DOI:10.16157/j.issn.0258-7998.2017.05.001
Author:Hao Chuangbo,Song Ping
Author Affilications:School of Mechatronic Engineering,Beijing Institute of Technology,Beijing 100081,China
DOI:10.16157/j.issn.0258-7998.2017.05.002
Author:Liu Ding1,2,Li Xin′e1,2,Cui Chunsheng1,2,You Wenbin1,2,Wang Peng1,2
Author Affilications:1.National Key Laboratory for Electronic Measurement Technology,North University of China, Taiyuan 030051,China; 2.Instrument Science and Dynamic Test Laboratory,North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.2017.05.003
Author:Zheng You1,2,Fang Dandan2,Zeng Chunnian2
Author Affilications:1.School of electronic information engineering,Ningbo university of technology,Ningbo 315000,China; 2.School of Automation,Wuhan University of Technology,Wuhan 430070,China
DOI:10.16157/j.issn.0258-7998.2017.05.004
Author:Dang Hongshe,Hou Jinliang,Qiang Hua,Zhang Chao
Author Affilications:School of Electrical and Information Engineering,Shaanxi University of Science and Technology,Xi′an 710021,China
DOI:10.16157/j.issn.0258-7998.2017.05.005
Author:Lu Jingyu1,2,Yu Wentao1,2,Zhao Xin1,2,Sun Guangyi1,2
Author Affilications:1.College of Computer and Control Engineering,Nankai University,Tianjin 300350,China; 2.Tianjin Key Laboratory of Intelligent Robotics,Nankai University,Tianjin 300350,China
DOI:10.16157/j.issn.0258-7998.2017.05.006
Author:Li Fujuan1,Wang Qun1,2,Qian Huanyan2
Author Affilications:1.Department of Computer Information and Cyber Security,Jiangsu Police Institute,Nanjing 210031,China; 2.School of Computer Science and Technology,Nanjing University of Science and Technology,Nanjing 210094,China
DOI:10.16157/j.issn.0258-7998.2017.05.007
Author:Peng He,Wang Jun
Author Affilications:School of Information Engineering,Southwest University of Science and Technology,Mianyang 621000,China
DOI:10.16157/j.issn.0258-7998.2017.05.008
Author:Huang Youwen,Dong Yang
Author Affilications:School of Information Engineering,Jiangxi University of Science and Technology,Ganzhou 341000,China
DOI:10.16157/j.issn.0258-7998.2017.05.009
Author:Li Ping1,Li Yuan2,Kong Yinchang3
Author Affilications:1.School of Information Engineering,Huanghuai University,Zhumadian 463000,China; 2.State Grid Chongqing Electric Power Company Information and Communications Branch,Chongqing 400014,China; 3.School of Culture and Communication,Huanghuai University,Zhumadian 463000,China
DOI:10.16157/j.issn.0258-7998.2017.05.010
Author:Yin Yongsheng,Wu Jingsheng,Chen Hongmei,Li Kun
Author Affilications:School of Microelectronics,Hefei University of Technology,Hefei 230009,China
DOI:10.16157/j.issn.0258-7998.2017.05.011
Author:Yan Yingjian,Wang Shoucheng,Xu Jijun,Wang Zhong
Author Affilications:College of Cipher Engineering,PLA Information Engineering University,Zhengzhou 450001,China
DOI:10.16157/j.issn.0258-7998.2017.05.012
Author:Xu Hong1,Ye Feng2,Huang Chaogeng3
Author Affilications:1.College of Information Engineering,Zhejiang University of Technology,Hangzhou 310023,China; 2.Hangzhou Nationalchip Science & Technology Co.Ltd.,Hangzhou 310012,China; 3.School of Information,Zhejiang University of Finance & Economics,Hangzhou 310018,China
DOI:10.16157/j.issn.0258-7998.2017.05.013
Author:Deng Yi,Tian Ze,Han Limin
Author Affilications:Xi′an Aeronautics Computing Technique Research Institute,AVIC,Xi′an 710065,China
DOI:10.16157/j.issn.0258-7998.2017.05.014
Author:Wang Jigang1,Fang Fang2,Zhang Huaqiang1
Author Affilications:1.Technology Planning Department,ZTE Corporation,Nanjing 210012,China; 2.Information Center Department,The IT Electronics 11th Design & Research Institute Science and Technological Engineering Corporation,Chengdu 610021,China
DOI:10.16157/j.issn.0258-7998.2017.05.015
Author:Gao Zhengzhong,Zhao Chenhui,Xue Han,Shang Chunlei
Author Affilications:College of Electrical Engineering and Automation,Shandong University of Science and Technology,Qingdao 266590,China
DOI:10.16157/j.issn.0258-7998.2017.05.016
Author:Chen Ruyin,Lai Songlin
Author Affilications:College of Physics and Information Engineering,Fuzhou University,Fuzhou 350108,China
DOI:10.16157/j.issn.0258-7998.2017.05.017
Author:Peng Xiwu,Zhang Tao
Author Affilications:Institute of Information Science and Engineering,Wuhan University of Science and Technology,Wuhan 430081,China
DOI:10.16157/j.issn.0258-7998.2017.05.018
Author:Sun Bo1,2,Wen Xuxia1,2,Gong Shuhong3,Liu Xinsheng4
Author Affilications:1.School of Instrument and Electronics,North University of China,Taiyuan 030051,China; 2.Shanxi Baixin Information Technology Co.,Ltd,Taiyuan 030006,China; 3.Shougang Changzhi Iron&Steel Co.,Ltd,Changzhi 046031,China; 4.Jiangsu Shuguang Photoelectrical Co.,Ltd,Yangzhou 225009,China
DOI:10.16157/j.issn.0258-7998.2017.05.019
Author:Zhang Longxiang,Wang Xiangjun,Cao Yu
Author Affilications:MOEMS Education Ministry Key Lab.,Tianjin University,Tianjin 300072,China
DOI:10.16157/j.issn.0258-7998.2017.05.020
Author:Zhang Song1,Hong Tao1,Sheng Quangen2
Author Affilications:1.College of Quality & Safety Engineering,China Jiliang University,Hangzhou 310018,China; 2.Zhejiang Huacai Technology Limited,Hangzhou 310023,China
DOI:10.16157/j.issn.0258-7998.2017.05.021
Author:Yang Jinpeng,Liang Dong,Yang Tao,Zhang Zhixin
Author Affilications:Control and Measurement Technology Department,China Academy of Aerospace Aerodynamics,Beijing 100074,China
DOI:10.16157/j.issn.0258-7998.2017.05.022
Author:Weng Tianyang1,Zhuang Yu1,Yu Wei2,Liu Yunfei1
Author Affilications:1.College of Information Science and Technology,Nanjing Forestry University,Nanjing 210037,China; 2.Engineering Training Center,Nantong University,Nantong 226019,China
DOI:10.16157/j.issn.0258-7998.2017.05.023
Author:Zha Tianyi1,Chen Shengqi2,Ge Junyao3
Author Affilications:1.Jiangsu Province Changshu High School,Suzhou 215500,China; 2.Department of Electrical Engineering,Tsinghua University,Beijing 100084,China; 3.College of Telecommunications & Information Engineering,Nangjing University of Posts and Telecommunications, Nanjing 210023,China
DOI:10.16157/j.issn.0258-7998.2017.05.024
Author:Jiang Weihua,Ma Linchao,Zheng Xianfeng
Author Affilications:Department of Electrical Engineering,Henan Institute of Technology,Xingxiang 453000,China
DOI:10.16157/j.issn.0258-7998.2017.05.025
Author:Qiu Yongcheng,Xie Rongqing,Guo Yi
Author Affilications:Geophysical Department,China Oilfield Services Limited,Tianjin 300450,China
DOI:10.16157/j.issn.0258-7998.2017.05.026
Author:Zhang Tiansheng1,Zhang Xiaolin1,Li Zan2
Author Affilications:1.School of Electronic and Information Engineering,Beihang University,Beijing 100191,China; 2.Beijing Institute of Tracking and Telecommunication Technology,Beijing 100094,China
DOI:10.16157/j.issn.0258-7998.2017.05.027
Author:Shang Sujuan1,2,Xu Yaohua1,Luo Jufeng2,Qiu Yunzhou2
Author Affilications:1.Key laboratory of Intelligent Computing & Signal Processing(Anhui University),Ministry of Education,Hefei 230026,China; 2.Shanghai Internet of Things CO.,Ltd,Shanghai 200050,China
DOI:10.16157/j.issn.0258-7998.2017.05.028
Author:Chen Zezong1,2,Yang Gan1,Zhao Chen1,He Chao1
Author Affilications:1.School of Electronic Information,Wuhan University,Wuhan 430072,China; 2.Collaborative Innovation Center for Geospatial Technology,Wuhan University,Wuhan 430079,China
DOI:10.16157/j.issn.0258-7998.2017.05.029
Author:Liu Sheng1,Wang Jiangtao2
Author Affilications:1.Information Center,Sichuan College of Traditional Chinese Medicine,Mianyang 621000,China; 2.School of Software Engineering,Chongqing University of Posts and Telecommunications,Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.2017.05.030
Author:Ren Zhi,Wang Zhongyong,Zhang Yong
Author Affilications:Chongqing Key Lab of Mobile Communication Technology,Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.2017.05.031
Author:Wang Lina1,Yang Jian2,Meng Qingqiang3
Author Affilications:1.Mathematics and Information Technology,Jiangsu Second Normal University,Nanjing 210036,China; 2.Information Construction and Management Office,Jiangsu Second Normal University,Nanjing 210036,China; 3.Nanjing NARI Group ICT Branch,Nanjing 210003,China
DOI:10.16157/j.issn.0258-7998.2017.05.032
Author:Chen Guoqiang1,Zhu Chongye2
Author Affilications:1.Hangzhou Vocational and Technology College,Hangzhou 310018,China; 2.Ningbo Sunrise Instruments Co.,Ltd.,Ningbo 315032,China
DOI:10.16157/j.issn.0258-7998.2017.05.033
Author:Xue Jiale,Cheng hang
Author Affilications:College of Mechanical Engineering,Taiyuan University of Technology,Taiyuan 030024,China
DOI:10.16157/j.issn.0258-7998.2017.05.034
Author:Zhou Yang,Hu Guiming,Huang Dongfang
Author Affilications:College of Electrical Engineering,Guangxi University,Nanning 530004,China
DOI:10.16157/j.issn.0258-7998.2017.05.035
Author:Fu Min,Ji Baojian,Huang Shengming
Author Affilications:College of Electrical Engineering and Control Science,Nanjing TECH University,Nanjing 211816,China
DOI:10.16157/j.issn.0258-7998.2017.05.036
Author:Li Zhengming,Zhou Jianwei,Zhang Guosong
Author Affilications:College of Electrical and Information Engineering,Jiangsu University,Zhenjiang 212013,China
DOI:10.16157/j.issn.0258-7998.2017.05.037
Author:Fang Xupeng,Ma Bolong,Zhao Ke,Zhao Yang,Yan Peng
Author Affilications:Shandong University of Science and Technology,Qingdao 266590,China
DOI:10.16157/j.issn.0258-7998.2017.05.038
Author:Liu Xintian,Qin Wenwen,Zheng Xinxin
Author Affilications:School of Science and Technology,Hefei University of Technology,Hefei 230009,China
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