sun Bing
Author Affilications:School of Electronic and Information Engineering,Soochow University,Suzhou 215006,China
DOI:10.16157/j.issn.0258-7998.2016.03.035
Author:Ao Yinhui,Wang Cuifen
Author Affilications:College of Electromechanical Engineering,Guangdong University Technology,Guangzhou 510006,China
DOI:10.16157/j.issn.0258-7998.2016.03.036
Author:Zhu Li
Author Affilications:Collge of Computer,Xi′an University of Science and Technology,Xi′an 710054,China
DOI:10.16157/j.issn.0258-7998.2016.03.037
Author:Jia Zhijie,Liu Fan,Gan Degang
Author Affilications:State Grid Sichuan Electric Power Research Institute,Chengdu 610072,China
DOI:10.16157/j.issn.0258-7998.2016.03.038
Author:Wang Su′e1,Hu Yicheng1,Zhang Yixi2
Author Affilications:1.College of Electrical and Information Engineering,Shaanxi University of Science & Technology,Xi′an 710021,China; 2.School of Automoble,Chang'an University,Xi′an 710064,China
DOI:10.16157/j.issn.0258-7998.2016.03.039
Author:Li Zhijun,Qin Xiaoxue,Zhang Xuantao,Liu Hanzheng,Liu Shuang
Author Affilications:Hebei University of Technology,Control Science and Engineering Academy,Tianjin 300130,China
DOI:10.16157/j.issn.0258-7998.2016.03.040
Author:Dou Youting,Ma Haixiao,Ye Haiyun
Author Affilications:Nanjing University of Posts and Telecommunications,Nanjing 210046,China
DOI:10.16157/j.issn.0258-7998.2016.03.041
Author:Yu Zixi,Xie Yue
Author Affilications:College of Mechanical and Electrical Engineering,China Jiliang University,Hangzhou 310018,China
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