DOI:10.16157/j.issn.0258-7998.172487
Author:Liu Yanping,Jin Fei,Li Jie,Hu Dongyang,Liu Zeyu
Author Affilications:School of Hebei University of Technology,Tianjin 300401,China
DOI:10.16157/j.issn.0258-7998.173173
Author:Li Chengwei1,Han Junnan2,Du Xin1,Wang Kaixi1,Huang Yicheng1,Lin Feixiong1,Zhong Weiguo1, Liu Ya1,Wu Xiaoming1,Ning Yuping3,Chen Jun4,Wu Kai1,4
Author Affilications:1.Department of Biomedical Engineering,School of Material Science and Engineering, South China University of Technology,Guangzhou 510006,China; 2.Brain Power System Co.,Ltd,Guangzhou 510670,China; 3.Department of Psychiatry,The Affiliated Brain Hospital of Guangzhou Medical University, Guangzhou Huiai Hospital,Guangzhou 510370,China; 4.Guangdong Institute of Medical Instruments,National Engineering Research Center for Healthcare Devices, Guangzhou 510500,China
DOI:10.16157/j.issn.0258-7998.172804
Author:Hu Xiaohua1,Li Xiangpan1,2,Qi Yangyang1,Leng Hao1,Han Jianhai1,2,Guo Bingjing1,2
Author Affilications:1.School of Mechatronic Engineering,Henan University of Science and Technology,Luoyang 471003,China; 2.Key Laboratory of Robotics and Intelligent System of Henan Province,Luoyang 471003,China
DOI:10.16157/j.issn.0258-7998.173174
Author:Peng Liangguang,Lin Jinzhao,Pang Yu,Li Zhangyong,Li Guoquan,Zhou Qianneng
Author Affilications:Chongqing Municipal Level Key Laboratory of Photoelectronic Information Sensing and Transmitting Technology, Chongqing University of Posts and Telecommunications,Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.172872
Author:Liu Xuefeng1,Ma Zhousheng2,Zhao Yanyang3,Yu Chuanqi1,Fan Wenbing1
Author Affilications:1.School of Information Engineering,Zhengzhou University,Zhengzhou 450001,China; 2.Henan Economy and Trade Vocational College,Zhengzhou 450046,China; 3.College of Electrical Engineering,Henan University of Technology,Zhengzhou 450001,China
DOI:10.16157/j.issn.0258-7998.170750
Author:Gao Hua,Li Hui
Author Affilications:University of Science and Technology of China,Hefei 230026,China
DOI:10.16157/j.issn.0258-7998.171431
Author:Huang Liang,Li Jiajin,Zhang Guohao
Author Affilications:School of Information Engineering,Guangdong University of Technology,Guangzhou 510006,China
DOI:10.16157/j.issn.0258-7998.170792
Author:Tao Meng,Li Jincheng
Author Affilications:School of Electronic Information Engineering,Beijing Jiaotong University,Beijing 100044,China
DOI:10.16157/j.issn.0258-7998.170744
Author:Zhang Hongliu,Zhang Chun
Author Affilications:Tsinghua University Microelectronics Institute,Beijing 1000861,China
DOI:10.16157/j.issn.0258-7998.170750
Author:Liu Yongcong,Wang Jianye,Ding Hao
Author Affilications:Air and Missile Defense Academy of Air Force Engineering University,Xi′an 710051,China
DOI:10.16157/j.issn.0258-7998.170880
Author:Zhou Chunliang1,2,Zhou Zhimei1,2,Wang Liancheng1,2,Feng Xi1,2,Liu Liang1,2,Tang Xiaoke1,2
Author Affilications:1.State Grid Key Laboratory of Power Industrial Chip Design and Analysis Technology, Beijing Smart-Chip Microelectronics Technology Co.,Ltd.Beijing 100192,China; 2.Beijing Engineering Research Center of High-Reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co.,Ltd.Beijing 100192,China
DOI:10.16157/j.issn.0258-7998.170268
Author:Xu Xinjian,Wen Guojun,Wang Yudan,Hu Zifei
Author Affilications:School of Mechanical Engineering and Electronic Information,China University of Geosciences,Wuhan 430074,China
DOI:10.16157/j.issn.0258-7998.170371
Author:Zhang Jun,Cai Wenyu,Wen Duanqiang
Author Affilications:Electronics and Information College,Hangzhou Dianzi University,Hangzhou 310018,China
DOI:10.16157/j.issn.0258-7998.170644
Author:Zhou Zhihu1,2,Zhang Fan1,2,Wu Minghu1,2,Kong Xiangbin1,2,Liu Cong1,2,Dai Song1,2
Author Affilications:1.Hubei Collaborative Innovation Center for High-efficiency Utilization of Solar Energy, Hubei University of Technology,Wuhan 430068,China; 2.Hubei Power Grid Intelligent Control and Equipment Engineering Technology Research Center,Wuhan 430068,China
DOI:10.16157/j.issn.0258-7998.170182
Author:Jiang Yucheng,Guan Tian,Wang Jiafei
Author Affilications:Research Center of Biomedical Engineering,Graduated School at Shenzhen,Tsinghua University,Shenzhen 518055,China
DOI:10.16157/j.issn.0258-7998.170020
Author:An Yongjun,Pazlai Mahemuti
Author Affilications:College of Electrical Engineering,Xinjiang University,Urumqi 830047,China
DOI:10.16157/j.issn.0258-7998.171773
Author:Zhao Mingjian,Guo Shanshan
Author Affilications:School of Electronic and Information Engineering,South China University of Technology,GuangZhou 510640,China
DOI:10.16157/j.issn.0258-7998.171826
Author:Liu Guangda,Wang Can,Li Mingjia,Sun Ruichen,Cai Jing,Gong Xiaoyu
Author Affilications:College of Instrumentation & Electrical Engineering,Jilin University,Changchun 130061,China
DOI:10.16157/j.issn.0258-7998.170310
Author:Hou Tianxi,Li Jinming,Ma Lin,Jiang Shuai
Author Affilications:Key Laboratory of Instrument Science & Dynamic Measurement of Ministry of Education, North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.179010
Author:Huang Bing,Feng Dajun,Liu Yunlong,Wang Hao
Author Affilications:National Computer System Engineering Research Institute of China,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.170059
Author:Meng Bo1,Wang Wenlian1,2
Author Affilications:1.Key Laboratory of Instrumentation Science & Dynamic Measurement,Ministry of Education,North University of China, Taiyuan 030051,China; 2.State key Laboratory for Electronic Test Technology,North University of China,Taiyuan 030051,China
DOI:10.16157/j.issn.0258-7998.171403
Author:Li Shiguang,Wang Yang,Wang Jianzhi,Gao Zhengzhong,Li Ying
Author Affilications:College of Electrical and Automation Engineering,Shandong University of Science and Technology,Qingdao 266590,China
DOI:10.16157/j.issn.0258-7998.170485
Author:Niu Yadi1,2,3,Liu Qingquan1,2,3,Cao Hongxia1,Su Kaifeng1
Author Affilications:1.College of Electronics and Information Engineering,Nanjing University of Information Science and Technology, Nanjing 210044,China; 2.Jiangsu Key Laboratory of Meteorological Observation and Signal Processing,Nanjing 210044,China; 3.Jiangsu Collaborative Innovation Center on Atmospheric Environment and Equipment Technology,Nanjing 210044,China
DOI:10.16157/j.issn.0258-7998.170121
Author:Zhu Xiaomei,Zhao Lei,Bao Yaping,Wang Tianjing
Author Affilications:College of Computer Science and Technology,Nanjing Tech University,Nanjing 211816,China
DOI:10.16157/j.issn.0258-7998.179011
Author:Xu Yifeng,Feng Dajun,Zhang Hanwen,Zhang Wan,Zhao Dezheng
Author Affilications:National Computer System Engineering Research Institute of China,Beijing 100083,China
DOI:10.16157/j.issn.0258-7998.170248
Author:Yin Shenghua,Tang Lun,Shen Haiqiang,Chen Qianbin
Author Affilications:Key Lab of Mobile Communication Technology,Chongqing University of Post and Telecommunications,Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.170232
Author:He Mingtai,Li Ke,Liu Heng
Author Affilications:School of Information Science and Technology,Southwest Jiaotong University,Chengdu 611756,China
DOI:10.16157/j.issn.0258-7998.166527
Author:Chen Mingxia1,Zou Wenbin1,Liu Yuxian2
Author Affilications:1.School of Mechanical and Control Engineering,Guilin University of Technology,Guilin 541004,China; 2.Guangdong Shunde Innovation Design Institute,Foshan 528300,China
DOI:10.16157/j.issn.0258-7998.166774
Author:Lu Chuan,Yang Chao,Chen Xin
Author Affilications:School of Automation,Guangdong University of Technology,Guangzhou 510006,China
DOI:10.16157/j.issn.0258-7998.166813
Author:Yao Yukun,Wang Yu,Lv Pancheng
Author Affilications:Chongqing Key Laboratory of Mobile Communication Technology,Chongqing University of Posts and Telecommunications, Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.166974
Author:Gu Chaochao1,Chen Xiaoning1,Huang Liyang2,Lin Chu1,Wang Shuming1
Author Affilications:1.Engineering Institute of National Defense Engineering,PLA University of Science and Technology,Nanjing 210007,China; 2.National Key Laboratory on Elctromagnetic Environment Effects and Electro-optical Engineering, PLA University of Science and Technology,Nanjing 210007,China
DOI:10.16157/j.issn.0258-7998.166667
Author:Jin Shucan1,2,Hu Yueli1,2,3,Zhang He1,2
Author Affilications:1.School of Mechatronic Engineering and Automation,Shanghai University,Shanghai 200072,China; 2.Shanghai Key Laboratory of Power Station Automation Technology,Shanghai 200072,China; 3.Microelectronic Research and Development Center,Shanghai University,Shanghai 200072,China
DOI:10.16157/j.issn.0258-7998.166881
Author:Liu Jie1,Shen Weiwei1,Ge Jun1,2,Wang Xuejun1
Author Affilications:1.Institute of Information Engineering,Suqian College,Suqian 223800,China; 2.College of Computer Science and Communication Engineering,Jiangsu University,Zhenjiang 212013,China
DOI:10.16157/j.issn.0258-7998.166289
Author:Li Xiaolin1,2,Li Yin1,He Qiang1
Author Affilications:1.New Technology Application Research Center,Chongqing University of Posts and Telecommunications,Chongqing 400065,China; 2.Chongqing Information Technology Designing CO.LTD,Chongqing 400065,China
DOI:10.16157/j.issn.0258-7998.170174
Author:Wu Haiyan1,Li Weiping1,2
Author Affilications:1.Department of Public Security Technology,Railway Police College,Zhengzhou 450000,China; 2.School of Information Engineering,Wuhan University of Technology,Wuhan 430070,China
DOI:10.16157/j.issn.0258-7998.166390
Author:Zhou Dianzu,Wei Jincheng,Qiu Xiaochu,Ma Li,Liu Hongli,Ju Tong
Author Affilications:School of Electrical and Electronic Information,Xihua University,Chengdu 610039,China
DOI:10.16157/j.issn.0258-7998.166350
Author:Zheng Guilin,He Linghao
Author Affilications:Automation Department,School of Power and Mechanical Engineering,Wuhan University,Wuhan 430072,China
DOI:10.16157/j.issn.0258-7998.166164
Author:Wang Su′e,Wang Kelei,Hao Pengfei
Author Affilications:College of Electrical and Information Engineering,Shaanxi University of Science & Technology,Xi′an 710021,China
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