DOI:10.16157/j.issn.0258-7998.179003
Author:Huang Yuhong,Wang Xiaoyun,Liu Guangyi
Author Affilications:China Mobile Research Institute,Beijing 100053,China
DOI:10.16157/j.issn.0258-7998.172764
Author:Zhang Changwei1,2,Qi Jiarong1,Guo Yongan2
Author Affilications:1.College of Telecommunications & Information Engineering,Nanjing University of Posts and Telecommunications, Nanjing 210000,China; 2.Key Laboratory of Wireless Communication in Jiangsu Province,Nanjing 210003,China
DOI:10.16157/j.issn.0258-7998.172879
Author:Li Xiaowen,Zhou Jia,Ye Songji,Wang Yufan,Wang Dan
Author Affilications:Communication and Information Engineering,ChongQing University of Post and Telecommunications,Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.172555
Author:Zhou Yingchao,Huang Qiong,Shen Bin
Author Affilications:Key Lab of Mobile Communication Technology,Chongqing University of Posts and Telecommunications,Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.172904
Author:Li Kece1,Li Jingchun2,Yang Wenhan2,Xu Ying2
Author Affilications:1.School of Information Engineering,Hebei University of Technology,Tianjin 300401,China; 2.The State Radio Monitoring Center,Beijing 100037,China
DOI:10.16157/j.issn.0258-7998.179005
Author:Yang Huiping,Cai Yan,Shi Jian′an
Author Affilications:NVIDIA Semiconductor Technology(Shanghai) Co.,Ltd Beijing Branch,Beijing 100020,China
DOI:10.16157/j.issn.0258-7998.179008
Author:Bai Ying1,Ma Lingzhi1,Guo Jia1,Chen Shaohui2
Author Affilications:1.Tianjin Phytium Technology Co.,Ltd.,Tianjing 102209,China;2.Cadence,Shenzhen 518040,China
DOI:10.16157/j.issn.0258-7998.179004
Author:Wu Jun1,Huang Gang1,Zhuang Zhemin2
Author Affilications:1.Shenzhen EDADOC Technology Co.,LTD,Shenzhen 518057,China; 2.Cadence Design Systems,Shenzhen 518000,China
DOI:10.16157/j.issn.0258-7998.179007
Author:Liang Chao1,2
Author Affilications:1.School of Astronautics,Harbin Insitute of Technology,Harbin 150001,China; 2.Suzhou Design Center of NXP Semiconductor,Suzhou 215011,China
DOI:10.16157/j.issn.0258-7998.179006
Author:Bai Yufeng,Lv Yinpeng
Author Affilications:GLOBALFOUNDRIES China(Shanghai) Co.,Ltd,Shanghai 201204,China
DOI:10.16157/j.issn.0258-7998.170048
Author:Wang Yibin,Yan Lin,Su Tao,Chen Dihu,Wang Zixin
Author Affilications:School of Electronics and Information Technology,Sun Yat-sen University,Guangzhou 510275,China
DOI:10.16157/j.issn.0258-7998.170569
Author:Song Yukun,Gao Xiaohang,Zhang Duoli,Du Gaoming
Author Affilications:Institute of VLSI Design,Hefei University of Technology,Hefei 230009,China
DOI:10.16157/j.issn.0258-7998.170570
Author:Zhou Zhimei1,2,Zhang Tong1,2,Liu Liang1,2,Zhang Haifeng1,2
Author Affilications:1.State Grid Key Laboratory of Power Industrial Chip Design and Analysis Technology, Beijing Smart-Chip Microelectronics Technology Co.,Ltd.Beijing 100192,China; 2.Beijing Engineering Research Center of High-Reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co.,Ltd.Beijing 100192,China
DOI:10.16157/j.issn.0258-7998.170645
Author:Li Kun,Qu Dexin,Zhong Xingjian,Chen Zheng
Author Affilications:College of Communications Engineering,PLA University of Science & Technology,Nanjing 210007,China
DOI:10.16157/j.issn.0258-7998.166610
Author:Fu Liangrui1,Chen Yaohong2,Hu Xiangchao1,Zhu Baoliang1
Author Affilications:1.Northwest Institute of Nuclear Technology,Xi′an 710024,China; 2.Xi′an Institute of Optics and Fine Mechanics,Chinese Academy of Sciences,Xi′an 710119,China
DOI:10.16157/j.issn.0258-7998.166939
Author:Wang Hao,Chen Shaoyong,Wang Jiaquan,Huang Qijun
Author Affilications:School of Physics and Technology,Wuhan University,Wuhan 430072,China
DOI:10.16157/j.issn.0258-7998.166619
Author:Zhou Qiaodi,Tong Yi,Yu Xiaofei
Author Affilications:Electronic Information College,Hangzhou Dianzi University,Hangzhou 310018,China
DOI:10.16157/j.issn.0258-7998.166817
Author:Wang Qihong1,Liu Jingbiao1,An Chunlei2,Shi Jianguang1,Yu Haibin1
Author Affilications:1.Electronic Information College,Hangzhou Dianzi University,Hangzhou 310018,China; 2.Polar Research Institute of China,Shanghai 200136,China
DOI:10.16157/j.issn.0258-7998.166953
Author:Ye Zhixiong1,2,Luo Jinhong3,Mi Chao1,2,Zou Ling1,2
Author Affilications:1.Faculty of Information Science & Engineering,Changzhou University,Changzhou 213164,China; 2.Changzhou Key Laboratory of Biomedical Information Technology,Changzhou 213164,China; 3.Changzhou College of Information Technology,Changzhou 213164,China
DOI:10.16157/j.issn.0258-7998.167007
Author:Xu Guangyu1,Xiong Qingyu1,2,Jia Ruixi1,Zhang Rui1
Author Affilications:1.School of Automation,Chongqing University,Chongqing 400044,China; 2.School of Software Engineering,Chongqing University,Chongqing 400044,China
DOI:10.16157/j.issn.0258-7998.179001
Author:Zhao Dezheng,Huang Bing,Feng Dajun,Zhang Xiaoli,Xu Yifeng
Author Affilications:National Computer System Engineering Research Institute of China,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.170014
Author:Lin Yongfeng1,Wang Ying2,Chen Liang1
Author Affilications:1.The Electric Power Research Institute of State Grid Tianjin Electric Power Company,Tianjin 300384,China; 2.Tianjin Streetlights Management Office,Tianjin 300151,China
DOI:10.16157/j.issn.0258-7998.170808
Author:Wang Peng1,Zhang Daoyang1,2,Lu Hao1,Xue Qiannan1
Author Affilications:1.Tianjin Key Laboratory for Civil Aircraft Airworthiness and Maintenance,Civil Aviation University of China, Tianjin 300300,China; 2.College of Safety Science & Engineering,Civil Aviation University of China,Tianjin 300300,China
DOI:10.16157/j.issn.0258-7998.170022
Author:Gan Yongjin1,2,Gan Guomei1,Jiang Qubo2,Ning Weilian1,Hu Lianghong1
Author Affilications:1.School of Electronics and Communication Engineering,Yulin Normal University,Yulin 537000,China; 2.School of Electronic Engineering and Automation,Guilin University of Electronic Technology,Guilin 541004,China
DOI:10.16157/j.issn.0258-7998.179002
Author:Ma Baoquan1,2,Yao Wangjun1,2,Liu Yunlong1,2,Zhang Xiaoli1,2,Huang Bing1,2,Zhao Dezheng1,2
Author Affilications:1.National Engineering Laboratory for Industry Control System Information Security Technology,Beijing 100083,China; 2.National Computer System Engineering Research Institute of China,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.166392
Author:Li Fangwei,Li Junyao,Zhu Jiang,Liu Yali
Author Affilications:Chongqing Key Lab of Mobile Communications Technology,Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.166229
Author:Wu Junqing,Peng Bin
Author Affilications:School of Information Engineering,Jiangxi University of Science and Technology,Ganzhou 341000,China
DOI:10.16157/j.issn.0258-7998.166617
Author:Yuan Zhengdao1,2,Wang Zhongyong3,Zhang Chuanzong3,Wu Sheng4
Author Affilications:1.Institute of Information Engineering,PLA Information Engineering University,Zhengzhou 450001,China; 2.School of Information Engineering,Henan Radio & TV University,Zhengzhou 450008,China; 3.School of Information Engineering,Zhengzhou University,Zhengzhou 450001,China; 4.Tsinghua Space Center,Tsinghua University,Beijing 100084,China
DOI:10.16157/j.issn.0258-7998.165978
Author:Liu Fanghui,Guo Hui,Zhang Pei,Zhou Shaoping
Author Affilications:School of Mechanical and Power Engineering,East China University of Science and Technology,Shanghai 200237,China
DOI:10.16157/j.issn.0258-7998.166557
Author:Li Mei1,Wu Haiyan2,Xi Jianqing3,Cai Jianxuan1
Author Affilications:1.Network Center,Guangdong AIB Polytechnic,Guangzhou 510507,China; 2.Department of Public Security technology,Railway Police College,Zhengzhou 450000,China; 3.School of Software Engineering,South China University of Technology,Guangzhou 510006,China
DOI:10.16157/j.issn.0258-7998.165055
Author:Zhang Xueying,Zhang Le,Sun Ying,Zhang Wei
Author Affilications:College of Information Engineering,Taiyuan University of Technology,Taiyuan 030024,China
DOI:10.16157/j.issn.0258-7998.166473
Author:Wei Yanming1,Tian Jianli2,Guo Rongxing3
Author Affilications:1.School of Computer Engineering,Henan Institute of Economics and Trade,Zhengzhou 450018,China; 2.School of Information Engineering,Huanghe S&T University,Zhengzhou 450019,China; 3.School of Electronics and Communication Engineering,Zhengzhou University of Aeronautics,Zhengzhou 450018,China
DOI:10.16157/j.issn.0258-7998.166103
Author:Liu Wei,Lu Weiguo
Author Affilications:State Key Laboratory of Power Transmission Equipments & System Security and New Technology, Electrical Engineering College of Chongqing University,Chongqing 400044,China
DOI:10.16157/j.issn.0258-7998.165888
Author:Sun Changxu,Wu Kongping,Lu Qingmei
Author Affilications:Institute of Electrical and Information Engineering,Anhui University of Science and Technology,Huainan 232001,China
DOI:10.16157/j.issn.0258-7998.166011
Author:Wu Yan,Ma Bifang,Li Liyao,Chen Guoqin
Author Affilications:School of Electrical and Information Engineering,Fuqing Branch of Fujian Normal University,Fuqing 350300,China
DOI:10.16157/j.issn.0258-7998.166329
Author:Wei Xiaoqun,Chang Tianhai
Author Affilications:School of Electronic and Information Engineering,South China University of Technology,Guangzhou 510640,China
DOI:10.16157/j.issn.0258-7998.165516
Author:Li Fansen1,Cao Taiqiang1,2,Chen Xiandong1,Hu Peng3
Author Affilications:1.Schoole of Electric Information,Xihua University,Chengdu 610039,China; 2.Key Laboratory of Fluid and Power Machinery(Xihua University),Ministy of Education,Chengdu 610039,China; 3.Chengdu MOLO Electric Ltd,Chengdu 610500,China
DOI:10.16157/j.issn.0258-7998.165755
Author:Huang Shiling1,2,Chen Hua1,Lin Guangsheng1
Author Affilications:1.School of Computer,Electronics and Information,Guangxi University,Nanning 530004,China; 2.School of Mechanical and Electrical,Quality Technology Engineering,Nanning University,Nanning 530004,China
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